Method for Correcting Mass Spectral Data

    公开(公告)号:US20230131302A1

    公开(公告)日:2023-04-27

    申请号:US18049314

    申请日:2022-10-25

    IPC分类号: H01J49/40 H01J49/00 H01J49/42

    摘要: A method for correcting mass spectral data obtained for a sample is described, where the mass spectral data is a time-of-flight mass spectral data. The method includes receiving mass spectral data obtained from a sample, the mass spectral data being indicative of an ion abundance. The method further includes applying a correction function to the mass spectral data based on the ion abundance indicated by the mass spectral data and on one or more trapping parameters associated with the mass spectral data. The correction function defines correction values for the mass spectral data for a range of ion abundances and for a range of trapping parameters.

    TIME OF FLIGHT MASS ANALYSIS SYSTEM
    3.
    发明公开

    公开(公告)号:US20240331994A1

    公开(公告)日:2024-10-03

    申请号:US18617482

    申请日:2024-03-26

    IPC分类号: H01J49/40 H01J49/00 H01J49/42

    摘要: Methods of calibrating a Time of Flight (TOF) mass analyser comprise performing a plurality of calibration analyses of calibrant ions using the TOF mass analyser, each calibration analysis measuring flight times of the calibrant ions. The TOF mass analyser has an associated instrument parameter which effects the flight times of the calibrant ions. Each calibration analysis also comprises determining a reference calibration curve based on known mass to charge ratios of the calibrant ions and the respective flight times, wherein the reference calibration curve is associated with the instrument parameter for the respective calibration analysis. For each calibration analysis, a value of the instrument parameter of the TOF mass analyser is different. A calibration curve for use in a TOF mass analysis performed by the TOF mass analyser can be determined based on the plurality of reference calibration curves and the instrument parameter.

    ANALYTICAL INSTRUMENT WITH ION TRAP COUPLED TO MASS ANALYSER

    公开(公告)号:US20240087876A1

    公开(公告)日:2024-03-14

    申请号:US18467401

    申请日:2023-09-14

    IPC分类号: H01J49/42

    CPC分类号: H01J49/4225

    摘要: An analytical instrument comprises a mass analyser and first and second ion traps coupled to the mass analyser. A method of operating the instrument comprises operating the first ion trap in a mode of operation in which the first ion trap confines ions within a first mass-to-charge ratio (m/z) range, storing first ions in the first ion trap, operating the second ion trap in a mode of operation in which the second ion trap confines ions within a second different mass-to-charge ratio (m/z) range, and storing second ions in the second ion trap. The method further comprises ejecting the first ions from the first ion trap into the mass analyser, ejecting the second ions from the second ion trap into the mass analyser, and mass analysing the first ions and the second ions.

    Ion accumulation control for analytical instrument

    公开(公告)号:US20230282471A1

    公开(公告)日:2023-09-07

    申请号:US18095860

    申请日:2023-01-11

    IPC分类号: H01J49/42 H01J49/06

    CPC分类号: H01J49/421 H01J49/062

    摘要: A method of operating an instrument which comprises a first and second ion stores, comprising determining whether a target accumulation time for the second ion store is greater than a threshold accumulation time. When the target accumulation time is less than the threshold accumulation time, ions are accumulated within the second ion store using an accumulation time that is based on the target accumulation time. When the target accumulation time is greater than the threshold accumulation time, ions are accumulated within the first ion store using a first accumulation time that is based on a difference between the target accumulation time and the threshold accumulation time, the ions accumulated in the first ion store are passed to the second ion store, and further ions are accumulated within the second ion store using a second accumulation time that is based on the threshold accumulation time.

    HYBRID MASS SPECTROMETER
    6.
    发明申请

    公开(公告)号:US20200328068A1

    公开(公告)日:2020-10-15

    申请号:US16914236

    申请日:2020-06-26

    IPC分类号: H01J49/00 H01J49/40 H01J49/10

    摘要: A data independent acquisition method of mass spectrometry for analyzing a sample within a mass range of interest as it elutes from a chromatography system. The method comprises selecting precursor ions within a mass range of interest to be analyzed, performing at least one MS1 scan of the precursor ions using a first, high-resolution mass analyzer and performing a set of MS2 scans by segmenting the precursor ions into a plurality of precursor mass segments, each precursor mass segment having a mass range of no greater than 5 amu, and for each precursor mass segment fragmenting the precursor ions within that precursor mass segment and performing an MS2 scan of the fragmented ions using a time of flight mass analyzer.

    TIME OF FLIGHT MASS ANALYSER AND METHOD OF TIME OF FLIGHT MASS SPECTROMETRY

    公开(公告)号:US20240055250A1

    公开(公告)日:2024-02-15

    申请号:US18364400

    申请日:2023-08-02

    IPC分类号: H01J49/40 H01J49/24

    CPC分类号: H01J49/40 H01J49/24

    摘要: A Time of Flight (TOF) mass analyser comprises an ion source, a detector, an electrode, and a resistive divider comprising first and second resistors. The ion source and the detector define an ion flight path from the ion source to the detector. The electrode is arranged along the ion flight path and receives an output voltage. Thermal expansion produces a first mass shift/Kelvin of detected ions. The resistive divider is thermally coupled to the TOF mass analyser to receive an input voltage and output an output voltage to the electrode. The first and second resistors have respective first and second temperature coefficients that provide a voltage shift/Kelvin to the output voltage to the electrode producing a second mass shift/Kelvin of detected ions, compensating for the first mass shift/Kelvin.

    ION MIRROR
    9.
    发明公开
    ION MIRROR 审中-公开

    公开(公告)号:US20230326734A1

    公开(公告)日:2023-10-12

    申请号:US18133838

    申请日:2023-04-12

    IPC分类号: H01J49/06

    CPC分类号: H01J49/06

    摘要: An ion mirror for a time of flight mass spectrometer (ToF) is provided. The ion mirror is elongated from a first end to a second end along a drift direction (z) and is configured to reflect ions in a reflection direction (y) orthogonal to the drift direction. The ion mirror comprises a plurality of elongate mirror electrodes and at least one Fringe Field Correcting (FFC) assembly. Each of the elongate mirror electrodes extends in the drift direction. Each of the plurality of elongate mirror electrodes is configured to receive a respective mirror electrode voltage in order to provide an electrostatic field of the ion mirror. The at least one
    FFC assembly is provided at the first and/or second end of the ion mirror. The FFC assembly comprises a plurality of electrodes, the plurality of electrodes extending in a plane orthogonal to the drift direction, each electrode configured to receive a respective FFC voltage. The FFC assembly is configured to suppress a fringe perturbation of the electrostatic field of the ion mirror when biased with the FFC voltages.

    METHODS AND APPARATUS FOR ION FRAGMENTATION IN A MASS SPECTROMETER

    公开(公告)号:US20210210334A1

    公开(公告)日:2021-07-08

    申请号:US17206083

    申请日:2021-03-18

    发明人: Hamish STEWART

    摘要: A mass spectrometer includes a controller operable to: transfer first ions of a first charge into an ion trap; apply an RF pseudopotential that radially confines the first ions in an elongate ion channel of the trap; generate a first potential well that confines the first ions within a first volume; after a specified pre-cooling time, transfer second ions of a second, opposite charge into the trap; apply one or more additional DC potentials that generate a second potential well that confines the second ions within a second volume, the first potential well being within the second potential well; cause, after cooling the second ions, the first ions and the second ions to interact and generate product ions; and generate at least one third potential well that confines the product ions, that is adjacent to the second potential well and that has a same polarity as the first potential well.