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    Automatic semiconductor device classification system, method for classifying semiconductor device and recording medium having program for the system
    9.
    发明授权
    Automatic semiconductor device classification system, method for classifying semiconductor device and recording medium having program for the system 失效
    自动半导体器件分类系统，用于对半导体器件进行分类的方法和具有用于该系统的程序的记录介质

    公开(公告)号：US06405148B1

    公开(公告)日：2002-06-11

    申请号：US09389764

    申请日：1999-09-02

    申请人： Hideaki Hayashi ,  Yoshinobu Sawada ,  Toyohiko Takeda ,  Hironori Sonobe

    发明人： Hideaki Hayashi ,  Yoshinobu Sawada ,  Toyohiko Takeda ,  Hironori Sonobe

    IPC分类号： G01R2728

    CPC分类号： G01R31/2834 ,  G01R31/31718

    摘要： The present invention discloses an automatic semiconductor device classification system including a current measuring unit, a data memory, a processor connected to the data memory and the current measuring unit, and an output unit connected to the processor. Patterns of curves representing approximate I-V characteristics between predetermined electrodes of semiconductor devices are automatically determined and the approximate I-V characteristics are classified into predetermined categories. The data memory stores the discrete I-V relations, and further stores a first control voltage, a first threshold current value at the first control voltage, a second control voltage corresponding to the second control voltage. The processor includes an acquisition circuit, a comparison circuit and a classification circuit. In the acquisition circuit, the first decision current value at the first control voltage and the second decision current value at the second control voltage are obtained using the measured results. In the comparison circuit, the first decision current value is compared with the first threshold current value stored in the data memory and the second decision current value is compared with the second threshold current value stored in the data memory. In the classification circuit, the patterns of the curves representing the approximate I-V characteristics are determined and classification is performed.

    摘要翻译： 本发明公开了一种包括电流测量单元，数据存储器，连接到数据存储器和当前测量单元的处理器以及连接到处理器的输出单元的自动半导体器件分类系统。 自动确定表示半导体器件的预定电极之间的近似I-V特性的曲线的图案，并将近似的I-V特性分类为预定类别。 数据存储器存储离散的I-V关系，并且还存储第一控制电压，第一控制电压下的第一阈值电流值与第二控制电压对应的第二控制电压。 处理器包括采集电路，比较电路和分类电路。 在采集电路中，使用测量结果获得第一控制电压下的第一判定电流值和第二控制电压下的第二判定电流值。 在比较电路中，将第一判定电流值与存储在数据存储器中的第一阈值电流值进行比较，并将第二判定电流值与存储在数据存储器中的第二阈值电流值进行比较。 在分类电路中，确定表示近似I-V特性的曲线的图案，并执行分类。