DARK-FIELD MID-INFRARED PHOTOTHERMAL MICROSCOPY

    公开(公告)号:US20230408805A1

    公开(公告)日:2023-12-21

    申请号:US18205152

    申请日:2023-06-02

    IPC分类号: G02B21/16 G02B21/02 G02B21/36

    摘要: Microscopic analysis of a sample includes a system using dark-field illumination. A mid-IR optical source generates a mid-infrared beam, which is directed onto the sample to induce a temperature change by absorption of the mid-infrared beam. A visible light source generates a light illuminating the sample on a substrate and creating a scattered field and a reflected field along a collection path of the system. A pupil mask is positioned along the collection path to block the reflected field while allowing the scattered field to pass therethrough. A camera is positioned at an end of the collection path to collect the scattered field and generate a dark-field image of the sample.

    High-speed delay scanning and deep learning techniques for spectroscopic SRS imaging

    公开(公告)号:US11237111B2

    公开(公告)日:2022-02-01

    申请号:US17162455

    申请日:2021-01-29

    摘要: Systems and methods implement of high-speed delay scanning for spectroscopic SRS imaging characterized by scanning a first pulsed beam across a stepwise reflective surface (such as a stepwise mirror or a reflective blazed grating) in a Littrow configuration to generate near continuous temporal delays relative to a second pulsed beam. Systems and methods also implement deep learning techniques for image restoration of spectroscopic SRS images using a trained encoder-decoder convolution neural network (CNN) which in some embodiments may be designed as a spatial-spectral residual net (SS-ResNet) characterized by two parallel filters including a first convolution filter on the spatial domain and a second convolution filter on the spectral domain.