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1.发明授权Three-dimensional (3-D) coordinate measuring method, 3-D coordinate measuring apparatus, and large-structure building method 失效三维（3-D）坐标测量方法，三维坐标测量装置和大型建筑方法公开(公告)号：US06559931B2
公开(公告)日：2003-05-06
申请号：US10251879
申请日：2002-09-20
IPC分类号： G01C308
摘要： A 3-D coordinate measurement is performed in such a way that an electrooptical distance-measuring device is used to measure a linear distance to a target point set on a surface of a measurement object, an angle measuring device is used to measure shifted angles of an optical axis of the electrooptical distance-measuring device, and a 3-D coordinate of the target point is measured according to a measured distance and a measured angle after the optical axis of the electrooptical distance-measuring device has been aligned to the target point. The present method includes a coordinate recognizing step for observing a plurality of targets, recognizing a plurality of target points, and calculating approximate 3-D coordinates of the target points; a macroscopic sighting step for approximate aligning the optical axis of the electrooptical distance-measuring device; and a microscopic sighting step for aligning the optical axis of the electrooptical distance-measuring device to the one of the target points in the predetermined viewfield range.
摘要翻译： 以这样的方式进行3维坐标测量，使得电光测距装置测量到设置在测量对象表面上的目标点的线性距离，使用角度测量装置测量偏移角度 电光测距装置的光轴和目标点的3-D坐标根据测量的距离和在光电测距装置的光轴已经对准目标点之后的测量角度被测量 。 本方法包括：用于观察多个目标，识别多个目标点并计算目标点的近似3维坐标的坐标识别步骤; 用于近似对准电光测距装置的光轴的宏观瞄准步骤; 以及用于将电光测距装置的光轴与预定视野范围内的目标点之一对准的微观瞄准步骤。
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公开(公告)号：US07599052B2
公开(公告)日：2009-10-06
申请号：US12228478
申请日：2008-08-13
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
CPC分类号： B21C51/005 , G01N21/89
摘要： A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
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公开(公告)号：US07248366B2
公开(公告)日：2007-07-24
申请号：US09956737
申请日：2001-09-17
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
CPC分类号： B21C51/005 , G01N21/89
摘要： The defect marking method comprises the steps of: installing a surface defect tester to detect surface flaw and a marker device to apply marking at defect position, in a continuous processing line of steel sheet; detecting the surface flaw on the steel sheet using the surface defect tester; determining defect name, defect grade, defect length, and defect position in the width direction of the steel sheet, on the basis of thus detected flaw information, further identifying the defect in terms of harmful defect, injudgicable defect, and harmless defect; applying tracking of the defect position for each of the harmful defect and the injudgicable defect; and applying marking to the defect position. The defect marking device comprises a defect inspection means having plurality of light-receiving parts and a signal processing section, and a marking means.
摘要翻译： 缺陷标记方法包括以下步骤：在钢板的连续加工线中安装表面缺陷测试仪以检测表面缺陷和标记装置在缺陷位置施加标记; 使用表面缺陷测试仪检测钢板表面缺陷; 根据这样检测到的缺陷信息确定钢板宽度方向的缺陷名，缺陷等级，缺陷长度和缺陷位置，进一步确定有害缺陷，注意缺陷和无害缺陷方面的缺陷; 对每个有害缺陷和不合理缺陷的缺陷位置进行跟踪; 并将标记应用于缺陷位置。 缺陷标记装置包括具有多个光接收部分和信号处理部分的缺陷检查装置和标记装置。
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公开(公告)号：US07423744B2
公开(公告)日：2008-09-09
申请号：US11586031
申请日：2006-10-24
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
CPC分类号： B21C51/005 , G01N21/89
摘要： A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
摘要翻译： 缺陷标记装置包括：瑕疵检查装置，其具有多个受光部，该多个受光部在两个以上的光学条件彼此不同的情况下识别来自金属条的检查平面的反射光; 信号处理部，其基于在这些彼此不同的光学条件下识别的反射光分量的组合来判断检查平面上的表面缺陷的存在/不存在; 以及标记装置，其在金属带的表面上施加指示与缺陷有关的信息的标记。
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公开(公告)号：US20070052964A1
公开(公告)日：2007-03-08
申请号：US11586031
申请日：2006-10-24
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
IPC分类号： G01N21/84
CPC分类号： B21C51/005 , G01N21/89
摘要： A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
摘要翻译： 缺陷标记装置包括：瑕疵检查装置，其具有多个受光部，该多个受光部在两个以上的光学条件彼此不同的情况下识别来自金属条的检查平面的反射光; 信号处理部，其基于在这些彼此不同的光学条件下识别的反射光分量的组合来判断检查平面上的表面缺陷的存在/不存在; 以及标记装置，其在金属带的表面上施加指示与缺陷有关的信息的标记。
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公开(公告)号：US20090086209A1
公开(公告)日：2009-04-02
申请号：US12228478
申请日：2008-08-13
申请人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
发明人： Mitsuaki Uesugi , Shoji Yoshikawa , Masaichi Inomata , Tsutomu Kawamura , Takahiko Oshige , Hiroyuki Sugiura , Akira Kazama , Tsuneo Suyama , Yasuo Kushida , Shuichi Harada , Hajime Tanaka , Osamu Uehara , Shuji Kaneto , Masahiro Iwabuchi , Kozo Harada , Shinichi Tomonaga , Shigemi Fukuda
CPC分类号： B21C51/005 , G01N21/89
摘要： A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
摘要翻译： 缺陷标记装置包括：瑕疵检查装置，其具有多个受光部，该多个受光部在两个以上的光学条件彼此不同的情况下识别来自金属条的检查平面的反射光; 信号处理部，其基于在这些彼此不同的光学条件下识别的反射光分量的组合来判断检查平面上的表面缺陷的存在/不存在; 以及标记装置，其在金属带的表面上施加指示与缺陷有关的信息的标记。
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公开(公告)号：US07869061B2
公开(公告)日：2011-01-11
申请号：US11991788
申请日：2006-09-14
IPC分类号： G01B11/24
CPC分类号： G01B11/2536 , G01B11/2527 , G01B11/2531 , G01M11/005 , G01N21/8806 , G06T7/521
摘要： A surface-distortion measuring device and a surface-distortion measuring method can quantitatively, rapidly, and highly accurately measure and evaluate surface-distortion distribution at all of observable points on a specular or semi-specular surface of a measurement target. The device includes pattern displaying means 2 capable of switching and displaying a plurality of kinds of light-and-shade patterns 5, capturing means 3 for capturing mirror images, reflected in the specular or semi-specular surface of a measurement target 1, of the plurality of light-and-shade patterns displayed on the pattern displaying means, and surface-distortion distribution calculating means 10 for performing image processing on the captured mirror images of the plurality of light-and-shade patterns to calculate surface-distortion distribution of the measurement-target surface.
摘要翻译： 表面失真测量装置和表面失真测量方法可以定量，快速和高精度地测量和评估测量目标的镜面或半镜面上的所有可观察点处的表面失真分布。 该装置包括能够切换和显示多种光和阴影图案的图案显示装置2，用于捕获反射在测量对象1的镜面或半镜面中的镜像的拍摄装置3， 在图案显示装置上显示的多个光和阴影图案;以及表面失真分布计算装置10，用于对多个光和阴影图案的所拍摄的镜像进行图像处理，以计算出 测量目标表面。
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8.发明授权
公开(公告)号：US5102223A
公开(公告)日：1992-04-07
申请号：US652446
申请日：1998-02-07
申请人： Mitsuaki Uesugi , Masaichi Inomata , Isamu Komine
发明人： Mitsuaki Uesugi , Masaichi Inomata , Isamu Komine
IPC分类号： G01B11/25
CPC分类号： G01B11/2522
摘要： A method and apparatus for measuring a three-dimensional curved surface shape based on a new measuring principle that a surface of an object to be measured is coded with information relating to a slit light which is used as a medium and moved or rotated at a constant speed. The manner in which a linear reflected pattern of the slit light is moved over the surface of the object to be measured is picked up by a television camera to form a composite image in which a value of each of picture elements in the image is represented by information relating to the slit light, e.g., a position, time or projection angle of the slit light at an instant that the slit light passes through one of positions on the object surface corresponding to that picture element. Then, a difference in value between each corresponding picture elements of the composite image and another composite image formed similarly with respect to a reference plane is determined to measure a three-dimensional curve surface shape of the object to be measured.
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公开(公告)号：US4881126A
公开(公告)日：1989-11-14
申请号：US258604
申请日：1988-10-17
申请人： Mitsuaki Uesugi , Masaichi Inomata , Isamu Komine
发明人： Mitsuaki Uesugi , Masaichi Inomata , Isamu Komine
CPC分类号： H04N5/2625 , G06T5/50
摘要： An image composing apparatus adapted to produce a composite image in which a value of each of picture elements is represented by a maximum value or minimum value of the brightness of a video signal as well as a corresponding other signal at the instant of the maximum or minimum value. A composite image is formed in which a value of each of picture elements is represented by a count of synchronizing signals or an externally applied timing, position or angle indicative external input signal at an instant that the video signal attains the maximum value or the minimum value for each picture element.
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公开(公告)号：US4716459A
公开(公告)日：1987-12-29
申请号：US912582
申请日：1986-09-16
申请人： Eiichi Makabe , Mitsuaki Uesugi , Masaichi Inomata , Kyusuke Maruyama , Kenji Iwai , Kazuo Sano
发明人： Eiichi Makabe , Mitsuaki Uesugi , Masaichi Inomata , Kyusuke Maruyama , Kenji Iwai , Kazuo Sano
CPC分类号： G01N3/068 , G01B11/024 , G01N2203/0066 , G01N2203/0073 , G01N2203/027
摘要： A distance between a distal end of a crack formed in a fatigue test piece on which a reference line is scribed, and the reference line, is monitored. The reference line and the crack are scanned with an ITV camera to prepare the fatigue test piece having the crack of a predetermined length. Luminance levels are integrated from a video signal obtained by scanning each raster in the same direction as that of the reference line to obtain a maximum luminance level, and the reference line position is detected from the maximum luminance level. At the same time, continuity of a high-level value is discriminated from the video signal, and a crack distal end position is detected from the discrimination result. A difference between both the detected positions is calculated, and the test piece is machined so that the difference corresponds to the predetermined length.
摘要翻译： PCT No.PCT / JP86 / 00028第 371日期1986年9月16日 102（e）1986年9月16日PCT PCT 1月24日PCT公布。 出版物WO86 / 04410 日期：1986年7月31日。监视在其上划线的疲劳试片上形成的裂纹的远端与基准线之间的距离。 使用ITV照相机对参考线和裂纹进行扫描，以制备具有预定长度的裂纹的疲劳试验片。 从通过扫描每个光栅获得的视频信号与参考线的方向相同的方向集成亮度水平以获得最大亮度水平，并且从最大亮度水平检测参考线位置。 同时，从视频信号中辨别出高电平值的连续性，并根据识别结果检测裂纹远端位置。 计算两个检测位置之间的差异，并且加工试样，使得该差异对应于预定长度。
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