公开(公告)号：US20190066736A1

公开(公告)日：2019-02-28

申请号：US15692508

申请日：2017-08-31

申请人： Tyson M. Stichka ,  Preston Thomson ,  Scott Anthony Stoller ,  Christopher Bueb ,  Jianmin Huang ,  Kulachet Tanpairoj ,  Harish Singidi

发明人： Tyson M. Stichka ,  Preston Thomson ,  Scott Anthony Stoller ,  Christopher Bueb ,  Jianmin Huang ,  Kulachet Tanpairoj ,  Harish Singidi

IPC分类号： G11C5/00 ,  G11C7/04 ,  G11C16/04 ,  G11C16/26

CPC分类号： G11C5/005 ,  G11C7/04 ,  G11C7/1006 ,  G11C11/5628 ,  G11C16/0483 ,  G11C16/06 ,  G11C16/10 ,  G11C16/26 ,  G11C16/3418 ,  G11C16/3459 ,  G11C2211/5641

摘要： Devices and techniques for NAND cell encoding to improve data integrity are disclosed herein. A high-temperature indicator is obtained and a write operation is received. The write operation is then performed on a NAND cell using a modified encoding in response to the high-temperature indicator. The modified encoding includes a reduced number of voltage distribution positions from an unmodified encoding without changing voltage distribution widths, where each voltage distribution corresponds to a discrete set of states an encoding.

公开(公告)号：US08514624B2

公开(公告)日：2013-08-20

申请号：US13165416

申请日：2011-06-21

申请人： Krishna K. Parat ,  Akira Goda ,  Koichi Kawai ,  Brian J. Soderling ,  Jeremy Binfet ,  Arnaud A. Furnemont ,  Tejas Krishnamohan ,  Tyson M. Stichka ,  Giuseppina Puzzilli

发明人： Krishna K. Parat ,  Akira Goda ,  Koichi Kawai ,  Brian J. Soderling ,  Jeremy Binfet ,  Arnaud A. Furnemont ,  Tejas Krishnamohan ,  Tyson M. Stichka ,  Giuseppina Puzzilli

IPC分类号： G11C16/04

CPC分类号： G11C29/765 ,  G11C11/5628 ,  G11C16/0483 ,  G11C16/16 ,  G11C16/349 ,  G11C29/789

摘要： Memory devices and methods are disclosed, including a method involving erasing a block of memory cells. After erasing the block, and before subsequent programming of the block, a number of bad strings in the block are determined based on charge accumulation on select gate transistors. The block is retired from use if the number of bad strings exceeds a threshold. Additional embodiments are disclosed.

摘要翻译： 公开了存储器件和方法，包括涉及擦除存储器单元块的方法。 在擦除块之后，并且在块的后续编程之前，基于选择栅晶体管上的电荷积累来确定块中的多个不良串。 如果坏字符串的数量超过阈值，则该块将从使用中退出。 公开了另外的实施例。

公开(公告)号：US20120327713A1

公开(公告)日：2012-12-27

申请号：US13165416

申请日：2011-06-21

申请人： Krishna K. Parat ,  Akira Goda ,  Koichi Kawai ,  Brian J. Soderling ,  Jeremy Binfet ,  Arnaud A. Furnemont ,  Tejas Krishnamohan ,  Tyson M. Stichka ,  Giuseppina Puzzilli

发明人： Krishna K. Parat ,  Akira Goda ,  Koichi Kawai ,  Brian J. Soderling ,  Jeremy Binfet ,  Arnaud A. Furnemont ,  Tejas Krishnamohan ,  Tyson M. Stichka ,  Giuseppina Puzzilli

IPC分类号： G11C16/16 ,  G11C16/04

CPC分类号： G11C29/765 ,  G11C11/5628 ,  G11C16/0483 ,  G11C16/16 ,  G11C16/349 ,  G11C29/789

摘要： Memory devices and methods are disclosed, including a method involving erasing a block of memory cells. After erasing the block, and before subsequent programming of the block, a number of bad strings in the block are determined based on charge accumulation on select gate transistors. The block is retired from use if the number of bad strings exceeds a threshold. Additional embodiments are disclosed.

摘要翻译： 公开了存储器件和方法，包括涉及擦除存储器单元块的方法。 在擦除块之后，并且在块的后续编程之前，基于选择栅晶体管上的电荷积累来确定块中的多个不良串。 如果坏字符串的数量超过阈值，则该块将从使用中退出。 公开了另外的实施例。