Compensation of back pattern effect in a memory device
    1.
    发明授权
    Compensation of back pattern effect in a memory device 有权
    在存储器件中补偿背面图案效果

    公开(公告)号:US08395939B2

    公开(公告)日:2013-03-12

    申请号:US13090754

    申请日:2011-04-20

    IPC分类号: G11C11/34

    摘要: In one or more of the disclosed embodiments, a read operation is compensated for back pattern effect. A bit line current is generated by a read operation that biases the word lines. As part of a back pattern effect measurement phase, at predetermined time intervals an indication of the discharge status of the bit line is stored in a latch of a set of N latches coupled to each bit line. At the end of the measurement phase, the set of latches contains a multiple bit word that is an indication of the back pattern effect experienced by that particular series string of memory cells. This back pattern effect indication is used in subsequent read operations to adjust the timing of the operation.

    摘要翻译: 在所公开的一个或多个实施例中,读取操作被补偿以用于背面图案效果。 通过偏置字线的读取操作产生位线电流。 作为背景图案效果测量阶段的一部分,在预定的时间间隔,将位线的放电状态的指示存储在耦合到每个位线的一组N个锁存器的锁存器中。 在测量阶段结束时,锁存器组包含一个多位字,它是该特定串行存储单元所经历的反向图案效应的指示。 这种背面图案效果指示用于随后的读取操作以调整操作的时间。

    Sensing scheme in a memory device
    4.
    发明授权
    Sensing scheme in a memory device 有权
    存储设备中的感应方案

    公开(公告)号:US08593876B2

    公开(公告)日:2013-11-26

    申请号:US13085611

    申请日:2011-04-13

    IPC分类号: G11C11/34 G11C7/00

    CPC分类号: G11C16/0483 G11C16/26

    摘要: Methods of operating memory devices, generating reference currents in memory devices, and sensing data states of memory cells in a memory device are disclosed. One such method includes generating reference currents utilized in sense amplifier circuitry to manage leakage currents while performing a sense operation within a memory device. Another such method activates one of two serially coupled transistors along with activating and deactivating the second transistor serially coupled with the first transistor thereby regulating a current through both serially coupled transistors and establishing a particular reference current.

    摘要翻译: 公开了在存储器件中操作存储器件,产生存储器件中的参考电流以及感测存储器单元的数据状态的方法。 一种这样的方法包括产生在读出放大器电路中使用的参考电流,以在存储器件内进行感测操作的同时管理泄漏电流。 另一种这样的方法激活两个串联耦合晶体管中的一个,同时激活和去激活与第一晶体管串联耦合的第二晶体管,从而调节通过两个串联耦合的晶体管的电流并建立特定的参考电流。

    METHOD FOR KINK COMPENSATION IN A MEMORY
    7.
    发明申请
    METHOD FOR KINK COMPENSATION IN A MEMORY 有权
    闪存补偿方法

    公开(公告)号:US20120307564A1

    公开(公告)日:2012-12-06

    申请号:US13585389

    申请日:2012-08-14

    IPC分类号: G11C16/04

    摘要: This disclosure concerns memory kink compensation. One method embodiment includes applying a number of sequentially incrementing programming pulses to a memory cell, with the sequential programming pulses incrementing by a first programming pulse step voltage magnitude. A seeding voltage is applied after applying the number of sequentially incrementing programming pulses. A next programming pulse is applied after applying the seeding voltage, with the next programming pulse being adjusted relative to a preceding one of the sequentially incrementing programming pulses by a second programming pulse step voltage magnitude. The second programming pulse step voltage magnitude can be less than the first programming pulse step voltage magnitude.

    摘要翻译: 本公开涉及存储器扭结补偿。 一个方法实施例包括将多个顺序递增的编程脉冲施加到存储器单元,其中顺序编程脉冲通过第一编程脉冲阶跃电压幅度递增。 在施加顺序递增的编程脉冲数之后施加接种电压。 在施加播种电压之后施加下一个编程脉冲,其中下一个编程脉冲相对于先前的一个顺序递增的编程脉冲通过第二编程脉冲阶跃电压幅度被调整。 第二个编程脉冲阶跃电压幅度可以小于第一个编程脉冲阶跃电压幅度。

    COMPENSATION OF BACK PATTERN EFFECT IN A MEMORY DEVICE
    8.
    发明申请
    COMPENSATION OF BACK PATTERN EFFECT IN A MEMORY DEVICE 有权
    补充存储器件中的反向图案效应

    公开(公告)号:US20110194350A1

    公开(公告)日:2011-08-11

    申请号:US13090754

    申请日:2011-04-20

    IPC分类号: G11C16/04

    摘要: In one or more of the disclosed embodiments, a read operation is compensated for back pattern effect. A bit line current is generated by a read operation that biases the word lines. As part of a back pattern effect measurement phase, at predetermined time intervals an indication of the discharge status of the bit line is stored in a latch of a set of N latches coupled to each bit line. At the end of the measurement phase, the set of latches contains a multiple bit word that is an indication of the back pattern effect experienced by that particular series string of memory cells. This back pattern effect indication is used in subsequent read operations to adjust the timing of the operation.

    摘要翻译: 在所公开的一个或多个实施例中,读取操作被补偿以用于背面图案效果。 通过偏置字线的读取操作产生位线电流。 作为背景图案效果测量阶段的一部分,在预定的时间间隔,将位线的放电状态的指示存储在耦合到每个位线的一组N个锁存器的锁存器中。 在测量阶段结束时,锁存器组包含一个多位字,它是该特定串行存储单元所经历的反向图案效应的指示。 这种背面图案效果指示用于随后的读取操作以调整操作的时间。

    Non-volatile multilevel memory cell programming
    9.
    发明授权
    Non-volatile multilevel memory cell programming 有权
    非易失性多层存储器单元编程

    公开(公告)号:US07944757B2

    公开(公告)日:2011-05-17

    申请号:US12718290

    申请日:2010-03-05

    IPC分类号: G11C11/34

    摘要: Embodiments of the present disclosure provide methods, devices, modules, and systems for programming multilevel non-volatile multilevel memory cells. One method includes increasing a threshold voltage (Vt) for each of a number of memory cells until the Vt reaches a verify voltage (VFY) corresponding to a program state among a number of program states. The method includes determining whether the Vt of each of the cells has reached a pre-verify voltage (PVFY) associated with the program state, selectively biasing bit lines coupled to those cells whose Vt has reached the PVFY, adjusting the PVFY to a different level, and selectively biasing bit lines coupled to cells whose Vt has reached the adjusted PVFY, wherein the PVFY and the adjusted PVFY are less than the VFY.

    摘要翻译: 本公开的实施例提供用于编程多电平非易失性多电平存储器单元的方法,设备,模块和系统。 一种方法包括增加用于多个存储器单元中的每一个的阈值电压(Vt),直到Vt达到与多个程序状态中的程序状态相对应的验证电压(VFY)。 该方法包括确定每个单元的Vt是否已经达到与编程状态相关联的预验证电压(PVFY),选择性地偏置与Vt已经达到PVFY的那些单元耦合的位线,将PVFY调整到不同的水平 并且选择性地偏置与Vt已经达到调整后的PVFY的单元相连的位线,其中PVFY和调整后的PVFY小于VFY。

    Compensation of back pattern effect in a memory device
    10.
    发明授权
    Compensation of back pattern effect in a memory device 有权
    在存储器件中补偿背面图案效果

    公开(公告)号:US07936606B2

    公开(公告)日:2011-05-03

    申请号:US12108067

    申请日:2008-04-23

    IPC分类号: G11C11/34

    摘要: In one or more of provided embodiments, a read operation is compensated for back pattern effect. A bit line current is generated by a read operation that biases the word lines. As part of a back pattern effect measurement phase, at predetermined time intervals an indication of the discharge status of the bit line is stored in a latch of a set of N latches coupled to each bit line. At the end of the measurement phase, the set of latches contains a multiple bit word that is an indication of the back pattern effect experienced by that particular series string of memory cells. This back pattern effect indication is used in subsequent read operations to adjust the timing of the operation.

    摘要翻译: 在一个或多个所提供的实施例中,读取操作被补偿以用于背面图案效果。 通过偏置字线的读取操作产生位线电流。 作为背景图案效果测量阶段的一部分,在预定的时间间隔,将位线的放电状态的指示存储在耦合到每个位线的一组N个锁存器的锁存器中。 在测量阶段结束时,锁存器组包含一个多位字,它是该特定串行存储单元所经历的反向图案效应的指示。 这种背面图案效果指示用于随后的读取操作以调整操作的时间。