Flowable oxide deposition using rapid delivery of process gases
    6.
    发明授权
    Flowable oxide deposition using rapid delivery of process gases 有权
    使用快速输送工艺气体可流动的氧化物沉积

    公开(公告)号:US08278224B1

    公开(公告)日:2012-10-02

    申请号:US12566085

    申请日:2009-09-24

    IPC分类号: H01L21/469

    摘要: Methods and apparatus for filling gaps on partially manufactured semiconductor substrates with dielectric material are provided. In certain embodiments, the methods include introducing a first process gas into the processing chamber and accumulating a second process gas in an accumulator maintained at a pressure level substantially highest than that of the processing chamber pressure level. The second process gas is then rapidly introduced from the accumulator into the processing chamber. An excess amount of the second process gas may be provided in the processing chamber during the introduction of the second process gas. Flowable silicon-containing films forms on a surface of the substrate to at least partially fill the gaps.

    摘要翻译: 提供了用电介质材料在部分制造的半导体衬底上填充间隙的方法和装置。 在某些实施方案中,所述方法包括将第一工艺气体引入处理室并将第二工艺气体积聚在保持在基本上高于处理室压力水平的压力水平的蓄能器中。 然后将第二工艺气体从蓄能器快速地引入到处理室中。 在引入第二处理气体期间,可以在处理室中设置过量的第二处理气体。 可流动的含硅膜在基材的表面上形成以至少部分地填充间隙。