摘要:
Calibration of an arbitrary spectrometer can use a stable monolithic interferometer as a wavelength calibration standard. Light from a polychromatic light source is input to the monolithic interferometer where it undergoes interference based on the optical path difference (OPD) of the interferometer. The resulting wavelength-modulated output beam is analyzed by a reference spectrometer to generate reference data. The output beam from the interferometer can be provided to an arbitrary spectral instrument. Wavelength calibration of the arbitrary spectral instrument may then be performed based on a comparison of the spectral instrument output with the reference data. By appropriate choice of materials for the monolithic interferometer, a highly stable structure can be fabricated that has a wide field and/or is thermally compensated. Because the interferometer is stable, the one-time generated reference data can be used over an extended period of time without re-characterization.
摘要:
A scanning monochromatic spatial low-coherent interferometer (S-LCI) can be used to simultaneously measure geometric thickness and refractive index. The probe beam of the scanning S-LCI can be an off-axis converging single wavelength laser beam, and the decomposed incident angles of the beam on the sample can be accurately defined in the Fourier domain. The angle dependent phase shift of a plane parallel plate or other sample can be obtained in a single system measurement. From the angle dependent phase shift, the geometric thickness and refractive index of the sample can be simultaneously obtained. Additionally or alternatively, the S-LCI system can interrogate the sample to profile the location and refractive index of one or more layers within the sample using the disclosed techniques.
摘要:
High-precision monolithic optical assemblies are formed using low-cost standard optical components, such as wedge plates and/or wedge second surface mirrors. By rolling and/or shifting the components relative to each other with matched optical surfaces in contact, a precise alignment solution is found for a particular optical assembly. The resulting arrangement of components can be bonded or held together so as to form a high-precision monolithic optical assembly, which can be inserted into an optical system, according to the assembly's function. The functionality of the monolithic optical assembly can be independent of the optical system in which it is used.
摘要:
A scanning monochromatic spatial low-coherent interferometer (S-LCI) can be used to simultaneously measure geometric thickness and refractive index. The probe beam of the scanning S-LCI can be an off-axis converging single wavelength laser beam, and the decomposed incident angles of the beam on the sample can be accurately defined in the Fourier domain. The angle dependent phase shift of a plane parallel plate or other sample can be obtained in a single system measurement. From the angle dependent phase shift, the geometric thickness and refractive index of the sample can be simultaneously obtained. Additionally or alternatively, the S-LCI system can interrogate the sample to profile the location and refractive index of one or more layers within the sample using the disclosed techniques.
摘要:
High-precision monolithic optical assemblies are formed using low-cost standard optical components, such as wedge plates and/or wedge second surface mirrors. By rolling and/or shifting the components relative to each other with matched optical surfaces in contact, a precise alignment solution is found for a particular optical assembly. The resulting arrangement of components can be bonded or held together so as to form a high-precision monolithic optical assembly, which can be inserted into an optical system, according to the assembly's function. The functionality of the monolithic optical assembly can be independent of the optical system in which it is used.
摘要:
Calibration of an arbitrary spectrometer can use a stable monolithic interferometer as a wavelength calibration standard. Light from a polychromatic light source is input to the monolithic interferometer where it undergoes interference based on the optical path difference (OPD) of the interferometer. The resulting wavelength-modulated output beam is analyzed by a reference spectrometer to generate reference data. The output beam from the interferometer can be provided to an arbitrary spectral instrument. Wavelength calibration of the arbitrary spectral instrument may then be performed based on a comparison of the spectral instrument output with the reference data. By appropriate choice of materials for the monolithic interferometer, a highly stable structure can be fabricated that has a wide field and/or is thermally compensated. Because the interferometer is stable, the one-time generated reference data can be used over an extended period of time without re-characterization.
摘要:
The invention discloses a cell culture medium, human epidermis-derived mesenchymal stem cell-like pluripotent cells and a preparation method thereof. The culture medium is formed by adding fetal bovine serum, hbFGF, hSCF, non-essential amino acids, L-glutamine and gentamicin into a DMEM culture medium with the glucose content of 0.5-5 g/L, wherein every 100 mL of the final culture medium contains 10-25% by volume percent of fetal bovine serum, 100-4000 ng of the hbFGF, 10-2000 ng of hSCF, 0.1-2 mL of 100× non-essential amino acids, 0.1-2 mL of PBS solution containing 3% by mass percent of L-glutamine and 1000-8000 U of gentamicin. A human epidermis-derived mesenchymal stem cell-like pluripotent cell strain is prepared by culturing human epidermal cells in the culture medium, digesting with digestive juice, removing undigested human epidermal cells, collecting digested mesenchymal stem cell-like cells and performing in-vitro culture and passage.
摘要:
A method of forming a front electrode of a solar cell includes a step of forming a sub-grid line and a main-grid line on the solar cell. The method further includes steps of: forming a lower layer of the sub-grid line on the solar cell using a lower paste by a first screen; drying the solar cell that is formed with the lower layer of the sub-grid line; forming an upper layer of the sub-grid line and the main-grid line simultaneously on the solar cell using an upper paste by a second screen; and sintering the solar cell that is formed with the sub-grid line and the main-grid line. A method of manufacturing a solar cell using the methods and a solar cell manufactured by the method are also provided.