摘要:
A method for determining 3D distances on a 2D pixelized image of a part or object includes acquiring a real 2D pixelized image of the object, creating a simulated image of the object using the 3D CAD model and the 2D pixelized image, determining a specified cost function comparing the simulated image with the real 2D pixilated image and repositioning the simulated image in accordance with iterated adjustments of a relative position between the CAD model and the 2D pixilated image to change the simulated image until the specified cost function is below a specified value. Then, the workstation is used to generate a 3D distance scale matrix using the repositioned simulated image, and to measure and display distances between selected pixels on a surface of the real image using 2D distances on the 2D pixelized image of the object and the 3D distance scale matrix.
摘要:
A method for determining 3D distances on a 2D pixelized image of a part or object includes acquiring a real 2D pixelized image of the object, creating a simulated image of the object using the 3D CAD model and the 2D pixelized image, determining a specified cost function comparing the simulated image with the real 2D pixilated image and repositioning the simulated image in accordance with iterated adjustments of a relative position between the CAD model and the XID pixilated image to change the simulated image until the specified cost function is below a specified value. Then, the workstation is used to generate a 3D distance scale matrix using the repositioned simulated image, and to measure and display distances between selected pixels on a surface of the real image using 2D distances on the 2D pixelized image of the object and the 3D distance scale matrix.
摘要:
A method and system for nondestructively detecting and quantifying material anomalies within materials, including composite articles. The method entails performing a three-dimensional imaging scan technique, such as a computed tomography scan, of the material and a reference standard such that a test image of the material and a reference image of the reference standard appear in a plurality of two-dimensional scan views generated by the scan technique. The reference images are located in the scan views and normalized to determine at least an average value of the pixel data for the reference images. Values of pixel data of the test image are determined in each scan view, and then compared to the pixel data of the reference images to detect the presence of an anomaly in the test images. The detected anomaly in at least one of the test images of the scan views is then compared to a requirement standard for the material.
摘要:
A method and system for nondestructively detecting and quantifying material anomalies within materials, including composite articles. The method entails performing a three-dimensional imaging scan technique, such as a computed tomography scan, of the material and a reference standard such that a test image of the material and a reference image of the reference standard appear in a plurality of two-dimensional scan views generated by the scan technique. The reference images are located in the scan views and normalized to determine at least an average value of the pixel data for the reference images. Values of pixel data of the test image are determined in each scan view, and then compared to the pixel data of the reference images to detect the presence of an anomaly in the test images. The detected anomaly in at least one of the test images of the scan views is then compared to a requirement standard for the material.
摘要:
A method for inspecting a component is provided. The method includes generating an image of the component, generating a signal indication mask, and generating a noise mask using a signal within the signal indication mask. The noise mask facilitates reducing a quantity of prospective signals contained in the signal indication mask. The method further includes utilizing the signal indication mask and the generated noise mask to calculate the signal-to-noise ratio of at least one potential flaw indication that may be present in the image.
摘要:
Methods and apparatus for fabricating a component is provided. The method includes receiving an ultrasound image of the component, selecting a subimage that includes a first surface of the component and an inspection area of the component, combining a filtered subimage with the selected subimage, and outputting the combined image to at least one of a display and an analyzer.
摘要:
Methods and systems for measuring indications in an image are provided. The method includes acquiring image data that includes a potential indication, processing the data such that features of the indication are enhanced, thresholding the data such that the indication is separated from the remaining data, determining a size of the indication, and displaying a determined size of the indication.
摘要:
An ultrasound inspection system is provided. The ultrasound inspection system includes a pulse echo transducer and a processor that is operationally coupled to the transducer. The system facilitates reducing noise in an echo received from a near surface inspection area of a component. To facilitate reducing noise the processor is programmed to extract an A-scan data set from a B-scan image of the component. The processor is also programmed to locate a half-max point of a front surface echo in the A-scan data set. The processor is also programmed to locate the front surface of the component using a first zero crossing in a derivative of the A-scan data set.
摘要:
A method for inspecting a component is provided. The method includes generating an image of the component, generating a signal indication mask, and generating a noise mask using a signal within the signal indication mask. The noise mask facilitates reducing a quantity of prospective signals contained in the signal indication mask. The method further includes utilizing the signal indication mask and the generated noise mask to calculate the signal-to-noise ratio of at least one potential flaw indication that may be present in the image.
摘要:
The present disclosure provides for the application of a two-dimensional ultrasonic phased array (100), formed of a plurality of transducers (102) arranged in a rectilinear pattern, for material and volumetric component testing. The two-dimensional array enables electronic adjustment of the focal properties and size of the aperture in both the azimuthal and elevational directions such that uniform and/or specified sound field characteristics can be obtained at any or all locations in the component being tested.