公开(公告)号：US20130013247A1

公开(公告)日：2013-01-10

申请号：US13635057

申请日：2011-03-14

申请人： Yasuo Sato ,  Seiji Kajihara ,  Michiko Inoue ,  Tomokazu Yoneda ,  Hyunbean Yi ,  Yukiya Miura

发明人： Yasuo Sato ,  Seiji Kajihara ,  Michiko Inoue ,  Tomokazu Yoneda ,  Hyunbean Yi ,  Yukiya Miura

IPC分类号： G01R31/26 ,  G06F19/00

CPC分类号： G01R31/2884 ,  G01R31/2856 ,  G01R31/3016

摘要： A semiconductor device and the like that can determine the performance of a semiconductor integrated circuit with higher accuracy even when test environment fluctuates. The semiconductor device detects degradation of the semiconductor integrated circuit, including measurement unit that measures temperature and voltage, decision unit that judges whether the test is executed within an allowable test timing in the detection target circuit portion at each test operation frequency and decides a maximum test operation frequency and calculation unit that converts a maximum test operation frequency into that at a standard temperature and voltage and calculates a degradation amount. The semiconductor integrated circuit has a monitor block circuit that monitors the values for the measurement unit to measure temperature and voltage. The measurement unit has estimation unit that estimates temperature and voltage of a detection target circuit portion based on the monitored values. The calculation unit uses the estimated temperature and voltage.

摘要翻译： 即使在测试环境波动的情况下也能够以更高精度确定半导体集成电路的性能的半导体装置等。 半导体器件检测半导体集成电路的劣化，包括测量温度和电压的测量单元，在每个测试操作频率下在检测目标电路部分的允许测试定时内判断测试是否被执行的决定单元，并且决定最大测试 操作频率和计算单元，其将最大测试操作频率转换为标准温度和电压，并计算劣化量。 半导体集成电路具有监控块电路，监视测量单元的值以测量温度和电压。 测量单元具有基于监视值估计检测对象电路部分的温度和电压的估计单元。 计算单位使用估计的温度和电压。

公开(公告)号：US09316684B2

公开(公告)日：2016-04-19

申请号：US13635057

申请日：2011-03-14

申请人： Yasuo Sato ,  Seiji Kajihara ,  Michiko Inoue ,  Tomokazu Yoneda ,  Hyunbean Yi ,  Yukiya Miura

发明人： Yasuo Sato ,  Seiji Kajihara ,  Michiko Inoue ,  Tomokazu Yoneda ,  Hyunbean Yi ,  Yukiya Miura

IPC分类号： G01R31/28 ,  G01R31/30

CPC分类号： G01R31/2884 ,  G01R31/2856 ,  G01R31/3016

摘要： A semiconductor device and the like that can determine the performance of a semiconductor integrated circuit with higher accuracy even when test environment fluctuates. The semiconductor device detects degradation of the semiconductor integrated circuit, including measurement unit that measures temperature and voltage, decision unit that judges whether the test is executed within an allowable test timing in the detection target circuit portion at each test operation frequency and decides a maximum test operation frequency and calculation unit that converts a maximum test operation frequency into that at a standard temperature and voltage and calculates a degradation amount. The semiconductor integrated circuit has a monitor block circuit that monitors the values for the measurement unit to measure temperature and voltage. The measurement unit has estimation unit that estimates temperature and voltage of a detection target circuit portion based on the monitored values. The calculation unit uses the estimated temperature and voltage.

摘要翻译： 即使在测试环境波动的情况下也能够以更高精度确定半导体集成电路的性能的半导体装置等。 半导体器件检测半导体集成电路的劣化，包括测量温度和电压的测量单元，在每个测试操作频率下在检测目标电路部分的允许测试定时内判断测试是否被执行的决定单元，并且决定最大测试 操作频率和计算单元，其将最大测试操作频率转换为标准温度和电压，并计算劣化量。 半导体集成电路具有监控块电路，监视测量单元的值以测量温度和电压。 测量单元具有基于监视值估计检测对象电路部分的温度和电压的估计单元。 计算单位使用估计的温度和电压。

公开(公告)号：US08959001B2

公开(公告)日：2015-02-17

申请号：US13550008

申请日：2012-07-16

申请人： Michiko Inoue ,  Tomokazu Yoneda ,  Yasuo Sato

发明人： Michiko Inoue ,  Tomokazu Yoneda ,  Yasuo Sato

IPC分类号： G01R31/26 ,  G01R31/3183 ,  G01R31/3185 ,  G01R31/317

CPC分类号： G01R31/318371 ,  G01R31/31721 ,  G01R31/318385 ,  G01R31/318544

摘要： A test pattern is sequentially selected from an original test pattern sequence constituted by a plurality of test patterns including a don't care bit. Power consumption in each of regions obtained by substantially equally dividing a layout region of a semiconductor integrated circuit in a case where a don't care value is specified in the selected test pattern and this selected test pattern is applied to the semiconductor integrated circuit is estimated. A searching is conducted for a don't care value of the selected test pattern which minimizes a variation in power consumption among the regions by repeatedly changing the don't care value and repeatedly estimating power consumption in the regions. A new test pattern sequence constituted by a plurality of test patterns including no don't care bit is generated by defining the don't care value obtained by the searching as a don't care value of the selected test pattern.

摘要翻译： 从由包括无关位的多个测试图案构成的原始测试图案序列中顺序地选择测试图案。 估计在所选择的测试图形中指定了不关心值的情况下基本上等分半导体集成电路的布局区域获得的每个区域中的功耗，并将该选择的测试图案应用于半导体集成电路 。 对所选择的测试图案进行搜索，通过重复地改变不关心值并重复地估计区域中的功耗，从而最小化区域之间的功耗变化。 通过将通过搜索获得的无关心值定义为所选择的测试图案的无关价值，生成由包括不关心位的多个测试图案构成的新测试图案序列。

公开(公告)号：US09075110B2

公开(公告)日：2015-07-07

申请号：US13877601

申请日：2011-09-28

申请人： Yasuo Sato ,  Seiji Kajihara

发明人： Yasuo Sato ,  Seiji Kajihara

IPC分类号： G01R31/3185 ,  G01R31/3177

CPC分类号： G01R31/3177 ,  G01R31/318547 ,  G01R31/318566

摘要： It is a purpose of the invention to provide a fault detection system, etc., having improved fault coverage with a reduced number of test patterns to be input to a logic circuit. The fault detection system detects a fault in a logic circuit based on multiple output logic values of the logic circuit after a test input pattern is input. The output logic values are input to the logic circuit as an updated test input pattern. The system comprises: a first acquisition unit which acquires a part of or all of the output logic values; a comparison unit which compares the logic values acquired by the first acquisition unit with those predicted for when there are no faults, or for when there is a specific fault; and a fault judgment unit which judges whether or not there is a fault based on the comparison result obtained by the comparison unit.

摘要翻译： 本发明的目的是提供一种具有改进的故障覆盖的故障检测系统等，其中减少的测试图案数量将被输入到逻辑电路。 在输入测试输入模式之后，故障检测系统基于逻辑电路的多个输出逻辑值来检测逻辑电路中的故障。 输出逻辑值作为更新的测试输入模式输入到逻辑电路。 该系统包括：第一获取单元，其获取输出逻辑值的一部分或全部; 比较单元，其将由第一获取单元获取的逻辑值与当没有故障时预测的逻辑值相比较，或者当存在特定故障时; 以及故障判断单元，其基于由比较单元获得的比较结果来判断是否存在故障。

公开(公告)号：US20130205180A1

公开(公告)日：2013-08-08

申请号：US13877601

申请日：2011-09-28

申请人： Yasuo Sato ,  Seiji Kajihara

发明人： Yasuo Sato ,  Seiji Kajihara

IPC分类号： G01R31/3177

CPC分类号： G01R31/3177 ,  G01R31/318547 ,  G01R31/318566

摘要： It is a purpose of the invention to provide a fault detection system, etc., having improved fault coverage with a reduced number of test patterns to be input to a logic circuit. The fault detection system detects a fault in a logic circuit based on multiple output logic values of the logic circuit after a test input pattern is input. The output logic values are input to the logic circuit as an updated test input pattern. The system comprises: a first acquisition unit which acquires a part of or all of the output logic values; a comparison unit which compares the logic values acquired by the first acquisition unit with those predicted for when there are no faults, or for when there is a specific fault; and a fault judgment unit which judges whether or not there is a fault based on the comparison result obtained by the comparison unit.

摘要翻译： 本发明的目的是提供一种具有改进的故障覆盖的故障检测系统等，其中减少的测试图案数量将被输入到逻辑电路。 在输入测试输入模式之后，故障检测系统基于逻辑电路的多个输出逻辑值来检测逻辑电路中的故障。 输出逻辑值作为更新的测试输入模式输入到逻辑电路。 该系统包括：第一获取单元，其获取输出逻辑值的一部分或全部; 比较单元，其将由第一获取单元获取的逻辑值与当没有故障时预测的逻辑值相比较，或者当存在特定故障时; 以及故障判断单元，其基于由比较单元获得的比较结果来判断是否存在故障。

公开(公告)号：US20110282505A1

公开(公告)日：2011-11-17

申请号：US13061202

申请日：2010-01-08

申请人： Yasushi Tomita ,  Yasuo Sato ,  Masahiro Watanabe ,  Rena Tachihara ,  Yuichi Otake ,  Tatsuya Yamada

发明人： Yasushi Tomita ,  Yasuo Sato ,  Masahiro Watanabe ,  Rena Tachihara ,  Yuichi Otake ,  Tatsuya Yamada

IPC分类号： G06F1/32

CPC分类号： H02J3/14 ,  H02J13/0079 ,  H02J2003/143 ,  H02J2003/146 ,  Y02B70/3225 ,  Y02B70/3266 ,  Y04S20/222 ,  Y04S20/224 ,  Y04S20/242

摘要： A power demand/supply management server (10) obtains information defining restraint contents to a comfort and an electricity bill from a consumer power operating device (2). An individual-consumer control optimizing unit of the power demand/supply management server (10) calculates control contents to an electrical equipment having a minimum cost evaluation value based on a simulation result of cost evaluation values which are barometers for evaluating a comfort and an electricity bill excessiveness, and transmits the calculated control contents to the consumer power operating device (2). Also, a whole-consumer optimizing unit of the power demand/supply management server (10) calculates the most appropriate electricity unit meter-charge that ensures a necessary demand suppression plan level throughout the whole power system based on an electricity daily load curve for each consumer.

摘要翻译： 电力需求/供应管理服务器（10）从消费电力操作装置（2）获得定义约束内容到舒适性和电费单的信息。 电力需求/供应管理服务器（10）的个人消费者控制优化单元基于作为用于评估舒适度和电力的气压计的成本评估值的模拟结果来计算具有最低成本评估值的电气设备的控制内容 票据过多，并将计算出的控制内容发送给消费者电力操作装置（2）。 此外，电力需求/供应管理服务器（10）的整体消费者优化单元计算最适合的电力单位计费，其基于每个电力日负荷曲线确保整个电力系统中的必要的需求抑制计划水平 消费者。

公开(公告)号：US08030109B2

公开(公告)日：2011-10-04

申请号：US12540609

申请日：2009-08-13

申请人： Yasuo Sato ,  Jugo Mitomo ,  Mikihiro Yokozeki ,  Tomonori Hino ,  Hironobu Narui

发明人： Yasuo Sato ,  Jugo Mitomo ,  Mikihiro Yokozeki ,  Tomonori Hino ,  Hironobu Narui

IPC分类号： H01L21/00

CPC分类号： B82Y20/00 ,  H01S5/22 ,  H01S5/3235 ,  H01S5/343

摘要： A semiconductor light emitting device capable of realizing a long life, and a method of manufacturing the same. The impurity concentration of hydrogen in the active layer is 3×1019 cm−3 or less, and the impurity concentration of aluminum in the active layer is 1×1018 cm−3 or less. Thereby, the operating current is inhibited from increasing, and a long life can be realized.

摘要翻译： 能够实现长寿命的半导体发光元件及其制造方法。 活性层中的氢的杂质浓度为3×10 19 cm -3以下，活性层中的铝的杂质浓度为1×1018cm -3以下。 由此，能够抑制工作电流的增加，能够实现长寿命化。

公开(公告)号：US07222102B2

公开(公告)日：2007-05-22

申请号：US10101445

申请日：2002-03-20

申请人： Yasuo Sato ,  Chihiro Fukui ,  Hideaki Suzuki

发明人： Yasuo Sato ,  Chihiro Fukui ,  Hideaki Suzuki

IPC分类号： G06Q90/00

CPC分类号： G06Q30/02 ,  G06Q20/382 ,  H04L29/06 ,  H04L67/12 ,  H04L67/22 ,  H04L67/306 ,  H04L69/329

摘要： A portal site for serving data monitored and observed, which can not only act for monitoring and observing services, instead of a facility owner, but also process the data into economically valuable data with the use of the result of monitoring and observation, is connected to a computer network so as to gather sequential data which is observed in time series by a not less than one sensor as to an operation running condition of a facility belonging the facility owner, and event data monitored invariantly, and incorporates a function of obtaining a data disclosure profile for designating a degree of disclosure of the data, from the facility owner, and a function of onerously serving an item of secondary data obtained by processing the data in a range satisfying the data disclosure profile, to a data user different from the facility owner.

公开(公告)号：US07199496B2

公开(公告)日：2007-04-03

申请号：US11037858

申请日：2005-01-18

申请人： Seiki Suzuki ,  Yasuo Sato ,  Akihiko Hoda ,  Chikara Sugawara ,  Yoshinari Araki ,  Eiji Oi ,  Hung D. Vu

发明人： Seiki Suzuki ,  Yasuo Sato ,  Akihiko Hoda ,  Chikara Sugawara ,  Yoshinari Araki ,  Eiji Oi ,  Hung D. Vu

IPC分类号： H02K11/00 ,  H02K1/23 ,  H02K9/00 ,  H02K3/24 ,  H02K5/00

CPC分类号： H02K11/33

摘要： The heat-generating components of an integrated motor system are disposed proximate the motor body, for efficient heat dissipation, and the heat-sensitive components are segregated therefrom, physically and thermally.

摘要翻译： 集成电动机系统的发热部件设置在电动机主体附近，用于有效散热，并且热敏部件在物理和热学上与其分离。

公开(公告)号：US07197378B2

公开(公告)日：2007-03-27

申请号：US10645483

申请日：2003-08-22

申请人： Yasuo Sato ,  Masahiro Watanabe ,  Kenji Ogawa

发明人： Yasuo Sato ,  Masahiro Watanabe ,  Kenji Ogawa

IPC分类号： G05D17/00 ,  G01R21/133

CPC分类号： H02J3/38 ,  G06Q50/06 ,  H02J3/008 ,  H02J13/0013 ,  Y02E40/72 ,  Y02E60/7807 ,  Y04S10/12 ,  Y04S40/12 ,  Y04S50/10 ,  Y10T307/25

摘要： A coordination controller prevents the deterioration of electric power quality in an electric power system, such as in terms of voltage values, that can be caused when distributed power resources connected in parallel to the electric power system are operated without restrictions. A distributed power resource 103 includes means 112 for communicating with the outside of an electric power facility, means 116 for monitoring the current time, means 115 for synchronizing with the outside time, means 112 for receiving a control schedule for an electric power-consuming apparatus or electric power generating apparatus, and a coordination controller 101 for implementing the control schedule according to the time obtained by the time monitoring means 116.

摘要翻译： 协调控制器防止电力系统中的电力质量的劣化，例如在电力系统并联连接的分布式电力资源无限制地运行时可能导致的电压值的变化。 分布式电力资源103包括用于与电力设施的外部通信的装置112，用于监视当前时间的装置116，用于与外部时间同步的装置115，用于接收电力消耗装置的控制计划的装置112 或发电装置，以及用于根据由时间监视装置116获得的时间来实现控制进度的协调控制器101。