摘要:
Even when the magnifying power is reduced, an image can be obtained at high resolution without significantly reducing the numerical aperture, and examination accuracy is improved. There is provided a microscope examination apparatus including a light source for emitting excitation light or illumination light to a specimen placed on a stage; an objective lens opposing the stage and capable of focusing fluorescence or reflected light from the specimen; an image-forming lens for forming an image of the specimen obtained by the objective lens; and an image-capturing unit for capturing the image of the specimen forming by the image-forming lens, wherein a plurality of the objective lenses having different magnifying powers is provided, and an objective-lens switching mechanism for switching among the objective lenses is provided, and wherein a plurality of the image-forming lenses having different magnifying powers is provided, and an image-forming-lens switching mechanism for switching among the image-forming lenses 5a and 5b is provided.
摘要:
A microscope examination apparatus is provided that includes a light source for emitting excitation light or illumination light to a specimen placed on a stage; an objective lens opposing the stage and capable of focusing fluorescence or reflected light from the specimen; an image-forming lens for forming an image of the specimen obtained by the objective lens; and an image-capturing unit for capturing the image of the specimen forming by the image-forming lens, wherein a plurality of the objective lenses having different magnifying powers is provided, and an objective-lens switching mechanism for switching among the objective lenses is provided, and wherein a plurality of the image-forming lenses having different magnifying powers is provided, and an image-forming-lens switching mechanism for switching among the image-forming lenses is provided.
摘要:
An illumination system for microscopy includes a light source, a first spectral element dispersing light from the light source, a reflecting member selectively reflecting light dispersed by the first spectral element, a second spectral element combining light reflected by the reflecting member, a dichroic mirror, an objective lens, and an image sensor. The first spectral element is placed at the front focal point of a first lens, the reflecting member is placed at a position where the back focal point of the first lens coincides with the front focal point of a second lens, and the second spectral element is placed at the back focal point of the second lens.
摘要:
In a microscope system, illumination light rays are emitted from a light source. The illumination light rays are collimated and reflected from a mirror to the optical element array. The optical element array is located at a conjugate position of a specimen, and includes a plurality of micro mirrors arranged in a matrix form. The micro mirrors are individually controlled to selectively reflect the illumination light rays for illuminating the specimen. Thus, a predetermined pattern of the light rays is reflected from the optical element array to an objective lens. The illumination light rays are projected on the specimen from the objective lens and the specimen is illuminated by the predetermined illumination pattern.
摘要:
The present invention provides an examination apparatus which includes a base; a stage on which a specimen is mounted, the stage being movable relative to the base; and a movable image acquisition apparatus for acquiring an image of the specimen, the movable image acquisition apparatus being fixed on the stage.
摘要:
An in-vivo examination apparatus in which the examination angle can be changed while keeping an examination site in focus to carry out accurate in-vivo examination is provided. The in-vivo examination apparatus includes a stage on which a living organism is mounted, a measurement head that irradiates the living organism on the stage with light emitted from a light source and detects light returning from the living organism, and a rotation mechanism that rotates the measurement head about a fixed point on the stage.
摘要:
A microscope moving unit is provided, the microscope moving unit being capable of preventing an increase in size and a decrease in operation speed of a microscope apparatus by reducing the size of the movable parts, improving the operability of the objective lens by providing a large space around the objective lens, and allowing a specimen to be observed at various positions without affecting the specimen. The microscope moving unit includes an arm that is rotatable around an optical axis of a laser beam guided from a laser light source and that supports a microscope main body on the side closer to a tip of the arm, the microscope main body having an objective lens, and a rotatable deflecting member, which is fixed to the arm, configured to deflect the laser beam and emit the deflected laser beam towards the microscope main body at the side closer to the tip of the arm.
摘要:
The present invention is a virtual-slide specimen image acquisition apparatus that captures images by dividing a specimen into a plurality of sections, having a conveying device in which a plurality of specimens can be arranged and that conveys the plurality of the arranged specimens in a first direction by a distance corresponding to the length of a side along the first direction in one of the divided sections and at first time intervals and an image capturing device that has an image capturing portion for capturing images of the specimens magnified at a predetermined magnification and that scans the specimens conveyed to a predetermined position in a second direction, by a predetermined length at second time intervals, such that the image capturing portion captures images of all of the sections that are positioned identically in the first direction and that are positioned differently in the second direction perpendicular to the first direction.
摘要:
A focusing method for an examination apparatus that can quickly and easily perform focusing for fluoroscopy is provided. The focusing method, for an examination apparatus that can observe fluorescence emitted from a specimen, includes a first step of irradiating the specimen with light via an objective lens to generate reflected light and fluorescence; a second step of performing focusing with respect to the surface of the specimen using the reflected light from the specimen; and a third step of performing focusing for the fluorescence based on the focal position of the specimen surface in the second step.
摘要:
A focusing method for an examination apparatus that can quickly and easily perform focusing for fluoroscopy is provided. The focusing method, for an examination apparatus that can observe fluorescence emitted from a specimen, includes a first step of irradiating the specimen with light via an objective lens to generate reflected light and fluorescence; a second step of performing focusing with respect to the surface of the specimen using the reflected light from the specimen; and a third step of performing focusing for the fluorescence based on the focal position of the specimen surface in the second step.