摘要:
Three-dimensional-model processing apparatus, three-dimensional-model processing methods, and computer programs are provided. In a three-dimensional-model processing apparatus, method, and computer programs, it is determined whether relative positions or relative attitudes of a plurality of three-dimensional objects shown on an image display unit satisfy a predetermined processing execution condition. When it is determined that the processing execution condition is satisfied, distinction information indicating that processing such as pickup or joining of objects is possible is presented. For example, display mode is changed or sound is output for the objects. A user is allowed to immediately find without stress whether an object is at a position where pickup or joining is possible. This improves the efficiency of operation.
摘要:
Three-dimensional-model processing apparatus, three-dimensional-model processing methods, and computer programs are provided. In a three-dimensional-model processing apparatus, method, and computer programs, it is determined whether relative positions or relative attitudes of a plurality of three-dimensional objects shown on an image display unit satisfy a predetermined processing execution condition. When it is determined that the processing execution condition is satisfied, distinction information indicating that processing such as pickup or joining of objects is possible is presented. For example, display mode is changed or sound is output for the objects. A user is allowed to immediately find without stress whether an object is at a position where pickup or joining is possible. This improves the efficiency of operation.
摘要:
Disclosed is a 3-dimensional model-processing apparatus capable of processing a 3-dimensional model appearing on a display unit including a sensor for generating information on the position and the posture, which can be controlled by the user arbitrarily, and control means for carrying out a grasp-state-setting process of taking a relation between the sensor-generated information on the position and the posture of the sensor and information on the position and the posture of the 3-dimensional model appearing on the display unit as a constraint relation on the basis of a relation between the 3-dimensional position of the 3-dimensional model appearing on the display unit and the 3-dimensional position of a tool appearing on the display unit for the sensor or on the basis of a relation between the 3-dimensional posture of the 3-dimensional model appearing on the display unit and the 3-dimensional posture of the tool appearing on the display unit for the sensor.
摘要:
An information processing apparatus is provided which allows a user to easily and intuitively manipulate information in a 3-dimensional virtual space. In the information processing apparatus, a main controller sets a first coordinate system in a real space on the basis of information associated with a real object and further sets a second coordinate system in a 3-dimensional virtual space corresponding to the real space on the basis of the first coordinate system. If a user places an input device at a particular position and angle in the first coordinate system with reference to the real object, the main controller places an object in the 3-dimensional virtual space at a place and angle in the second coordinate system corresponding to the place and angle of the input device in the first coordinate system, and the main controller displays an image of the object placed in the 3-dimensional virtual space on a display.
摘要:
A three-dimensional model processing apparatus is provided. The three-dimensional model processing apparatus can more really carry out a processing change of shape, color, and the like with respect to a three-dimensional object being displayed on a display by allowing an operator to operate an object tool in which a position change and an orientation change can be made and an editing tool in which relative distance with respect to the object tool can be changed to relatively move both tools such that the relative position between the object tool and the editing tool is detected to execute processing corresponding to, for example, shape change or color processing determined by the corresponding editing tool, thereby modifying attribute data of the object being displayed.
摘要:
An information processing method provided, wherein an identifier (ID) corresponding to an object is obtained based on information input from a sensor for detecting the object, and the obtained ID is continuously and repeatedly input to an information processing unit. The information processing unit compares a program that is set based on a newly-input ID with a program that is set based on an already-input ID, and ends the currently-executed program when the two programs are different from each other. In this method, by putting an object in a sensor effective area, a program corresponding to the ID of the object is started, and by removing the object from the sensor effective area, the program is ended.
摘要:
The present invention is a template matching processing device capable of evaluating a similarity degree which supports even a case of intensive morphological change between a design image and a photographic image. In the template matching processing device, matching processing between the design image and the photographic image is performed, a partial design image is obtained by clipping a portion having the highest correlation (step 101), and processing for deforming the photographic image in accordance with the clipped design image (steps 102 to 105) is performed, so that correlation between the deformed image obtained and the design image is taken to be set as the similarity degree.
摘要:
When the lengths of FEM wafers are automatically measured, not only the sizes of targets, the lengths of which are to be measured, are often varied from those in registration, but also the patterns of the targets are often deformed. Therefore, it is difficult to automatically determine whether the length measurement is possible or not. Therefore, the following are executed with a semiconductor inspection system: (1) a process of identifying the position of the contour line of an inspected image using a distance image calculated from a reference image, (2) a process of calculating a defect size image based on the position of the contour line with respect to the identified distance image, and detecting a defect candidate from the defect size image, and (3-1) a process of, upon detection of the defect candidate, calculating the size of the detected defect candidate, or (3-2) a process of detecting a portion different between the first and second contour lines as the defect candidate.
摘要:
It is an object of the present invention to provide a semiconductor inspection apparatus capable of well carrying out position alignment and correctly determining whether the position alignment has been carried out successfully or has ended in a failure without operator interventions even if an inspected image is an image having few characteristics as is the case with a repetitive pattern or the inspected image is an image having a complicated shape.The semiconductor inspection apparatus includes means for imaging a shape on a wafer or on an exposure mask; means for storing an image inspected by the imaging means; means for storing design data of the semiconductor circuit corresponding to a position on the wafer or on the exposure mask which are to be imaged by the imaging means; means for storing a design-data image obtained as a result of converting the design data into an image; means for generating a design-data ROI image by converting an interest drawing region found from a relative crude-density relation of a shape included in the design-data image into an image; and a position alignment section configured to carry out position alignment on the inspected image and the design-data image. The semiconductor inspection apparatus makes use of the design-data ROI image in order to identify a position at which the inspected image and the design-data image match each other or compute the degree of coincidence.
摘要:
An evaluation value indicative of the extent of lines in each direction is calculated for a pre-processed image in which 0s are filled in and extended in the lateral direction of the inputted image and which has been reduced ⅛th in the longitudinal direction. To obtain the angle of rotation of an image from the change in the evaluation value obtained while the angle relative to the lateral direction of the pre-processed image is modified in small steps, a parallel line is drawn for each direction, a projection is taken, and the sum of squares serves as the evaluation value of the direction. The direction having the highest evaluation value serves as the obtained direction of rotation from the normal position. The projection of each direction references the point of intersection between the parallel line drawn for each direction and the coordinate line of the horizontal axis.