摘要:
Silicon precursors for forming silicon-containing films in the manufacture of semiconductor devices, such as films including silicon carbonitride, silicon oxycarbonitride, and silicon nitride (Si3N4), and a method of depositing the silicon precursors on substrates using low temperature (e.g.,
摘要翻译:在制造半导体器件(例如包括碳氮化硅,碳氮化硅和氮化硅(Si 3 N 4)的薄膜)的制造中的硅前体,以及使用低温(例如,550℃)将硅前体沉积在衬底上的方法 ℃)化学气相沉积工艺,用于制造ULSI器件和器件结构。
摘要:
Silicon precursors for forming silicon-containing films in the manufacture of semiconductor devices, such as films including silicon carbonitride, silicon oxycarbonitride, and silicon nitride (Si3N4), and a method of depositing the silicon precursors on substrates using low temperature (e.g.,
摘要翻译:在制造半导体器件(例如包括碳氮化硅,碳氮化硅和氮化硅(Si 3 N 4)的薄膜)的制造中的硅前体,以及使用低温(例如,550℃)将硅前体沉积在衬底上的方法 ℃)化学气相沉积工艺,用于制造ULSI器件和器件结构。
摘要:
Silicon precursors for forming silicon-containing films in the manufacture of semiconductor devices, such as films including silicon carbonitride, silicon oxycarbonitride, and silicon nitride (Si3N4), and a method of depositing the silicon precursors on substrates using low temperature (e.g.,
摘要:
Silicon precursors for forming silicon-containing films in the manufacture of semiconductor devices, such as low dielectric constant (k) thin films, high k gate silicates, low temperature silicon epitaxial films, and films containing silicon nitride (Si3N4), siliconoxynitride (SiOxNy) and/or silicon dioxide (SiO2). The precursors of the invention are amenable to use in low temperature (e.g.,
摘要翻译:半导体器件如低介电常数(k)薄膜,高k栅极硅酸盐,低温硅外延膜和含有氮化硅(Si 3 N 4),硅氧氮化物(SiO x N y)的膜的制造中的含硅膜的硅前体, 和/或二氧化硅(SiO 2)。 本发明的前体适于在低温(例如,<500℃)的化学气相沉积工艺中使用,用于制造ULSI器件和器件结构。
摘要:
Silicon precursors for forming silicon-containing films in the manufacture of semiconductor devices, such as low dielectric constant (k) thin films, high k gate silicates, low temperature silicon epitaxial films, and films containing silicon nitride (Si3N4), siliconoxynitride (SiOxNy) and/or silicon dioxide (SiO2). The precursors of the invention are amenable to use in low temperature (e.g.,
摘要翻译:半导体器件如低介电常数(k)薄膜,高k栅极硅酸盐,低温硅外延膜和含有氮化硅(Si 3 N 4),硅氧氮化物(SiO x N y)的膜的制造中的含硅膜的硅前体, 和/或二氧化硅(SiO 2)。 本发明的前体适于在低温(例如,<500℃)的化学气相沉积工艺中使用,用于制造ULSI器件和器件结构。
摘要:
Silicon precursors for forming silicon-containing films in the manufacture of semiconductor devices, such as low dielectric constant (k) thin films, high k gate silicates, low temperature silicon epitaxial films, and films containing silicon nitride (Si3N4), siliconoxynitride (SioxNy) and/or silicon dioxide (SiO2). The precursors of the invention are amenable to use in low temperature (e.g.,
摘要:
Copper precursors useful for depositing copper or copper-containing films on substrates, e.g., microelectronic device substrates or other surfaces. The precursors includes copper compounds of various classes, including copper borohydrides, copper compounds with cyclopentadienyl-type ligands, copper compounds with cyclopentadienyl-type and isocyanide ligands, and stabilized copper hydrides. The precursors can be utilized in solid or liquid forms that are volatilized to form precursor vapor for contacting with the substrate, to form deposited copper by techniques such as chemical vapor deposition (CVD), atomic layer deposition (ALD) or rapid vapor deposition (digital CVD).