Coating compositions for use with an overcoated photoresist
    7.
    发明授权
    Coating compositions for use with an overcoated photoresist 有权
    用于外涂光致抗蚀剂的涂料组合物

    公开(公告)号:US07919222B2

    公开(公告)日:2011-04-05

    申请号:US11698397

    申请日:2007-01-26

    IPC分类号: G03C1/76 G03C1/492

    CPC分类号: G03F7/11 G03F7/091

    摘要: Underlying coating compositions are provided for use with an overcoated photoresist composition. In one aspect, the coating composition can be crosslinked and comprise one or more components that contain one or more acid-labile groups and/or one or more base-reactive groups that are reactive following crosslinking. In another aspect, underlying coating composition are provided that can be treated to provide a modulated water contact angle. Preferred underlying coating compositions can exhibit enhanced etch rates in plasma etchants. Additional preferred coating compositions can enhance lithographic performance of an associated photoresist composition.

    摘要翻译: 提供底涂层组合物用于外涂光致抗蚀剂组合物。 在一个方面,涂料组合物可以是交联的并且包含一种或多种含有一个或多个酸不稳定基团的组分和/或一个或多个在交联后是反应性的碱反应性基团。 在另一方面,提供了可以处理以提供调制水接触角的下面的涂料组合物。 优选的下层涂料组合物可以在等离子体蚀刻剂中显示出增强的蚀刻速率。 另外优选的涂料组合物可以增强相关光致抗蚀剂组合物的平版印刷性能。

    Lead-free tin alloy electroplating compositions and methods
    10.
    发明申请
    Lead-free tin alloy electroplating compositions and methods 有权
    无铅锡合金电镀组合物及方法

    公开(公告)号:US20100216302A1

    公开(公告)日:2010-08-26

    申请号:US12655554

    申请日:2009-12-31

    IPC分类号: H01L21/768 C25D3/60 C25D7/12

    CPC分类号: C23C18/54 C25D3/60

    摘要: Disclosed are electrolyte compositions for depositing a tin alloy on a substrate. The electrolyte compositions include tin ions, ions of one or more alloying metals, a flavone compound and a dihydroxy bis-sulfide. The electrolyte compositions are free of lead and cyanide. Also disclosed are methods of depositing a tin alloy on a substrate and methods of forming an interconnect bump on a semiconductor device.

    摘要翻译: 公开了用于在基材上沉积锡合金的电解质组合物。 电解质组合物包括锡离子,一种或多种合金金属的离子,黄酮化合物和二羟基双硫化物。 电解质组合物不含铅和氰化物。 还公开了在基板上沉积锡合金的方法以及在半导体器件上形成互连凸点的方法。