公开(公告)号：US20220201830A1

公开(公告)日：2022-06-23

申请号：US17132094

申请日：2020-12-23

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Ernest COOLEY ,  Xin ZHANG ,  Fuzhong WEI

IPC分类号： H05G1/36 ,  H05G1/32

摘要： An x-ray source assembly includes an anode stack including a source spot upon which electrons impinge with power being supplied to the assembly, and a control system to facilitate maintaining intensity of output x-rays from the x-ray source assembly during operation. The control system is configured to actively control temperature of the anode stack relative to a setpoint or defined setpoint range. The control system heats the anode stack in a heating mode, when an anode stack temperature is below the setpoint or defined setpoint range, and switches to a cooling mode to cool the anode stack when the anode stack temperature rises above the setpoint or defined setpoint range.

公开(公告)号：US20140294157A1

公开(公告)日：2014-10-02

申请号：US14128078

申请日：2012-10-25

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Zewu Chen ,  Rory D. Delaney ,  John H. Burdett ,  Kai Xin

IPC分类号： G21K1/06

CPC分类号： G21K1/06 ,  G01N23/2076 ,  G01N23/223 ,  G01N2223/076 ,  G01N2223/308 ,  G01N2223/315 ,  G21K2201/064

摘要： A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.

摘要翻译： 具有多个高度对准的弯曲X射线光学器件的支撑结构，所述支撑结构具有多个内部部分或完全同心的表面，所述光学元件安装在所述多个内部部分或完全同心的表面上，从而使所述光学元件沿着其中心光轴对准，因此与源， /或检测器结合使用该支撑结构。 表面可以嵌套在中心光轴周围; 并且支撑结构可以通过壁纵向分割成围绕中心光轴的部分。 X射线光学元件中的至少一个包括弯曲衍射光学元件，用于接收发散的X射线束并将光束聚焦到焦点区域，在一个实施例中是聚焦单色光学元件。 在改进的实施例中，光学元件包括单层，塑性变形的LiF光学器件。

公开(公告)号：US20140270063A1

公开(公告)日：2014-09-18

申请号：US14208215

申请日：2014-03-13

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： George ALLEN ,  John H. BURDETT, JR. ,  Zewu CHEN ,  Leslie JOHNSON

IPC分类号： G01N23/223 ,  G01N1/14

CPC分类号： G01N23/223 ,  B01L3/561 ,  G01N1/28 ,  G01N21/85 ,  G01N23/2204 ,  G01N35/085 ,  G01N2001/002 ,  G01N2223/076 ,  G01N2223/637 ,  G01N2223/652

摘要： A sample handling apparatus/technique/method are provided for a material analyzer, including: a sample cell insert for carrying sample to and from a sample focal area of the analyzer; a removable sample carrying device for providing sample to the cell insert; and an actuator to flow sample from the carrying device to the sample cell insert. The removable sample carrying device may be a syringe, and the actuator pushes a plunger of the syringe to expel the sample to the sample cell insert. The sample cell insert may be mounted onto a sample cell, the sample cell being insertable into the analyzer for sample analysis. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.

摘要翻译： 提供了一种用于材料分析仪的样品处理装置/技术/方法，包括：用于将样品携带到分析仪的样品焦点区域和从样品聚焦区域进行的样品池插入物; 用于将样品提供给细胞插入物的可移除样品携带装置; 以及将样品从携带装置流动到样品池插入件的致动器。 可移除的样品携带装置可以是注射器，并且致动器推动注射器的柱塞以将样品排出到样品池插入件。 样品池插入物可以安装在样品池上，样品池可插入分析器中用于样品分析。 样品处理装置可以与具有光学功能的X射线分析仪组合使用，该X射线分析仪包括具有x射线激发路径和x射线检测路径的x射线引擎，其中x射线 激发和/或x射线检测路径限定样本焦点区域。

公开(公告)号：US20140105363A1

公开(公告)日：2014-04-17

申请号：US14052078

申请日：2013-10-11

申请人： X-RAY OPTICAL SYSTEMS, INC.

发明人： Zewu CHEN ,  David M. GIBSON ,  Walter M. GIBSON ,  Adam BAILEY ,  R. Scott SEMKEN ,  Kai XIN ,  John H. BURDETT, JR.

IPC分类号： G21K1/06 ,  G01N23/20

CPC分类号： G21K1/06 ,  G01N23/20008 ,  G01N23/223 ,  G01N2223/076 ,  G01N2223/1003 ,  G01N2223/315 ,  G01N2223/423 ,  G21K2201/062 ,  G21K2201/064 ,  H05G1/04

摘要： An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced having a characteristic first energy, and bremsstrahlung energy; a first x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam; and a second x-ray optic receives the diverging x-ray beam and directs the beam toward the sample spot, while monochromating the beam to a second energy. The first x-ray optic may monochromate characteristic energy from the source spot, and the second x-ray optic may monochromate bremsstrahlung energy from the source spot. The x-ray optics may be curved diffracting optics, for receiving the diverging x-ray beam from the x-ray tube and focusing the beam at the sample spot. Detection is also provided to detect and measure various toxins in, e.g., manufactured products including toys and electronics.

摘要翻译： 一种用X射线束照射样品斑点的X射线分析装置。 提供具有源极点的X射线管，从该源点产生具有特征的第一能量和bre致辐射能量的发散X射线束; 第一x射线光学器件接收发散的X射线束并将光束引向样品斑点，同时对光束进行单色; 并且第二x射线光学器件接收发散的X射线束并将光束引向样品斑点，同时将光束单色化为第二能量。 第一个X射线光学元件可以对来自源光斑的特征能量进行单色化，第二个X射线光学元件可以从源光点单色bre致辐射能量。 x射线光学元件可以是弯曲衍射光学器件，用于从X射线管接收发散的X射线束并将光束聚焦在样品点。 还提供检测以检测和测量例如包括玩具和电子产品在内的制造产品中的各种毒素。

公开(公告)号：US08625737B2

公开(公告)日：2014-01-07

申请号：US13023111

申请日：2011-02-08

申请人： Zewu Chen ,  Sony Cheriyan ,  Kai Xin ,  Jay Burdett

发明人： Zewu Chen ,  Sony Cheriyan ,  Kai Xin ,  Jay Burdett

IPC分类号： G01N23/223 ,  G01N21/01 ,  H05G1/02

CPC分类号： G01N23/223 ,  G01N23/12 ,  G01N2223/076

摘要： An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream supported in the space and streaming through the focal area, using a support structure to guide the sample stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier.

摘要翻译： 一种具有用于产生朝向x射线分析焦点区域的x射线激发光束的x射线源的x射线分析系统; 以及用于将流体样品呈现到X射线分析焦点区域的样品室。 x射线激发光束由x射线引擎产生，并通过腔室壁上的x射线透明屏障，以在腔体限定的空间内限定分析焦点区域。 流体样品呈现为支撑在空间中的流并通过焦点区域流动，使用支撑结构来引导样品流。 因此，室的屏障与焦点区域和样品分离，导致屏障的腐蚀减少。

公开(公告)号：US08130908B2

公开(公告)日：2012-03-06

申请号：US12710827

申请日：2010-02-23

申请人： Huapeng Huang ,  Alexei Vershinin

发明人： Huapeng Huang ,  Alexei Vershinin

IPC分类号： G01N23/207

CPC分类号： G01N23/207

摘要： An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.

摘要翻译： 一种用于测量多颗粒样品的晶体取向的x射线衍射装置。 提供了具有聚焦光学元件的x射线激发路径，用于从x射线源收集X射线，并将所收集的x射线重定向成会聚在多晶粒样品的单个晶粒上的x射线束。 至少一个点检测器和样品相对于彼此旋转; 并且基于从装置内的第一和第二晶粒晶面收集的衍射图案获得晶粒取向。

公开(公告)号：US07738629B2

公开(公告)日：2010-06-15

申请号：US11941377

申请日：2007-11-16

申请人： Zewu Chen

发明人： Zewu Chen

IPC分类号： G21K1/06

CPC分类号： G21K1/06 ,  G21K2201/062 ,  G21K2201/064

摘要： A diffracting x-ray optic for accepting and redirecting x-rays. The optic includes at least two layers, the layers having a similar or differing material composition and similar or differing crystalline orientation. Each of the layers exhibits a diffractive effect, and their collective effect provides a diffractive effect on the received x-rays. In one embodiment, the layers are silicon, and are bonded together using a silicon-on-insulator bonding technique. In another embodiment, an adhesive bonding technique may be used. The optic may be a curved, monochromating optic.

摘要翻译： 用于接收和重定向X射线的衍射x射线光学器件。 光学元件包括至少两层，这些层具有相似或不同的材料组成以及相似或不同的晶体取向。 每个层都具有衍射效应，它们的集合效果对接收到的X射线产生衍射效应。 在一个实施例中，这些层是硅，并且使用绝缘体上硅键合技术将其粘结在一起。 在另一个实施方案中，可以使用粘合剂粘合技术。 光学元件可以是弯曲的单色光学元件。

公开(公告)号：US07729471B2

公开(公告)日：2010-06-01

申请号：US12323590

申请日：2008-11-26

申请人： John H. Burdett, Jr. ,  Daniel L. Dunham ,  James B. Quinn

发明人： John H. Burdett, Jr. ,  Daniel L. Dunham ,  James B. Quinn

IPC分类号： G01N23/223 ,  B01L3/00

CPC分类号： G01N23/2204 ,  G01N23/223 ,  G01N2223/076

摘要： A sample cell for an analysis instrument, having an outer body forming a sample reservoir therein; a directional fill valve disposed in an upper end of the outer body and forming an upper end of the sample reservoir, the fill valve for accepting a sample during filling, and preventing sample leakage while providing venting after filling; and a film covering a lower end of the outer body, and forming a bottom end of the sample reservoir, the film for presenting the sample to an analysis focal spot of the analysis instrument. The disclosed sample cell is especially suited for an x-ray analysis engine having a focal spot requiring alignment with the sample in the sample cell. At least one x-ray optic may be disposed in an excitation and/or detection path, requiring alignment to the focal spot, in e.g., a WDXRF or EDXRF system.

摘要翻译： 一种用于分析仪器的样品池，具有在其中形成样品储存器的外部体; 设置在外主体的上端并形成样品容器的上端的定向填充阀，用于在填充期间接收样品的填充阀，并且在填充之后提供排气时防止样品泄漏; 以及覆盖所述外体的下端的膜，并且形成所述样品储存器的底端，所述膜用于将所述样品提供给所述分析仪器的分析焦斑。 所公开的样品池特别适合于具有需要与样品池中的样品对准的焦点的x射线分析引擎。 至少一个X射线光学元件可以设置在激励和/或检测路径中，需要与焦斑对准，例如WDXRF或EDXRF系统。

公开(公告)号：US07711088B2

公开(公告)日：2010-05-04

申请号：US10893511

申请日：2004-07-16

申请人： David M. Gibson ,  Walter M. Gibson ,  Huapeng Huang ,  Jodi Lynn Reeves

发明人： David M. Gibson ,  Walter M. Gibson ,  Huapeng Huang ,  Jodi Lynn Reeves

IPC分类号： G01N23/20 ,  G21K1/06

CPC分类号： G01N23/207

摘要： An x-ray diffraction measurement apparatus for measuring a sample, having an x-ray source and detector coupled together in a combination for coordinated rotation around the sample, such that x-ray diffraction data can be taken at multiple phi angles. The apparatus may provide a pole figure representation of crystal orientation of the sample, wherein the pole figure represents the crystal alignment, and a full width half maximum value is calculated from the pole figure for crystal alignment quantification. Data may be taken at discrete positions along a length of the sample, and the sample is in a fixed position during measuring; or data may be taken continuously along a length of the article, as the sample continuously moves along its length in a movement path between the source and detector. The sample may be in the form of a tape, linearly passing through a measurement zone.

摘要翻译： 一种用于测量样品的x射线衍射测量装置，其具有以组合的方式耦合在一起的X射线源和检测器，以便围绕样品进行协调旋转，使得可以以多个角度拍摄X射线衍射数据。 该装置可以提供样品的晶体取向的极图表示，其中极图表示晶体对准，并且从用于晶体取向定量的极数计算全宽半最大值。 数据可以沿着样品的长度的离散位置进行，并且样品在测量期间处于固定位置; 或者随着样品在源和检测器之间的运动路径中连续地沿其长度移动，可以沿物品的长度连续地取走数据。 样品可以是带状的，线性地通过测量区域的形式。

公开(公告)号：US20090225948A1

公开(公告)日：2009-09-10

申请号：US12397504

申请日：2009-03-04

申请人： John H. BURDETT, JR. ,  Adam BAILEY ,  Zewu CHEN ,  R. Scott SEMKEN ,  Kai XIN

发明人： John H. BURDETT, JR. ,  Adam BAILEY ,  Zewu CHEN ,  R. Scott SEMKEN ,  Kai XIN

IPC分类号： G21K1/06

CPC分类号： G21K1/06 ,  B82Y10/00 ,  G21K1/062 ,  G21K2201/061 ,  G21K2201/062 ,  G21K2201/064 ,  G21K2201/067

摘要： An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced, the source spot requiring alignment along a transmission axis passing through the sample spot. A first housing section is provided, to which the x-ray tube is attached, including mounting features for adjustably mounting the x-ray tube therein such that the source spot coincides with the transmission axis. A second housing section includes a second axis coinciding with the transmission axis; and at least one x-ray optic attached to the second housing section for receiving the diverging x-ray beam and directing the beam toward the sample spot. Complimentary mating surfaces may be provided to align the first and second sections, and the optics, to the transmission axis. A third housing section may also be provided, including an aperture through which the x-ray beam passes, and to which a detector may be attached.

摘要翻译： 一种用X射线束照射样品斑点的X射线分析装置。 提供了具有产生发散X射线束的源极点的X射线管，源点需要沿着穿过样品斑点的透射轴对准。 提供了第一容纳部分，X射线管被附接到该第一壳体部分，包括用于可调节地将x射线管安装在其中的安装特征，使得源点与透射轴一致。 第二壳体部分包括与传动轴线重合的第二轴线; 以及附接到第二壳体部分的至少一个x射线光学器件，用于接收发散的X射线束并将光束引向样品斑点。 可以提供免费配合表面以将第一和第二部分以及光学元件对准到透射轴线。 还可以设置第三壳体部分，其包括x射线束通过的孔，并且可以附接检测器。