AN AUTOMATED DICING TOOL FOR SEMICONDUCTOR SUBSTRATE MATERIALS
    1.
    发明申请
    AN AUTOMATED DICING TOOL FOR SEMICONDUCTOR SUBSTRATE MATERIALS 失效
    半导体基板材料的自动定位工具

    公开(公告)号:US20060143908A1

    公开(公告)日:2006-07-06

    申请号:US11275319

    申请日:2005-12-22

    IPC分类号: H05K3/10 A21C11/12

    摘要: A method and an apparatus for subdividing a sheet of brittle insulating material (a silicon wafer substrate) with a plurality of semiconductor chips disposed thereon and electrically bonded to respective underlying circuit blocks printed on the sheet to provide each chip with its own substrate. The chips are arranged in rows and columns separated by row and column kerfs each of which contains a respective scribed line. The subdivision of the sheet is accomplished by placing the substrate in a flexible conformable carrier having a solid bottom and a top having an open grid, formed of ribs, with each rib positioned over a respective scribe line on the surface of the sheet; positioning a rigid convex, arched anvil parallel to the scribe lines in the row kerfs, pneumatically or hydraulically forcing the sheet containing carrier to conform to the arch of the anvil and thereby fracture the sheet along the scribe lines in the row kerfs lying parallel to the arch; removing the pneumatic force, rotating the anvil ninety degrees to parallel the scribe lines in the column kerfs, pneumatically forcing the conformable carrier against the rotated anvil to fracture the sheet along the scribe lines in the column kerfs, removing the pneumatic force, removing the carrier from the apparatus and removing the individualized chip bearing substrates from the carrier.

    摘要翻译: 一种脆性绝缘材料薄片(硅晶片基片)与设置在其上的多个半导体芯片进行分割并与印刷在薄片上的各个底层电路块电连接以向每个芯片提供自己的衬底的方法和装置。 这些芯片被排列成行和列,每行和列分别包含相应的划线。 片材的细分通过将基底放置在具有固体底部的柔性适形载体中,并且顶部具有由肋形成的开放格栅,每个肋位于片材表面上的相应划线之上; 将刚性凸起的拱形砧平行于行切割中的划线,气动地或液压地迫使片材载体符合砧座的拱形,从而沿着平行于所述砧座的行切口中的划线断裂片材 拱; 去除气动力,使砧座旋转九十度以平行切割线中的划线,气动地迫使适形载体抵靠旋转的砧座沿着切线中的划线断裂片材,去除气动力,移除载体 从设备中取出个体化的承载芯片的载体。

    SEPARATING DEVICE FOR THE CHIP-FREE CUTTING OF WAFERS OF DONOR SUBSTRATES

    公开(公告)号:US20180009130A1

    公开(公告)日:2018-01-11

    申请号:US15543897

    申请日:2016-01-13

    申请人: SILTECTRA GmbH

    发明人: Jan Richter

    IPC分类号: B28D5/00

    CPC分类号: B26F3/06 B28D5/0047 H01L21/84

    摘要: The present invention relates to a device (1) for separating at least one wafer from a donor substrate (2). The device (1) according to the invention comprises at least a housing (4) with a receiving space (6) for receiving at least one multi-layer arrangement (8) which consists of at least one donor substrate (2) and a receiving layer (10) arranged or generated thereon, and an application device (12) for the contactless application of the multi-layer arrangement (8) for generating crack-conducting stresses in the multi-layer arrangement (8).