Nondestructive testing apparatus and method
    2.
    发明授权
    Nondestructive testing apparatus and method 有权
    无损检测仪器及方法

    公开(公告)号:US08368289B2

    公开(公告)日:2013-02-05

    申请号:US12993597

    申请日:2009-04-10

    Abstract: A laser opto-acoustic apparatus and method is applied for nondestructive testing of defects and residual stresses in solids. A nondestructive testing apparatus may have a piezoelectric transducer for measuring oscillations in a solid. The oscillations or waves may be caused from longitudinal, shear, and/or Raleigh waves in the object to be tested. The nondestructive testing apparatus may also include a laser. The laser is capable of generating the longitudinal, shear, and/or Raleigh waves in the object. One method of performing nondestructive testing of materials may include creating at least one of a longitudinal, shear, and/or Raleigh wave in an object and measuring the speed of the wave in the object. The speed of the waves may be compared with the speed of waves in a material without defects to determine whether the object to be tested has defects.

    Abstract translation: 激光光声装置和方法用于固体中缺陷和残余应力的非破坏性测试。 非破坏性测试装置可以具有用于测量固体中的振荡的压电换能器。 振荡或波浪可能由被测物体中的纵向,剪切和/或罗利波引起。 无损检测装置也可以包括激光器。 激光能够在物体中产生纵向,剪切和/或罗利波。 执行材料的非破坏性测试的一种方法可以包括在物体中产生纵向,剪切和/或罗利波中的至少一个并测量物体中波的速度。 波的速度可以与没有缺陷的材料中的波的速度进行比较,以确定待测试对象是否具有缺陷。

    PIEZOELECTRIC POSITION SENSOR FOR PIEZOELECTRICALLY DRIVEN RESONANT MICROMIRRORS
    5.
    发明申请
    PIEZOELECTRIC POSITION SENSOR FOR PIEZOELECTRICALLY DRIVEN RESONANT MICROMIRRORS 审中-公开
    用于压电驱动谐振微机的压电位置传感器

    公开(公告)号:US20160069754A1

    公开(公告)日:2016-03-10

    申请号:US14846299

    申请日:2015-09-04

    CPC classification number: G01L1/167 B81B3/00 G01L5/00 G02B26/0858 H01L41/0926

    Abstract: Embodiments of the present invention provide an apparatus including a micromirror, an excitation structure containing or supporting the micromirror, and at least one piezoelectric sensor. The excitation structure includes at least one piezoelectric actuator, the excitation structure being configured to resonantly excite the micromirror so as to cause a deflection of the micromirror. The at least one piezoelectric sensor is configured to provide a sensor signal dependent on the deflection of the micromirror, the piezoelectric sensor being connected to the excitation structure so that during the resonant excitation of the micromirror, the sensor signal and the deflection of the micromirror exhibit a fixed mutual phase relationship.

    Abstract translation: 本发明的实施例提供一种包括微镜,包含或支撑微镜的​​激励结构以及至少一个压电传感器的装置。 励磁结构包括至少一个压电致动器,该激励结构被配置为使微反射镜共振地激发以引起微镜的偏转。 至少一个压电传感器被配置为提供取决于微镜的偏转的传感器信号,压电传感器连接到激励结构,使得在微镜的谐振激励期间,传感器信号和微镜的偏转展现 一个固定的相互关系。

    Sensors for detecting electromagnetic parameters utilizing resonating
elements
    10.
    发明授权
    Sensors for detecting electromagnetic parameters utilizing resonating elements 失效
    用于使用谐振元件检测电磁参数的传感器

    公开(公告)号:US4897541A

    公开(公告)日:1990-01-30

    申请号:US201599

    申请日:1988-06-02

    CPC classification number: G01R15/248 G01D5/268 G01L1/167

    Abstract: To detect a physical parameter, a resonator is connected to a body which changes in dimension when subjected to the parameter. Thus, when the body changes in dimension in response to the parameter, the resonance frequency of the resonator is modulated thereby. Such modulations are detected optically to detect and measure the parameter. In the preferred embodiment, the resonator transmits light and light is applied to the resonator so that the light supplied is transmitted through the resonator and so that the modulations of the resonance frequency also modulates the intensity of the light transmitted by the resonator. The modulations of the intensity of the light transmitted by the resonator is detected to detect the parameter.

    Abstract translation: 为了检测物理参数,谐振器连接到当受到参数时尺寸变化的主体。 因此,当身体响应于参数而改变尺寸时,谐振器的谐振频率被调制。 这种调制被光学检测以检测和测量该参数。 在优选实施例中,谐振器透射光,并且将光施加到谐振器,使得所提供的光通过谐振器传输,使得谐振频率的调制也调制由谐振器发射的光的强度。 检测由谐振器发射的光的强度的调制以检测该参数。

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