Method for optically trimming electronic components
    2.
    发明授权
    Method for optically trimming electronic components 有权
    光学修整电子部件的方法

    公开(公告)号:US07332402B2

    公开(公告)日:2008-02-19

    申请号:US10846210

    申请日:2004-05-14

    申请人: William Freeman

    发明人: William Freeman

    IPC分类号: H01L21/20 H01L21/00

    摘要: Methods for adjusting the bulk material properties of manufactured components, such as resistors, thermistors, varistors, capacitors, resonators, oscillators, and optical components. Adjustment of the resistance of a resistor can be achieved by directing a high energy beam, such as an ultraviolet beam, onto a resistor formed from a matrix component and an embedded conductive component. The high energy beam adjusts the resistivity of the resistor material substantially without ablating the matrix component by affecting the matrix component, the conductive component, or both. Because of the lack of ablation, the material having a property to be adjusted can be a sub-layer in a laminated structure, with the high energy beam being directed through other layers formed thereon.

    摘要翻译: 用于调节制造部件的体材料性质的方法,例如电阻器,热敏电阻器,变阻器,电容器,谐振器,振荡器和光学部件。 可以通过将诸如紫外光束的高能束引导到由矩阵元件和嵌入的导电元件形成的电阻上来实现电阻器的电阻的调节。 高能束通过影响基体组分,导电组分或两者而基本上不调节基质组分,从而调节电阻材料的电阻率。 由于缺乏消融,具有待调整性质的材料可以是层叠结构中的子层,高能束被引导通过其上形成的其它层。

    METHOD OF ADJUSTING RESISTORS POST SILICIDE PROCESS
    3.
    发明申请
    METHOD OF ADJUSTING RESISTORS POST SILICIDE PROCESS 失效
    硅胶工艺后调整电阻的方法

    公开(公告)号:US20060046418A1

    公开(公告)日:2006-03-02

    申请号:US10711130

    申请日:2004-08-26

    IPC分类号: H01L21/20

    摘要: A method of fabricating a resistor in which the resistance value of the resistor is measured and adjusted after silicidation is provided. The method of the present invention begins with first providing at least one resistor, e.g., polysilicon, having a resistance value on a surface of a semiconductor substrate. The at least one resistor has been subjected to a silicidation process. Next, the resistance value of the at least one resistor is measured to determine the actual resistance of the resistor after silicidation. After the measuring step, the resistance of the resistor is adjusted to achieve a desired resistance value. The adjusting may include a post silicidation rapid thermal anneal and/or a post silicidation ion implantation and a low temperature rapid thermal anneal step.

    摘要翻译: 提供了在硅化后测量和调整电阻器的电阻值的电阻器的制造方法。 本发明的方法首先开始在半导体衬底的表面上提供具有电阻值的至少一个电阻器,例如多晶硅。 至少一个电阻器已进行硅化处理。 接下来,测量至少一个电阻器的电阻值,以确定硅化后电阻器的实际电阻。 在测量步骤之后,调整电阻器的电阻以获得所需的电阻值。 调整可以包括后硅化快速热退火和/或后硅化离子注入和低温快速热退火步骤。

    Resistor calibration using a MOS capacitor

    公开(公告)号:US09793181B2

    公开(公告)日:2017-10-17

    申请号:US14659051

    申请日:2015-03-16

    发明人: Vratislav Michal

    CPC分类号: H01L22/14 H01C17/22 H01C17/26

    摘要: A method for calibrating a resistance value comprises the steps of measuring a value of a reference capacitor, and adjusting a variable resistor based on the measured value of the reference capacitor. The method may more specifically comprise the steps of directing a constant current through the reference capacitor during a reference time interval; after the reference time interval, directing the constant current through the variable resistor; and varying the variable resistor value progressively by varying a control signal until a voltage of the variable resistor reaches a voltage of the reference capacitor.

    METHOD FOR MODIFYING THE VALUE OF AN ELECTRIC RESISTOR COMPRISING A FERROMAGNETIC MATERIAL
    8.
    发明申请
    METHOD FOR MODIFYING THE VALUE OF AN ELECTRIC RESISTOR COMPRISING A FERROMAGNETIC MATERIAL 审中-公开
    用于修改包含铁磁材料的电阻器的值的方法

    公开(公告)号:US20160074953A1

    公开(公告)日:2016-03-17

    申请号:US14786298

    申请日:2014-04-18

    IPC分类号: B23K9/08 H01C10/00 B23K9/09

    摘要: A method for modifying the value of an electrical resistance (30), comprising a ferromagnetic material (31) having a first magnetization direction, comprising the following steps of: illuminating, by a first LASER beam (14), a first area (32) of the ferromagnetic material (31), so that this area is heated at a temperature equal to or higher than the Curie temperature of the ferromagnetic material (31); applying in the first area (32) a first magnetic field having a direction opposite to the first magnetization direction of the ferromagnetic material (31); reducing the energy brought by the first LASER beam (14) to the first area (32) in order to enable the first area to be cooled to form a first controlled magnetic domain (36C).

    摘要翻译: 一种用于修改包括具有第一磁化方向的铁磁材料(31)的电阻值(30)的方法,包括以下步骤:通过第一激光束(14)照射第一区域(32), 使得该区域在等于或高于铁磁材料(31)的居里温度的温度下被加热; 在第一区域(32)中施加具有与铁磁材料(31)的第一磁化方向相反的方向的第一磁场; 将第一激光束(14)所带来的能量降低到第一区域(32),以使第一区域能够被冷却以形成第一受控磁畴(36C)。

    Method and structure for controlling surface properties of dielectric layers in a thin film component for improved trimming

    公开(公告)号:US20050186751A1

    公开(公告)日:2005-08-25

    申请号:US10653777

    申请日:2003-09-02

    摘要: A method and structure for controlling the surface properties in the dielectric layers in a thin film component can be provided for improving the trimming process of thin film element. A metal fill is configured with a uniform fill pattern beneath an array of thin film resistors, and can comprise a plurality of smaller features or peaks providing a finer fill pattern that improves the control of the topology of the dielectric layers. The fill pattern can be configured in various manners, such as fill patterns parallel to the thin film resistor, fill patterns perpendicular to the thin film resistor, or fill patterns comprising a checkerboard-like configuration. The method and device for controlling the dielectric layers can also provide for a reduction in the interferences that can be caused by reflecting back of the focused energy by comprising a dispersion arrangement configured to provide dispersive grading of the laser energy below the thin film resistor and thus reduce the interaction of reflected energy with the incident laser beam. The method also improves the contrast of the laser alignment targets with respect to their background.

    Method for optically trimming electronic components
    10.
    发明申请
    Method for optically trimming electronic components 有权
    光学修整电子部件的方法

    公开(公告)号:US20040214452A1

    公开(公告)日:2004-10-28

    申请号:US10846210

    申请日:2004-05-14

    发明人: William Freeman

    IPC分类号: H01L021/26 H01L021/324

    摘要: Methods for adjusting the bulk material properties of manufactured components, such as resistors, thermistors, varistors, capacitors, resonators, oscillators, and optical components. Adjustment of the resistance of a resistor can be achieved by directing a high energy beam, such as an ultraviolet beam, onto a resistor formed from a matrix component and an embedded conductive component. The high energy beam adjusts the resistivity of the resistor material substantially without ablating the matrix component by affecting the matrix component, the conductive component, or both. Because of the lack of ablation, the material having a property to be adjusted can be a sub-layer in a laminated structure, with the high energy beam being directed through other layers formed thereon

    摘要翻译: 用于调节制造部件的体材料性质的方法,例如电阻器,热敏电阻器,变阻器,电容器,谐振器,振荡器和光学部件。 可以通过将诸如紫外光束的高能束引导到由矩阵元件和嵌入的导电元件形成的电阻上来实现电阻器的电阻的调节。 高能束通过影响基体组分,导电组分或两者而基本上不调节基质组分,从而调节电阻材料的电阻率。 由于缺乏消融,具有待调整性质的材料可以是层压结构中的子层,其中高能束被引导通过其上形成的其它层