公开(公告)号：US20030025087A1

公开(公告)日：2003-02-06

申请号：US10210242

申请日：2002-08-01

Applicant: Aspex, LLC

Inventor： Frederick Schamber ,  Cornelis Van Beek ,  Nicholas Ritchie

IPC: G01N023/225 ,  H01J037/22

CPC classification number: H01J37/226 ,  G01N23/2251 ,  H01J37/28 ,  H01J2237/2826 ,  Y10S977/86 ,  Y10S977/869 ,  Y10S977/881

Abstract: An instrument system is controlled to acquire an optical image of an object, with the optical image defining a first coordinate system The object is positioned in a second coordinate system and a point in the optical image is selected. The object is repositioned so that a point on the object corresponding to the selected point in the optical image is positioned at a predetermined point in the second coordinate system. Alternatively, movement of the object causes an indicia on the optical image to move to a point thereon corresponding to the point on the object that is positioned at the predetermined point in the second coordinate system.

Abstract translation: 控制仪器系统以获取物体的光学图像，其中光学图像限定第一坐标系。物体位于第二坐标系中，并且选择光学图像中的点。 对象被重新定位，使得对应于光学图像中的所选点的对象上的点位于第二坐标系中的预定点。 或者，物体的运动使得光学图像上的标记移动到与位于第二坐标系中的预定点处的物体上的点相对应的点上。

公开(公告)号：US20040113075A1

公开(公告)日：2004-06-17

申请号：US10678956

申请日：2003-10-03

Applicant: JEOL LTD.

Inventor： Mikio Naruse

IPC: H01J037/22 ,  H01J037/26

CPC classification number: H01J37/244 ,  H01J37/222 ,  H01J37/224 ,  H01J37/26 ,  H01J2237/221 ,  H01J2237/2446

Abstract: A transmission electron microscope capable of obtaining a high-resolution, wide field-of-view TEM image corresponding to the spatial resolution of the existing transmission electron microscope is accomplished using CCD TV cameras. The microscope includes four CCD cameras, for example, having their fiber tubes tilted. The first fiber tube is tilted from a point A toward a point B. The second fiber tube is tilted from the point A toward a point E. The third fiber tube is tilted from the point A toward a point D. The fourth fiber tube is tilted from the point A toward a point C. CCD mounts are prevented from interfering with each other by tilting the fiber tubes in this way.

Abstract translation: 能够获得与现有透射电子显微镜的空间分辨率相对应的高分辨率，宽视野TEM图像的透射电子显微镜是使用CCD电视摄像机实现的。 显微镜包括四个CCD摄像机，例如，其光纤管倾斜。 第一纤维管从点A向点B倾斜。第二纤维管从点A向点E倾斜。第三纤维管从点A向点D倾斜。第四纤维管是 从点A向点C倾斜。通过以这种方式倾斜光纤管，防止CCD安装座相互干扰。

公开(公告)号：US20020186869A1

公开(公告)日：2002-12-12

申请号：US10150098

申请日：2002-05-20

Applicant: FUJI PHOTO FILM CO., LTD.

Inventor： Keiko Neriishi

IPC: A61B006/00 ,  C12Q001/68 ,  G01N033/00 ,  G06K009/00 ,  H01J037/22

CPC classification number: C12Q1/6837 ,  Y10T436/143333

Abstract: A composite material sheet which is composed of partitions two-dimensionally extending on a sheet plane to form on the sheet plane plural fine sections surrounded by the partitions and porous material portions each of which is placed in the fine section, or a simple porous sheet is employed for autoradiographic analysis of substances originating from living body or its analogues in combination with a stimulable phosphor sheet which is composed of a support and fine stimulable phosphor layers distributed on the support in such manner that each stimulable phosphor layer takes a position corresponding to each fine section of the composite material sheet or a position of the porous sheet in which probe molecules are spotted.

Abstract translation: 一种复合材料片，其由在片材平面上二维延伸以在片状平面上形成的多个细分部分和被分隔成多个细孔部分的多孔材料部分或简单多孔片材组成的细小部分组成， 用于从活体或其类似物衍生的物质的放射自显影分析与可刺激的荧光粉片组合，该可刺激的荧光粉片由支撑体和分布在支持体上的细小的可激发的荧光体层组成，使得每个可激发的荧光体层采取对应于每个细微的位置 复合材料片的截面或其中探针分子被发现的多孔片的位置。

公开(公告)号：US20010008272A1

公开(公告)日：2001-07-19

申请号：US09681096

申请日：2001-01-04

Inventor： Klaus Rinn

IPC: G01N013/20 ,  H01J037/22

CPC classification number: G01B11/02 ,  G01B15/00 ,  G01B21/02 ,  G01Q30/025 ,  Y10S977/869

Abstract: A measuring instrument (100) and a method for measuring features (19) on a substrate (9) are described. The measuring instrument (100) has a support element (15) that is provided opposite the substrate (9). Mounted on the support element (15) is a nonoptical measurement device (23) with which a measurement of the features (19) of the substrate (9) is performed under ambient air pressure. The nonoptical measurement device (23) can be configured, for example, as an AFM (24) or an electron beam lens (40). Furthermore, in addition to the nonoptical measurement device (23), an optical lens (10) can be provided that is used for rapid location and determination of the coarse position of features (19) on the substrate (9).

Abstract translation: 描述了测量仪器（100）和用于测量衬底（9）上的特征（19）的方法。 测量仪器（100）具有与基板（9）相对设置的支撑元件（15）。 安装在支撑元件（15）上的是非光学测量装置（23），在环境空气压力下进行基板（9）的特征（19）的测量。 非光学测量装置（23）可以被配置为例如AFM（24）或电子束透镜（40）。 此外，除了非光学测量装置（23）之外，可以提供用于快速定位和确定基板（9）上的特征（19）的粗略位置的光学透镜（10）。