Abstract:
Provided is a pixel array having a wide dynamic range, good color reproduction, and good resolution and an image sensor using the pixel array. The pixel array includes a plurality of first type photodiodes, a plurality of second type photodiodes, and a plurality of image signal conversion circuits. A plurality of the second type photodiodes are disposed between the first type photodiodes which are two-dimensionally arrayed. A plurality of the image signal conversion circuits are disposed between the first type photodiodes and the second type photodiodes to process image signals detected by the first type photodiodes and the second type photodiodes. An area of the first type photodiodes is wider than an area of the second type photodiodes.
Abstract:
The present invention relates to a photodiode, more particularly to a photodiode having a luminescence converter converting a short-wavelength incident light to a long-wavelength emitting light. The photodiode having a luminescence converter according to the present invention has a characteristic that the sensitivity of photodiode is uniform irrespective of a wavelength of an incident light, by converting a specific-wavelength incident light to a restricted-wavelength emitting light and allowing the converted light to be incident to a photodiode region.
Abstract:
Provided is a semitransparent crystalline silicon thin film solar cell using a crystalline silicon thin film, including a transparent substrate, an antireflection layer, first transparent electrodes, electricity generation regions, second transparent electrodes, insulating layers. The electricity generation regions include crystalline silicon thin films. Accordingly, the semitransparent crystalline silicon thin film solar cell has a simpler manufacturing process as compared with a semitransparent thin film solar cell using a conventional amorphous thin film and can control transmittance by controlling a thickness of the crystalline thin film without additional apparatuses.
Abstract:
Provided is a unit pixel which uses three transistors and a pixel array including the unit pixel. The unit pixel includes a photodiode, a charge passing unit, a reset controller, and a voltage converter. The pixel array has a structure in which a plurality of the unit pixels according to the present invention are two-dimensionally arrayed, and includes one or more reset power supply circuits which output two or more different supply voltages in response to a pixel selection control signal. Parts of a plurality of the unit pixels share a voltage output from the reset power supply circuit.
Abstract:
An image sensor using a back-illuminated photodiode and a manufacturing method thereof are provided. According to the present invention, since a surface of the back-illuminated photodiode can be stably treated, the back-illuminated photodiode can be formed to have a low dark current, a constant sensitivity of blue light for all photodiodes, and high sensitivity. In addition, it is possible to manufacture an image sensor with high density by employing a three dimensional structure in which a photodiode and a logic circuit are separately formed on different substrates.
Abstract:
A separation type unit pixel of an image sensor, which can handle light that incidents onto a photodiode at various angles, and provides a zoom function in a mini camera module by securing an incident angle margin, and a manufacturing method thereof are provided. The separation type unit pixel having a 3D structure for an image sensor, composed of a plurality of transistors, includes: a first wafer which includes a photodiode, a transfer transistor, a node of a floating diffusion area functioning as static electricity for converting electric charge into a voltage, and a pad connecting the floating diffusion area and the transfer transistor to an external circuit, respectively; a second wafer which includes the rest of the circuit elements constituting a pixel (i.e., a reset transistor, a source-follower transistor, and a blocking switch transistor), a read-out circuit, a vertical/horizontal decoder, a correlated double sampling (CDS) circuit which involves in a sensor operation and an image quality, an analog circuit, an analog-digital converter (ADC), a digital circuit, and a pad connecting each pixel; and a connecting means which connects the pad of the first wafer and the pad of the second wafer. Accordingly, by forming an area for a photodiode and an area for a pixel almost the same, an image sensor can be manufactured to have a good sensitivity, without having to use a micro lens. In addition, by disposing the photodiode at the top layer, an incident angle margin of incident light can be secured, which has to be basically provided by the sensor for its auto focusing function or zoom function.
Abstract:
Provided is a method of manufacturing image sensor capable of maximizing light condensing efficiency so that the light input through a micro-lens is condensed onto a light receiving element. According to the present invention, inner micro-lenses or a U-shaped nitride film are used to maximize light condensing efficiency of the light input through the micro-lens. Therefore, light condensing efficiency of the light condensed onto the light receiving element in the image sensor can be improved.
Abstract:
A new structure of a photodiode of a pixel in CMOS image sensor and a method of fabricating the same are provided. The photodiode is fabricated by using one photo mask, so that the number of masks decreases and the fabrication processes are simplified. In addition, two conducting layers constituting a photodiode are self-aligned, so that a fabrication process for connecting the photodiode and a transfer transistor is not required. Accordingly, a problem of channeling generated in a lower portion of a gate of the transfer transistor can be solved, so that an improved pixel can be fabricated.
Abstract:
A method of manufacturing a pixel of an image sensor including a protruded photodiode capable of improving photosensitivity and reducing crosstalk between neighboring pixels and a pixel of an image sensor formed using the method are provided. The pixel of the semiconductor image sensor includes a protrudedly shaped photodiode on a surface of a semiconductor substrate. A surface area of the photodiode with respect to a surface area of the image sensor pixel increases to improve photosensitivity, and a microlens is not needed due to the improvement of the fill factor. In addition, the crosstalk of neighboring pixels can be removed.
Abstract:
A method of bonding aluminum (Al) electrodes formed on two semiconductor substrates at a low temperature that does not affect circuits formed on the two semiconductor substrates is provided. The method includes: (a) forming aluminum (Al) electrodes on the two semiconductor substrates, respectively, and depositing a metal alloy that comprises aluminum (Al) and copper (Cu) onto the aluminum (Al) electrodes; (b) arranging the aluminum (Al) electrodes of the two semiconductor substrates to face with each other; and (c) heating the aluminum (Al) electrodes at a temperature lower than the melting point of the deposited metal alloy, and applying a specific pressure onto the two semiconductor substrates. Accordingly, bonding can be carried out at a temperature lower than the melting point of an Al 0.83 Cu 0.17 alloy without having an effect on circuits formed on two semiconductor substrates, and can be selectively carried out at regions where pressure is applied.
Abstract translation:提供了一种在不影响形成在两个半导体衬底上的电路的低温下形成在两个半导体衬底上的铝(Al)电极的接合方法。 该方法包括:(a)分别在两个半导体衬底上形成铝(Al)电极,并将包含铝(Al)和铜(Cu)的金属合金沉积到铝(Al)电极上; (b)使两个半导体衬底的铝(Al)电极彼此面对; 和(c)在低于沉积的金属合金的熔点的温度下加热铝(Al)电极,并在两个半导体衬底上施加特定的压力。 因此,可以在低于Al 0.83 Cu 0.17合金的熔点的温度下进行接合,而不会对在两个半导体衬底上形成的电路产生影响,并且可以 在施加压力的区域选择性地进行。