LOW DECOMPOSITION STORAGE OF A TANTALUM PRECURSOR
    6.
    发明申请
    LOW DECOMPOSITION STORAGE OF A TANTALUM PRECURSOR 审中-公开
    TANTALUM PRECURSOR的低分解储存

    公开(公告)号:WO2009081380A3

    公开(公告)日:2009-12-23

    申请号:PCT/IB2008055495

    申请日:2008-12-22

    CPC classification number: C23C16/4404 C23C16/4481

    Abstract: Methods of storing a precursor which decreases the precursor decomposition rate. A vessel is provided, where the vessel has an outer surface made of a first material, and an inner surface made of a second material. The first and second materials are different. A tantalum containing precursor is placed inside the vessel, and the vessel is heated to a temperature between 600°C and 15O0°C. At least part of the precursor is withdrawn from the vessel.

    Abstract translation: 存储降低前体分解速率的前体的方法。 提供容器,其中容器具有由第一材料制成的外表面和由第二材料制成的内表面。 第一和第二种材料是不同的。 将含钽的前体放置在容器内,并将容器加热至600℃至150℃的温度。 至少部分前体从容器中取出。

    DEPOSITION OF TA- OR NB-DOPED HIGH-K FILMS
    9.
    发明申请
    DEPOSITION OF TA- OR NB-DOPED HIGH-K FILMS 审中-公开
    TA-或NB-DOPED高K膜的沉积

    公开(公告)号:WO2008122957A1

    公开(公告)日:2008-10-16

    申请号:PCT/IB2008/051326

    申请日:2008-04-08

    Abstract: Methods and compositions for depositing high-k films are disclosed herein. In general, the disclosed methods utilize precursor compounds comprising Ta or Nb. More specifically, the disclosed precursor compounds utilize certain ligands coupled to Ta and/or Nb such as 1-methoxy-2-methyl-2-propanolate (mmp) to increase volatility. Furthermore, methods of depositing Ta or Nb compounds are disclosed in conjunction with use of Hf and/or Zr precursors to deposit Ta-doped or Nb-doped Hf and/or Zr films. The methods and compositions may be used in CVD, ALD, or pulsed CVD deposition processes.

    Abstract translation: 本文公开了用于沉积高k膜的方法和组合物。 通常,所公开的方法使用包含Ta或Nb的前体化合物。 更具体地,所公开的前体化合物利用与Ta和/或Nb偶联的某些配体,例如1-甲氧基-2-甲基-2-丙醇酸(mmp)以增加挥发性。 此外,结合使用Hf和/或Zr前体来沉积Ta掺杂的或Nb掺杂的Hf和/或Zr膜来公开沉积Ta或Nb化合物的方法。 所述方法和组合物可用于CVD,ALD或脉冲CVD沉积工艺中。

    METHOD FOR THE DEPOSITION OF A RUTHENIUM CONTAINING FILM WITH ARYL AND DIENE CONTAINING COMPLEXES
    10.
    发明申请
    METHOD FOR THE DEPOSITION OF A RUTHENIUM CONTAINING FILM WITH ARYL AND DIENE CONTAINING COMPLEXES 审中-公开
    含有芳基和二烯含有复合物的包含薄荷膜的方法

    公开(公告)号:WO2008078296A1

    公开(公告)日:2008-07-03

    申请号:PCT/IB2007/055260

    申请日:2007-12-20

    CPC classification number: C07F15/0046

    Abstract: Novel ruthenium precursors having melting points no more than about 50°C are described herein. The disclosed ruthenium precursors may be liquids at 25°C, which enables their use without addition of a solvent and also eliminating a source of impurities. Pure ruthenium films or ruthenium containing films depending on the co-reactant used with the precursors may be obtained without detectable incubation time. Besides CVD, an ALD regime may be obtained for pure ruthenium deposition as well as for deposition of other ruthenium containing films (SrRuO 3 , RuO 2 for example).

    Abstract translation: 本文描述了熔点不超过约50℃的新型钌前体。 所公开的钌前体可以是在25℃下的液体,这使得它们可以在不加入溶剂的情况下使用,也可以消除杂质源。 取决于与前体一起使用的共反应物的纯钌膜或含钌膜可以在没有可检测的孵育时间的情况下获得。 除了CVD之外,可以获得纯钌沉积以及其它含钌膜(例如SrR 3 O 3,RuO 2 N 2)的沉积的ALD状态。

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