Abstract:
A method of suppressing distortion of a working laser beam (12') directed for incidence on a target specimen (14) presented for processing by a laser link processing system (100) uses a spatial filter (102) to remove stray light-induced distortion from the working laser beam.
Abstract:
A method and system for increasing throughput of laser micromachining systems use more than one laser. Two or more pulsed laser beams (56, 58) are combined and then separated into multiple laser beams (80, 82) that enable the system to work simultaneously at multiple locations on the workpiece (20) with pulse rates greater than those achievable with independently operating lasers while maintaining pulse energy equal to or greater than the pulse energy of each of the original independent laser beams. Most laser micromachining applications required multiple sequential pulses to process a workpiece. Increasing the pulse rate while maintaining pulse energy effects more rapid material removal and thereby increases throughput for a laser micromachining system.
Abstract:
A laser pulse with a specially tailored temporal power profile, instead of a conventional temporal shape or substantially square shape, severs an IC link. The specially tailored laser pulse preferably has either an overshoot at the beginning of the laser pulse or a spike peak within the duration of the laser pulse. The timing of the spike peak is preferably set ahead of the time when the link is mostly removed. A specially tailored laser pulse power profile allows the use of a wider laser pulse energy range and shorter laser wavelengths, such as the green and UV, to sever the links without appreciable damage to the substrate and passivation structure material located on either side of and underlying the links.
Abstract:
Methods and systems process electrically conductive links on or within a semiconductor substrate (740) using multiple laser beams. For example, a method utilizes N series of laser pulses to obtain a throughput benefit, wherein N ≥ 2. The links are arranged in a plurality of substantially parallel rows extending in a generally lengthwise direction. The N series of laser pulses propagate along N respective beam axes until incident upon selected links. The pattern of resulting laser spots may be on links in N distinct rows, on distinct links in the same row, or on the same link, either partially or completely overlapping. The resulting laser spots may be offset from one another in the lengthwise direction of the rows or offset from one another in a direction perpendicular to the lengthwise direction of the rows, or both.
Abstract:
A laser beam switching system (50) employs a laser (52) coupled to a beam switching device (58) that causes a laser beam to switch between first and second beam positioning heads such that while the first beam positioning head (60) is directing the laser beam to process a workpiece target location, the second beam positioning head (62) is moving to another target location and vice versa. A preferred beam switching device includes first and second AOMs. When RF is applied to the first AOM (72), the laser beam is diffracted toward the first beam positioning head, and when RF is applied to the second AOM (74), the laser beam is diffracted toward the second beam positioning head. A workpiece processing system (120) employs a common modular imaged optics assembly (122) and an optional variable beam expander (94) for optically processing multiple laser beams.
Abstract:
A system (700A, 700B, 800) determines relative positions of a semiconductor substrate (240) and a plurality of laser beam spots on or within the semiconductor substrate (240) in a machine for selectively irradiating structures on or within the substrate using a plurality of laser beams. The system (700A, 700B, 800) comprises a laser source (220, 720), first and second laser beam propagation paths, first and second reflection sensors (798, 853), and a processor (680). The laser source (220, 720) produces at least the first and second laser beams, which propagate toward the substrate along the first and second propagation paths, respectively, which have respective first and second axes that intersects the substrate at respective first and second spots. The reflection sensors (798, 853) are positioned to detect reflection of the spots, as the spots moves relative to the substrate, thereby generating reflection signals. The processor (680) is configured to determine, based on the reflection signals, positions of the spots on or within the substrate (240).
Abstract:
A method of and system for forming two laser processing beams with controlled stability at a target specimen work surface includes first and second mutually coherent laser beams (130, 140) propagating along separate first and second beam paths that are combined (170) to perform an optical property adjustment. The combined laser beams are separated (190) into third and fourth laser beams (192, 194) propagating along separate beam paths and including respective third and fourth main beam components (192l), and one of the third and fourth laser beams contributes a leakage component that copropagates in mutual temporal coherence with the main beam component (192m) of the other of the third and fourth laser beams. An effect of mutual temporal coherence of the leakage component and the other main beam component with which the leakage component copropagates is reduced through acousto-optic modulation (150, 160) frequency shifts or through incorporation of an optical path length difference (404, 504) in the two beams.
Abstract:
A specially shaped laser pulse energy profile (98, 104, 156) characterized by different laser wavelengths at different times of the profile provides reduced, controlled jitter to enable semiconductor device micromachining that achieves high quality processing and a smaller possible spot size.
Abstract:
Methods and systems process electrically conductive links on or within a semiconductor substrate (740) using multiple laser beams. For example, a method utilizes N series of laser pulses to obtain a throughput benefit, wherein N = 2. The links are arranged in a plurality of substantially parallel rows extending in a generally lengthwise direction. The N series of laser pulses propagate along N respective beam axes until incident upon selected links. The pattern of resulting laser spots may be on links in N distinct rows, on distinct links in the same row, or on the same link, either partially or completely overlapping. The resulting laser spots may be offset from one another in the lengthwise direction of the rows or offset from one another in a direction perpendicular to the lengthwise direction of the rows, or both.
Abstract:
A method and system for increasing throughput of laser micromachining systems use more than one laser. Two or more pulsed laser beams (56, 58) are combined and then separated into multiple laser beams (80, 82) that enable the system to work simultaneously at multiple locations on the workpiece (20) with pulse rates greater than those achievable with independently operating lasers while maintaining pulse energy equal to or greater than the pulse energy of each of the original independent laser beams. Most laser micromachining applications required multiple sequential pulses to process a workpiece. Increasing the pulse rate while maintaining pulse energy effects more rapid material removal and thereby increases throughput for a laser micromachining system.