Abstract:
Reducing signal dependence for a reference voltage of a CDAC includes: splitting a decoupling capacitor into a plurality of capacitors smaller in size than a size of the decoupling capacitor; isolating at least one of the plurality of capacitors from a sampling buffer coupled to the reference voltage during a conversion phase; and supplying an appropriate amount of charge needed to replenish charge drawn by capacitors in the CDAC at each conversion step using a charge pump to pump in a dummy charge to the CDAC so that resulting configurations of the CDAC draw substantially similar amount of charge for each code change of the each conversion step.
Abstract:
An example apparatus is disclosed for alias rejection through charge sharing. The apparatus includes a filter-sampling network, a digital-to-analog converter, and a charge-sharing switch. The filter-sampling network includes a capacitor and a first switch, which is coupled between an input node and the capacitor. The filter-sampling network is configured to connect or disconnect the capacitor to or from the input node via the first switch. The digital-to-analog converter includes a capacitor array and a second switch, which is coupled between the input node and the capacitor array. The capacitor array is coupled between the second switch and a charge-sharing node. The digital-to-analog converter is configured to connect or disconnect the capacitor array to or from the input node via the second switch. The charge-sharing switch is coupled between the charge-sharing node and the capacitor and is configured to connect or disconnect the capacitor to or from the digital-to-analog converter.
Abstract:
Certain aspects provide a circuit for analog-to-digital conversion. The circuit generally includes a flash analog-to-digital converter (ADC) having a plurality of comparators, each comparator being configured to compare an input voltage to a reference voltage; and a calibration circuit coupled to the flash ADC and configured to tune the reference voltage prior to a conversion operation by the flash ADC.
Abstract:
Certain aspects of the present disclosure provide various sampling networks for switched-capacitor integrators, which may be used in switched-capacitor analog-to-digital converters (ADCs). Rather than having both an input sampling capacitor and a reference sampling capacitor, certain aspects of the present disclosure use a shared sampling capacitor for the reference voltage and the input voltage, thereby reducing ADC input-referred noise, decreasing op amp area and power, and avoiding anti-aliasing filter insertion loss. Furthermore, by sampling the reference voltage during the sampling phase and sampling the input voltage during the integration phase using the shared sampling capacitor, a high-bandwidth reference buffer need not be used for the reference voltage.
Abstract:
An apparatus is disclosed for gain stabilization. In an example aspect, the apparatus includes an amplifier and a gain-stabilization circuit. The amplifier has a gain that is based on a bias voltage and an amplification control signal. The gain-stabilization circuit is coupled to the amplifier and includes a replica amplifier. The replica amplifier has a replica gain that is based on the bias voltage and the amplification control signal. The gain-stabilization circuit is configured to adjust at least one of the bias voltage or the amplification control signal based on a gain error associated with the replica amplifier.
Abstract:
A receiver may include a time-interleaved charge sampler comprising a charge sampler switch in series with a charge sampler capacitor. The receiver may also include a current buffer configured to drive the time-interleaved charge sampler.
Abstract:
An apparatus for generating a substantially constant DC reference voltage. The apparatus includes a reference voltage generator configured to generate a substantially constant direct current (DC) reference voltage based on a voltage on a data signal transmission line, wherein the voltage is based on a bandgap reference voltage. In one implementation, the data signal transmission line is a differential signal transmission line and the voltage is a common mode voltage. In another implementation, the data signal transmission line is an I-data signal transmission line and a Q-data signal transmission line, and the voltage is an average or weighted-average of the common mode voltages of the I- and Q-differential signals. In another implementation, the reference voltage is based on a single-ended (e.g., positive- and/or negative)-component or vice-versa of Iand Q-data signals, respectively.
Abstract:
Certain aspects of the present disclosure provide multi-channel receiver circuits implemented with time-multiplexed successive approximation register (SAR) analog-to-digital converter (ADC) circuits and methods for operating such receiver circuits. One example receiver circuit generally includes a first multiplexer having a plurality of inputs coupled to a plurality of in-phase (I) receive paths associated with different channels of the receiver circuit, a first SAR ADC circuit having an input coupled to an output of the first multiplexer, a second multiplexer having a plurality of inputs coupled to a plurality of quadrature (Q) receive paths associated with the different channels of the receiver circuit, and a second SAR ADC circuit having an input coupled to an output of the second multiplexer.
Abstract:
Certain aspects of the present disclosure provide methods and apparatus for implementing sampling rate scaling of an excess loop delay (ELD)-compensated continuous-time delta-sigma modulator (CTDSM) analog-to-digital converter (ADC). One example ADC generally includes a loop filter; a quantizer having an input coupled to an output of the loop filter; one or more digital-to-analog converters (DACs), each having an input coupled to an output of the quantizer, an output coupled to an input of the loop filter, and a data latch comprising a clock input for the DAC coupled to a clock input for the ADC; and a clock delay circuit having an input coupled to the clock input for the ADC and an output coupled to a clock input for the quantizer.
Abstract:
An analog-to-digital converter includes: a first input terminal to receive a first input signal; a second input terminal to receive a second input signal; a noise shaping module configured to compare the first input signal to the second input signal received, and to output a digital output signal and a residue signal in a first phase of a noise shaping operation; and a storage module configured to store the residue signal during the first phase of the noise shaping operation, the storage module configured to receive an analog input signal and remove the residue signal from the analog input signal in a second phase of the noise shaping operation to output a new first input signal to the noise shaping module.