Abstract:
A CMOS D-type flip flop (D-FF) exhibits reduced power consumption by selectively disabling certain charging/discharging operations at specific circuit elements to minimize the capacitance of the circuit's internal nodes using a partial signaling technique. A clock inverter module may be used to provide a partial inverse clock signal that is the complement of a clock signal when a non-clock dependent input to the clock inverter module has a first value and to provide a fixed signal when the non-clock dependent signal has a second value. One or more MOSFETs controlled by the partial inverse clock signal do not charge or discharge when the non-clock dependent signal has the second value.
Abstract:
A multi-threshold flip-flop (100a) includes a master latch (110), a slave latch (120), and at least one control switch. The master latch is composed of an input buffer (210) formed with low threshold (LVT) transistors and a first latch circuit (220) formed with LVT transistors. The slave latch (120) is composed of a second latch circuit (240) formed with high threshold (HVT) transistors and an output driver (260) formed with LVT transistors. The at least one control switch enables or disables the LVT transistors and is implemented with at least one HVT transistor. The LVT and HVT transistors may be N-FETs and/or P-FETs. The multi-threshold flip-flop can operate at high speed, has low leakage current, and can save the logic state when disabled.
Abstract:
A circuit includes a pulsed-latch circuit. The pulsed-latch circuit includes a first plurality of transistors. One or more of the first plurality of transistors is length-of-diffusion (LOD) protected.
Abstract:
Phase-coherent differential structures contain a phase-coherent transformer having two pairs of phase-coherent coupled differential inductors.
Abstract:
A printhead circuit for driving at least two actuating elements has a trim generating circuit (10) for generating a trim signal using a comparator (40, 41 ) coupled to receive and compare feedback indicative of a present level of a drive voltage, with a configurable reference voltage value. The trim being based on a drive voltage feedback can give a more direct indication of actuating element output than given by timing references. Hence the trim can be more accurate, can be simpler, without accurate digital timing references, and thus costs can be reduced. It can be combined with a cold switch arrangement.
Abstract:
A system and method to perform scan testing using a pulse latch with a blocking gate is disclosed. In a particular embodiment, a scan latch includes a pulse latch operable to receive data while a pulse clock signal has a first logical clock value and a blocking gate coupled to an output of the pulse latch. The blocking gate is operable to propagate the data from the output of the pulse latch while the pulse clock signal has a second logical clock value.
Abstract:
An object is to provide a low-power semiconductor device which does not require a latch circuit to hold data at the output of inverter circuits. In the semiconductor device, an input of a first inverter circuit is connected to an input terminal through a source and a drain of a first transistor. An input of a second inverter circuit is connected to an output of the first inverter circuit through a source and a drain of a second transistor. An output of the second inverter is connected to an output terminal. An inverted clock signal and a clock signal are input to gates of the first transistor and the second transistor, respectively. The first and the second transistor have extremely low off-current, which allows the output potential of the device to remain unchanged even when the input varies.