Abstract:
Wafers, chips, or dies that contain fill cells with structures configured to obtain in-line data via non-contact electrical measurements ("NCEM"). Such NCEM-enabled fill cells may target/expose a variety of open-circuit, short-circuit, leakage, or excessive resistance failure modes. Such wafers, chips, or dies may include Designs of Experiments ("DOEs"), comprised of multiple NCEM-enabled fill cells, in at least two variants, all targeted to the same failure mode(s).
Abstract:
An integrated circuit which enables lower cost yet provides superior performance compared to standard silicon integrated circuits by utilizing thin film transistors (TFTs) fabricated in BEOL. Improved memory circuits are enabled by utilizing TFTs to improve density and access in a three dimensional circuit design which minimizes die area. Improved I/O is enabled by eliminating the area on the surface of the semiconductor dedicated to I/O and allowing many times the number of I/O available. Improved speed and lower power are also enabled by the shortened metal routing lines and reducing leakage.
Abstract:
An exemplary interconnect circuit (200) for a programmable integrated circuit (IC) (100) includes an input terminal (218-1 ) coupled to receive from a node (204) in the programmable IC, an output terminal (220) coupled to transmit towards another node (208) in the programmable IC, first and second control terminals (222-1, 222-2) coupled to receive from a memory cell (212) of the programmable IC, and a complementary metal oxide semiconductor (CMOS) pass-gate (202-1 ) coupled between the input terminal and the output terminal and to the first and second control terminals. The CMOS pass-gate includes a P-channel transistor (Q2) configured with a low threshold voltage for a CMOS process used to fabricate the programmable IC. (Fig. 2).
Abstract:
A method of manufacturing a transistor comprising: providing a substrate, a region of semiconductive material supported by the substrate, and a region of electrically conductive material supported by the region of semiconductive material;forming at least one layer of resist material over said regions to form a covering of resist material over said regions; forming a depression in a surface of the covering of resist material, said depression extending over a first portion of said region of conductive material, said first portion separating a second portion of the conductive region from a third portion of the conductive region;removing resist material located under said depression so as to form a window, through said covering, exposing said first portion of the electrically conductive region;removing said first portion to expose a connecting portion of the region of semiconductive material, said connecting portion connecting the second portion to the third portion of the conductive region;forming a layer of dielectric material over the exposed portion of the region of semiconductive material; and depositing electrically conductive material to form a layer of electrically conductive material over said layer of dielectric material, the layer of dielectric material electrically isolating the layer of electrically conductive material from the second and third portions of the conductive region.
Abstract:
A method for programming and erasing an array of NMOS electrically erasable programmable read only memory (EEPROM) cells that minimizes bit disturbances and high voltage requirements for the memory array cells and supporting circuits. In addition, the array of N-channel memory cells may be separated into independently programmable memory segments by creating multiple, electrically isolated P-wells upon which the memory segments are fabricated. The multiple, electrically isolated P-wells may be created, for example, by p-n junction isolation or dielectric isolation.
Abstract:
The present invention provides for modularized circuits (500) and methods of manufacturing both modularized circuits ("master modules") (520, 522, 524, 526) and compound Ics (504). These master modules are designed to minimize waste and to evenly distribute power throughout its structure. Also, a number of master modules (520, 522, 524, 526) and a compound IC (504) composed of a group of these master modules are structured to minimize the effects of mechanically-induced stresses. In one embodiment, a substrate includes master modules (520, 522, 524, 526) distributed over a surface of the substrate, wherein each master module includes, for example, one or more logic circuits, a memory, an input interface and an output interface.
Abstract:
Structures and methods for in service programmable logic arrays with ultra thin vertical body transistors are provided. The in-service programmable logic array includes a first logic plane that receives a number of input signals. The first logic plane has a plurality of logic cells arranged in rows and columns that are interconnected to provide a number of logical outputs. A second logic plane has a number of logic cells arranged in rows and columns that receive the outputs of the first logic plane and that are interconnected to produce a number of logical outputs such that the in service programmable logic array implements a logical function. Each of the logic cells includes a vertical pillar extending outwardly from a semiconductor substrate. Each pillar includes a single crystalline first contact layer and a second contact layer separated by an oxide layer. At least one single crystalline ultra thin vertical floating gate transistor that is disposed adjacent each vertical pillar. The single crystalline vertical floating gate transistor includes an ultra thin single crystalline vertical first source/drain region coupled to the first contact layer, an ultra thin single crystalline vertical second source/drain region coupled to the second contact layer, and an ultra thin single crystalline vertical body region which opposes the oxide layer and couples the first and the second source/drain regions. A vertical floating gate opposes the ultra thin single crystalline vertical body region.
Abstract:
A method of arranging and wiring a master-slice system semiconductor integrated circuit which uses an automatic arranging/wiring device to arrange and wire first and second power source wirings (170, 171) crossing a plurality of basic cells (110) with respect to a master-slice (100) in which a plurality of basic cells (110) are arranged in a matrix form and a plurality of signal wirings for connecting the interiors of longitudinally arranged basic cells (110) and/or a plurality of basic cells (110) together, the method comprising a first step of registering the definitions of effective pin positions A1 to A14, B2 to B13, C1 to C14 in the automatic arranging/wiring device, a second step of registering a net list in the automatic arranging/wiring device and a third step of determining a pin arrangement and a wiring route according to the definitions of effective pin positions and net list information, wherein the registered effective pin positions exist on a lattice grid (120) and in and around areas between the first and second power source wirings (170, 171). Circuits wired based on this definition contact drains in and around the areas between the first and second power source wirings (170, 171) thus eliminating the possibility of signal wirings passing over the power source wirings.
Abstract:
According to the invention at least part of a CMOS circuit is decoupled from the bulk of the substrate by positioning this at least part of the CMOS circuit on a secondary substrate (2) with considerably less bulk than the original substrate (1) and by decoupling the secondary substrate (2) at least partly from the substrate (1). This is realised by a combination of multi-well technology and etching with electro-chemical etch stop either from the back or from the front of the wafer (e.g. anisotropic etching). A multi-well is a region consisting of a well diffusion (p- or n-doped) (2) which at least partially contains at least one further well diffusion (3), whereby the deepest well (2) or another well of the multi-well structure is designed to function as a secondary substrate.