中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

1876 records (took 0.021 seconds)

    SPECTROMETER FOR MEASURING MOVING SAMPLE MATERIAL AND THE METHOD
    151.
    发明公开
    SPECTROMETER FOR MEASURING MOVING SAMPLE MATERIAL AND THE METHOD 有权
    光谱仪进行移动的样品材料与方法测量

    公开(公告)号：EP2188604A1

    公开(公告)日：2010-05-26

    申请号：EP08787757.7

    申请日：2008-09-03

    Applicant: Valtion Teknillinen Tutkimuskeskus ,  Honeywell Oy

    Inventor： MALINEN, Jouko ,  KATAJA, Kari ,  KIVI, Sini ,  VASAMA, Hannu ,  KUUSELA, Reijo

    IPC: G01J3/26 ,  G01J3/28 ,  G01N21/85 ,  G01N21/86

    CPC classification number: G01J3/26 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0232 ,  G01J3/0286 ,  G01J3/2803 ,  G01N21/31 ,  G01N21/85 ,  G01N21/86

    Abstract: An optical or infrared spectrometer is suitable for on-line measurements for industrial, agricultural, field, commercial and other applications. Optical spectrometers are very useful for various analytical measurements. On-line operation is needed for obtaining real-time information, which is useful e.g. for process automation and quality control needs. The invention is based on optical design optimized for measuring moving samples at a distance and includes a light guide for signal homogenization, a linear variable filter for defining multiple measurement wavelengths as well as a linear detector array for detecting optical signals relating to the different wavelengths. There is an element for cooling and stabilizing the operating temperature of both the linear detector array and the linear variable filter, while the spectrometer is operating in variable environmental conditions. Thanks to the optical signal chain designed to maximize the radiance at the detector, the proposed spectrometer can provide high signal-to-noise ratio and high speed.

    SPECTROSCOPE
    153.
    发明公开
    SPECTROSCOPE 有权
    SPEKTROSKOP

    公开(公告)号：EP2175251A1

    公开(公告)日：2010-04-14

    申请号：EP08791860.3

    申请日：2008-07-30

    Applicant: Nippon Telegraph and Telephone Corporation

    Inventor： NAKAMURA, Koichiro ,  SASAKI, Yuzo ,  FUJIURA, Kazuo ,  YAGI, Shogo

    IPC: G01J3/06

    CPC classification number: G01J3/14 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0237 ,  G01J3/06 ,  G01J3/18 ,  G01J3/36 ,  G01J2003/064

    Abstract: The present invention provides a small spectroscope that has a short response time. A spectroscope according to one embodiment of the present invention includes: a beam deflector that includes an electro-optic crystal, having an electro-optic effect, and paired electrodes used to apply an electric field inside the electro-optic crystal; spectroscopic means for dispersing light output by the beam deflector; and wavelength selection means for selecting light having an arbitrary wavelength from the light dispersed and output by the spectroscopic means.

    Abstract translation: 本发明提供一种响应时间短的小型光谱仪。 根据本发明的一个实施例的分光镜包括：光束偏转器，其包括具有电光效应的电光晶体，以及用于在电光晶体内部施加电场的成对电极; 用于分散由光束偏转器输出的光的分光装置; 以及用于从由分光装置分散和输出的光中选择具有任意波长的光的波长选择装置。

    Farblängsfehler verringerndes Optiksystem
    155.
    发明公开
    Farblängsfehler verringerndes Optiksystem 有权
    纵向色差-缩小光学系统

    公开(公告)号：EP1892551A3

    公开(公告)日：2010-02-03

    申请号：EP07022891.1

    申请日：2005-09-06

    Applicant: Carl-Zeiss Jena GmbH

    Inventor： Winterot, Johannes

    IPC: G02B17/08 ,  G02B27/30

    CPC classification number: G02B17/0884 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0243 ,  G02B17/08 ,  G02B17/0852 ,  G02B17/0856 ,  G02B21/002 ,  G02B21/082 ,  G02B27/30

    Abstract: Es wird bereitgestellt ein Optiksystem, insbesondere Mikroskop, mit einer Optikeinheit (17) und einem Kollimator (1), der in einem Strahlengang des Optiksystems der Optikeinheit (17) vor- oder nachgeordnet ist, wobei die Optikeinheit (17) einem dem Strahlengang zugeführten Strahlenbündel einen vorbestimmten Farblängsfehter einprägt und das Strahlenbündel auf den Kollimator (1) als divergierendes oder paralleles Strahlenbündel trifft und von diesem in ein paralleles oder konvergierendes Strahlenbündel umgewandelt wird, wobei der Kollimator (1) zumindest eine Linse (L) sowie einen gekrümmten Spiegel (4) aufweist, der den Strahlengang so faltet, daß das zugeführte Strahlenbündel die Linse (4) zweimal durchläuft.

    Slab waveguide spatial heterodyne spectrometer assembly
    156.
    发明公开
    Slab waveguide spatial heterodyne spectrometer assembly 有权
    平板波导空间外差谱仪组件

    公开(公告)号：EP2136191A1

    公开(公告)日：2009-12-23

    申请号：EP09250995.9

    申请日：2009-03-31

    Applicant: Com Dev International Limited

    Inventor： Scott, Alan Douglas

    IPC: G01J3/45 ,  G01J3/02

    CPC classification number: G01J3/4532 ,  G01J3/02 ,  G01J3/024 ,  G01J3/0259 ,  G01J3/0289 ,  G01J3/0294 ,  G01J3/1895 ,  G01J3/4531 ,  G02B6/29352 ,  G02B6/29358 ,  G02B6/29389 ,  G02B6/30 ,  G02B2006/12119 ,  G02B2006/12159

    Abstract: An optical broadband micro-spectrometer containing an input optical assembly, a group of slab waveguide spatial heterodyne spectrometer (SHS) integrated circuits (ICs), a detection module and a processor for multi-line detection. The input optical assembly applies an input light signal uniformly with respect to brightness and frequency to the apertures of the waveguides and may project a pupil image onto the SHS input face and may be a scanner. Each slab waveguide spatial heterodyne spectrometer (SHS) integrated circuit (IC) contains at least one slab waveguide SHS IC. The detection module bonds directly to the slab waveguide output apertures. Each slab waveguide SHS IC may contain one or more slab waveguide SHS.

    Abstract translation: 一种光学宽带微谱仪，包含一个输入光学组件，一组平板波导空间外差谱仪（SHS）集成电路（IC），一个检测模块和一个用于多线检测的处理器。 输入光学组件将关于亮度和频率的输入光信号均匀地施加到波导的孔，并且可以将瞳孔图像投影到SHS输入面上并且可以是扫描仪。 每个平板波导空间外差光谱仪（SHS）集成电路（IC）包含至少一个平板波导SHS IC。 检测模块直接连接到平板波导输出孔。 每个平板波导SHS IC可以包含一个或多个平板波导SHS。

    SPECTROGRAPHE A FENTE INCLINEE
    157.
    发明公开
    SPECTROGRAPHE A FENTE INCLINEE 有权
    光谱仪斜槽

    公开(公告)号：EP2126527A1

    公开(公告)日：2009-12-02

    申请号：EP08762169.4

    申请日：2008-02-27

    Applicant: Horiba Jobin Yvon S.A.S.

    Inventor： THEVENON, Alain ,  MILLET, Viviane ,  CORDE, Pierre-André

    IPC: G01J3/02 ,  G01J3/04 ,  G01J3/28

    CPC classification number: G01J3/02 ,  G01J3/0237 ,  G01J3/04 ,  G01J3/2803

    Abstract: The invention relates to an inclined-slit spectrograph comprising a light source (1), an inlet slit (3), a grating (4) and a detector (7) including a window through which the light beam diffracted by the grating (4) is transmitted, in which part of the diffracted light beam generates reflections on the window or between the window and the sensitive surface of the detector (7). According to the invention, the inclined slit spectrograph includes a compensation means that can compensate for spectral resolution losses generated by the inclination means, said compensation means including the inlet slit (3, 9) which takes the form of a rectangular inclined inlet slit (9).

    LED-Linienbeleuchtung
    158.
    发明公开
    LED-Linienbeleuchtung 有权

    公开(公告)号：EP2112533A1

    公开(公告)日：2009-10-28

    申请号：EP09158599.2

    申请日：2009-04-23

    Applicant: Chromasens GmbH

    Inventor： Frei, Bernhard

    IPC: G02B6/00 ,  G01J1/42

    CPC classification number: G02B6/0005 ,  G01J1/32 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/10 ,  G01J3/50 ,  G01J3/505

    Abstract: Die Erfindung betrifft eine LED-Linienbeleuchtung, umfassend:
    - in einer Reihe angeordnete Leuchtdioden zum zeilenweisen Beleuchten eines Gegenstandes,
    - eine Lichtleitfaser, die im Bereich des von den Leuchtdioden ausgestrahlten Lichtes angeordnet ist, so dass ein Teil dieses Lichtes in die Lichtleitfaser eingekoppelt wird,
    - einen optischen Detektor zum Detektieren der Helligkeit und/oder der Farbe des in die Lichtleitfaser eingekoppelten Lichtes, wobei der optische Detektor mit der Steuereinrichtung verbunden sein kann, so dass die Steuereinrichtung in Abhängigkeit der detektierten Helligkeit die Leuchtdioden und/oder Farbe eine Kamera ansteuert.

    Abstract translation: 灯具有排列成一行的LED（2），用于对象即身体的逐行点亮。 光纤（13） 配置在由LED发出的光的区域中，使得一部分光被横向耦合到光纤中。 光检测器（14），即多通道彩色传感器，检测耦合到光纤中的光的亮度和/或颜色。 光纤包括在周边表面的粗糙表面。 光纤的端部设置有反射镜（16）。 光纤包括盖（17）。 独立权利要求还包括以下内容：（1）光学监视装置，包括照相机（2）用于监视光源的光束锥体的方法，即LED线路光。

Patent Agency Ranking