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    SPECTROMETER, SPECTROMETRY, AND SPECTROMETRY PROGRAM
    181.
    发明授权
    SPECTROMETER, SPECTROMETRY, AND SPECTROMETRY PROGRAM 有权

    公开(公告)号：EP2381240B1

    公开(公告)日：2018-09-05

    申请号：EP09834584.6

    申请日：2009-09-08

    Applicant: Hamamatsu Photonics K.K.

    Inventor： WATANABE Motoyuki ,  IGUCHI Kazuya ,  SUZUKI Kengo

    IPC: G01N21/64 ,  G01J3/443 ,  G01J3/44 ,  G01J3/02

    CPC classification number: G01N21/645 ,  G01J3/02 ,  G01J3/0262 ,  G01J3/0267 ,  G01J3/0291 ,  G01J3/4406 ,  G01J3/443 ,  G01N2201/0632 ,  G01N2201/065

    Abstract: A spectroscopic measurement apparatus 1A comprises an integrating sphere 20 in which a sample S is located, a spectroscopic analyzer 30 dispersing the light to be measured from the sample S and obtaining a wavelength spectrum, and a data analyzer 50. The analyzer 50 includes an object range setting section which sets a first object range corresponding to excitation light and a second object range corresponding to light emission from the sample S in a wavelength spectrum, and a sample information analyzing section which determines a luminescence quantum yield of the sample S, determines a measurement value ¦ 0 of the luminescence quantum yield from results of a reference measurement and a sample measurement, and determines, by using factors ², ³ regarding stray light in the reference measurement, an analysis value ¦ of the luminescence quantum yield with the effect of stray light reduced by ¦ = ²¦ 0 +³. This realizes a spectroscopic measurement apparatus, a measurement method, and a measurement program which can reduce the effect of stray light generated in a spectrometer.

    GLOBAL SOLAR SPECTRUM DEVICES AND METHODS
    182.
    发明公开
    GLOBAL SOLAR SPECTRUM DEVICES AND METHODS 审中-公开

    公开(公告)号：EP3365643A1

    公开(公告)日：2018-08-29

    申请号：EP16856512.5

    申请日：2016-10-20

    Applicant: Spectrafy Inc.

    Inventor： BEAL, Richard ,  TATSIANKOU, Viktar

    IPC: G01J3/51 ,  G01N21/31

    CPC classification number: G01J3/36 ,  G01J1/0403 ,  G01J1/0411 ,  G01J1/0474 ,  G01J1/0492 ,  G01J1/06 ,  G01J3/0202 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0262 ,  G01J2001/061 ,  G01J2001/4266 ,  G01J2003/1213 ,  G01N21/31 ,  G01N21/538 ,  G01N2201/0616 ,  G01N2201/065

    Abstract: Solar spectral irradiance (SSI) measurements are important for solar collector/photovoltaic panel efficiency and solar energy resource assessment as well as being important for scientific meteorological/climate observations and material testing research. To date such measurements have exploited modified diffraction grating based scientific instruments which are bulky, expensive, and with low mechanical integrity for generalized deployment. A compact and cost-effective tool for accurately determining the global solar spectra as well as the global horizontal or tilted irradiances as part of on-site solar resource assessments and module performance characterization studies would be beneficial. An instrument with no moving parts for mechanical and environment stability in open field, non-controlled deployments could exploit software to resolve the global, direct and diffuse solar spectra from its measurements within the 280-4000 nm spectral range, in addition to major atmospheric processes, such as air mass, Rayleigh scattering, aerosol extinction, ozone and water vapour absorptions.

    OPTICAL INTERFEROMETER
    184.
    发明公开
    OPTICAL INTERFEROMETER 审中-公开
    光学干涉仪

    公开(公告)号：EP3321650A1

    公开(公告)日：2018-05-16

    申请号：EP15897747.0

    申请日：2015-07-10

    Applicant: Hamamatsu Photonics K.K.

    Inventor： WARASHINA, Yoshihisa ,  SUZUKI, Tomofumi ,  KASAMORI, Kohei ,  OKUMURA, Ryosuke ,  KOTANI, Kyosuke

    IPC: G01J3/45 ,  G01B9/02

    CPC classification number: G01B9/02049 ,  G01B9/02015 ,  G01B9/02027 ,  G01B9/02051 ,  G01J3/0205 ,  G01J3/021 ,  G01J3/0262 ,  G01J3/45 ,  G01J3/453 ,  G01J3/4535

    Abstract: An optical interferometer 1A includes a branching-combining unit 10, a first optical system 20, a second optical system 30, and a drive unit 40, which can be MEMS-based components. The branching-combining unit 10 includes a branching surface 11, an incident surface 12, an output surface 13, and a combining surface 14 on an interface between the interior and the exterior of a transparent member. The branching-combining unit 10, on the branching surface 11, partially reflects incident light L 0 and outputs as first branched light L 11 , and transmits the rest of the incident light into the interior as second branched light L 21 . The branching-combining unit 10, on the combining surface 14, outputs the first branched light L 12 to the outside, reflects the second branched light L 22 , and combines the light beams to be output to the outside as combined light L 3 . Thus, a MEMS-based optical interferometer capable of decreasing light loss from branching to combining and improving interference efficiency is realized.

    Abstract translation: 光干涉仪1A包括分支结合单元10，第一光学系统20，第二光学系统30和驱动单元40，其可以是基于MEMS的部件。 分支结合单元10包括在透明构件的内部和外部之间的界面上的分支表面11，入射表面12，输出表面13和结合表面14。 分支结合单元10在分支表面11上部分地反射入射光L0并作为第一分支光L11输出，并将其余的入射光透射到内部作为第二分支光L21。 分支合成单元10在合成面14上向外部输出第一分支光L12，反射第二分支光L22，并将要输出到外部的光束合成为合成光L3。 因此，实现了能够减少从分支到合并并提高干扰效率的光损耗的基于MEMS的光学干涉仪。

    LASER INDUCED BREAKDOWN SPECTROSCOPY SAMPLE CHAMBER
    185.
    发明公开
    LASER INDUCED BREAKDOWN SPECTROSCOPY SAMPLE CHAMBER 审中-公开
    激光诱导击穿光谱样品室

    公开(公告)号：EP3241015A2

    公开(公告)日：2017-11-08

    申请号：EP15816321.2

    申请日：2015-12-04

    Applicant: Thermo Scientific Portable Analytical Instruments Inc.

    Inventor： WANG, Peidong ,  LI, Haowen ,  SUN, Rong ,  BUSH, Michael

    IPC: G01N21/15 ,  G01N21/71

    CPC classification number: G01J3/443 ,  G01J3/0208 ,  G01J3/0262 ,  G01N21/15 ,  G01N21/718

    Abstract: Methods and apparatus for laser induced breakdown spectroscopy (LIBS) sample chamber. An apparatus includes a sample chamber, a laser source connected to an excitation optics assembly, the excitation optics assembly connected to a first port on the sample chamber, a collimator assembly connected to a spectrometer, the collimator assembly connected to a second port on the sample chamber, and a first lens tube positioned on the first port and a second lens tube positioned on the second port, the first lens tube protecting the first port connected to the excitation optics assembly and the second lens tube protecting the second port connected to the collimator assembly from particles emitted when a laser pulse from the laser source ablates a surface of a target sample and generates a plasma.

    ILLUMINATION DEVICE AND REFLECTION CHARACTERISTICS MEASUREMENT DEVICE
    186.
    发明公开
    ILLUMINATION DEVICE AND REFLECTION CHARACTERISTICS MEASUREMENT DEVICE 审中-公开
    照明装置和反射特性测量装置

    公开(公告)号：EP3232171A1

    公开(公告)日：2017-10-18

    申请号：EP15866940.8

    申请日：2015-12-03

    Applicant: Konica Minolta, Inc.

    Inventor： KAWASAKI Takashi ,  KAWANO Toshio

    IPC: G01J3/10 ,  G01N21/27

    CPC classification number: G01J3/10 ,  G01J3/021 ,  G01J3/0251 ,  G01J3/0262 ,  G01J3/0291 ,  G01J3/42 ,  G01J2003/425 ,  G01N21/27

    Abstract: It is object to suppress a fluctuation in an amount of light reflected from a to-be-illuminated surface having a directional property in reflectance characteristics and improve usage efficiency of a bundle of light beams emitted from a light source. In order to achieve the above object, an illumination device that illuminates a to-be-illuminated surface, includes: a surface light source being disposed on a normal line of the to-be-illuminated surface; and a reflection mechanism being provided between the surface light source and the to-be-illuminated surface so as to surround the normal line for reflecting a light emitted from the surface light source toward the to-be-illuminated surface, wherein in the reflection mechanism, a reflection region that reflects the light toward the to-be-illuminated surface and a non-reflection region that does not reflect the light toward the to-be-illuminated surface are alternately disposed along a virtual cylindrical surface surrounding the normal line in a circumferential direction of the virtual cylindrical surface, and three or more reflection regions and three or more non-reflection regions are thereby disposed, each of the three or more reflection regions is a region having a partially-cylindrical shape to follow the virtual cylindrical surface, and the three or more non-reflection regions are dispersedly disposed to surround the normal line in the circumferential direction.

    Abstract translation: 目的是抑制从反射特性具有方向性的被照射面反射的光量的变动，提高从光源射出的光束的使用效率。 为了实现上述目的，一种照明待照射表面的照明装置，包括：面光源，设置在所述待照射表面的法线上; 在所述面光源与所述被照射面之间设置反射机构，以包围所述法线，将从所述面光源射出的光朝向所述被照射面反射，在所述反射机构 将朝向被照射面反射光的反射区域和不朝向被照射面反射光的非反射区域沿着包围该法线的假想圆柱面交替配置， 由此配置三个以上的反射区域和三个以上的非反射区域，因此，三个以上的反射区域分别是与假想圆筒面接近的部分圆筒状的区域， 并且三个或更多个非反射区域被分散地设置以在周向上围绕法线。

    A SPECTROMETER MODULE
    188.
    发明公开
    A SPECTROMETER MODULE 审中-公开
    一个SPECTROMETER模块

    公开(公告)号：EP3184975A1

    公开(公告)日：2017-06-28

    申请号：EP15202374.3

    申请日：2015-12-23

    Applicant: IMEC VZW

    Inventor： BORREMANS, Jonathan ,  LAMBRECHTS, Andy ,  BARON, Jerome

    IPC: G01J3/02 ,  G01J3/28 ,  G01J3/12

    CPC classification number: G01J3/0264 ,  G01J3/0262 ,  G01J3/0291 ,  G01J3/12 ,  G01J3/28 ,  G01J3/2803 ,  G01J2003/1213 ,  G01J2003/2806 ,  G01J2003/2826 ,  G01J2003/2866

    Abstract: The present invention relates to a spectrometer module (10), comprising: a plurality of separate electronic circuit modules (20), each comprising an integrated sensor circuit including a light sensitive area (22) occupying part of an area of the integrated sensor circuit, the integrated sensor circuit being arranged to detect incident light, wherein the plurality of separate electronic circuit modules (20) include a group of adjacent electronic circuit modules (20) and the light sensitive areas (22) of the electronic circuit modules (20) are so arranged on the respective integrated sensor circuits that the group is mounted so that the light sensitive areas (22) thereof are arranged in vicinity to each other, and an optical module (10), which is common to said plurality of separate electronic circuit modules (20) and arranged to direct incident light towards the light sensitive areas (22) of each of said electronic circuit modules (20).

    Abstract translation: 本发明涉及一种光谱仪模块（10），包括：多个独立的电子电路模块（20），每个电子电路模块包括集成传感器电路，集成传感器电路包括占据集成传感器电路的一部分区域的光敏区域（22） 所述集成传感器电路被布置为检测入射光，其中所述多个单独电子电路模块（20）包括一组相邻电子电路模块（20）和所述电子电路模块（20）的所述光敏区域（22）是 如此布置在相应的集成传感器电路上，使得该组被安装成使得其光敏区域（22）彼此邻近地布置，以及光学模块（10），其对于所述多个分离的电子电路模块 （20）并且布置成将入射光导向每个所述电子电路模块（20）的光敏区域（22）。

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