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    Rotating disk reflection for fast wavelength scanning of dispersed broadbend light
    12.
    发明公开
    Rotating disk reflection for fast wavelength scanning of dispersed broadbend light 审中-公开
    Drehscheiben reflexion zur schnellenWellenlängendurchstimmungvon dispergiertem Breitbandlicht

    公开(公告)号：EP2662674A2

    公开(公告)日：2013-11-13

    申请号：EP13179246.7

    申请日：2008-01-17

    Applicant: The General Hospital Corporation

    Inventor： Bouma, Brett Eugene ,  Yun, Seok-Hyun ,  Oh, Wang-Yuhl ,  Vakoc, Benjamin ,  Tearney, Guillermo J.

    IPC: G01J3/02 ,  G01J3/06 ,  G01J3/10 ,  G02B26/04 ,  H01S3/106 ,  H01S3/08 ,  H01S3/105 ,  H01S3/10 ,  G02B26/00

    CPC classification number: H01S3/08063 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/06 ,  G01J3/10 ,  G02B26/002 ,  G02B26/04 ,  H01S3/08 ,  H01S3/08009 ,  H01S3/0805 ,  H01S3/10046 ,  H01S3/105 ,  H01S3/106

    Abstract: An apparatus and source arrangement for filtering an electromagnetic radiation can be provided which may include at least one spectral separating arrangement (200) configured to physically separate one or more components (320, 340) of the electromagnetic radiation based on a frequency of the electromagnetic radiation. The apparatus and source arrangement may also have at least one continuously rotating optical arrangement, e.g., a spinning reflector disk scanner (500), which is configured to receive at least one signal that is associated with the one or more components (320, 340). Further, the apparatus and source arrangement can include at least one beam selecting arrangement configured to receive the signal. Rotating disk (500) may comprise reflecting patterns (520) to generate a wavelength scan depending on the rotation frequency of the disk (500).

    Abstract translation: 可以提供用于过滤电磁辐射的装置和源装置，其可以包括至少一个光谱分离装置（200），其被配置为基于电磁辐射的频率物理地分离电磁辐射的一个或多个部件（320,340） 。 装置和源装置还可以具有至少一个连续旋转的光学布置，例如旋转反射器盘扫描器（500），其被配置为接收与一个或多个部件（320,340）相关联的至少一个信号， 。 此外，装置和源装置可以包括被配置为接收信号的至少一个波束选择装置。 旋转盘（500）可以包括反射图案（520），以根据盘（500）的旋转频率产生波长扫描。

    Detection optical system and scanning microscope
    13.
    发明公开
    Detection optical system and scanning microscope 审中-公开
    Optisches Detektionssystem und Rastermikroskop

    公开(公告)号：EP2594979A1

    公开(公告)日：2013-05-22

    申请号：EP12007625.2

    申请日：2012-11-09

    Applicant: Olympus Corporation

    Inventor： Tomioka, Masaharu

    IPC: G02B21/00 ,  G01J3/06 ,  G01J3/18 ,  G01J3/02

    CPC classification number: G02B21/0076 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0237 ,  G01J3/06 ,  G01J3/1838 ,  G01J3/4406 ,  G02B21/0064

    Abstract: Provided is a detection optical system that is provided with a dispersed-light detection function and that can increase the amount of detected light by enhancing the diffraction efficiency. A detection optical system 10 is employed which includes a transmissive VPH diffraction grating 11 that disperses fluorescence from a specimen into a plurality of wavelength bands; a rotating mechanism that rotates the VPH diffraction grating 11 about an axial line L that is perpendicular to an incident optical axis of the fluorescence from the specimen and an emission optical axis from the VPH diffraction grating 11; a light detection portion 15 that detects the fluorescence from the specimen that has been dispersed by the VPH diffraction grating 11; and a correcting portion that corrects an incident position on the light detection portion 15 in accordance with a displacement of the optical axis caused by the rotation of the VPH diffraction grating 11 in synchronization with the rotating mechanism.

    Abstract translation: 提供了一种具有分散光检测功能并且可以通过提高衍射效率来增加检测光量的检测光学系统。 使用检测光学系统10，其包括将来自样本的荧光分散到多个波长带中的透射VPH衍射光栅11; 旋转机构，其使VPH衍射光栅11绕垂直于来自样本的荧光入射光轴的轴线L和来自VPH衍射光栅11的发射光轴旋转; 光检测部分15，其检测来自由VPH衍射光栅11分散的样本的荧光; 以及校正部，其根据与旋转机构同步的VPH衍射光栅11的旋转引起的光轴的位移校正光检测部15上的入射位置。

    Spectroscope
    14.
    发明公开
    Spectroscope 有权
    Spektroskop

    公开(公告)号：EP2402725A1

    公开(公告)日：2012-01-04

    申请号：EP11183115.2

    申请日：2008-07-30

    Applicant: NIPPON TELEGRAPH AND TELEPHONE CORPORATION

    Inventor： Nakamura, Koichiro ,  Sasaki, Yuzo ,  Fujiura, Kazuo ,  Yagi, Shogo

    IPC: G01J3/06 ,  G01J3/02 ,  G01J3/14 ,  G01J3/18 ,  G01J3/36

    CPC classification number: G01J3/14 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0237 ,  G01J3/06 ,  G01J3/18 ,  G01J3/36 ,  G01J2003/064

    Abstract: The present invention provides a small spectrocsope that has a short response time. A spectroscope according to an embodiment includes a beam deflector that includes an electro-optic crystal, having an electro-optic effect, and paired electrodes used to apply an electric field inside the electro-optic crystal; spectroscopic means for dispersing light output by the beam deflector; and wavelength selection means for selecting light having an arbitrary wavelength from the light dispersed and output by the spectroscopic means. At the least, either an input end or an output end of the beam deflector is wedge shaped, so that a thickness of the end is gradually reduced from the first face, where the first electrode of the paired electrodes is located, toward the second face, opposite the first face, where the second electrode of the paired electrodes is located.

    Abstract translation: 本发明提供一种响应时间短的小光谱。 根据实施例的分光镜包括具有电光效应的电光晶体的光束偏转器和用于在电光晶体内施加电场的成对电极; 用于分散由光束偏转器输出的光的分光装置; 以及用于从由分光装置分散和输出的光中选择具有任意波长的光的波长选择装置。 至少，光束偏转器的输入端或输出端是楔形的，使得端部的厚度从成对电极的第一电极所在的第一面逐渐减小到第二面 与第一面相对，其中成对电极的第二电极位于其中。

    Spectral distribution measuring device
    16.
    发明公开
    Spectral distribution measuring device 有权
    Spektrale Verteilungsmessvorrichtung

    公开(公告)号：EP2295942A1

    公开(公告)日：2011-03-16

    申请号：EP10251585.5

    申请日：2010-09-13

    Applicant: Ricoh Company Ltd.

    Inventor： Shimbo, Kohei ,  Seo, Manabu ,  Kamijo, Naohiro

    IPC: G01J3/02 ,  G01J3/06 ,  G01J3/18 ,  G01J3/28 ,  G01J3/50 ,  H04N1/028

    CPC classification number: G01J3/50 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/06 ,  G01J3/18 ,  G01J3/2803 ,  G01J3/2823 ,  G02B3/0087 ,  G02B13/22 ,  G02B27/0025

    Abstract: A spectral distribution measuring device includes an illumination unit (13) configured to illuminate white light to a surface of an object (12) being measured; a slit array (15) having a plurality of slits formed in alignment at equal intervals; a linear image sensor (18) including a light receiving face (18b) having a plurality of rectangular pixels (19) adjacently arranged in alignment and a plurality of spectral light-irradiated areas divided in each predetermined number of neighboring pixels; a plurality of areas being measured which is set on the surface of the object being measured, and reflects the light irradiated by the illumination unit to the plurality of slits; and a diffraction unit (17) configured to diffract and disperse reflection light which is reflected from the areas being measured and has passed through each slit, the diffraction unit being disposed such that a direction where a diffraction image expands is inclined at an angle to a direction where the light receiving face expands.

    Abstract translation: 光谱分布测量装置包括被配置为将白光照射到被测量物体（12）的表面的照明单元（13） 具有以相等的间隔对准地形成的多个狭缝的狭缝阵列（15） 一种线性图像传感器（18），包括具有相邻排列的多个矩形像素（19）的光接收面（18b）和在每个预定数量的相邻像素中分割的多个光谱光照射区域; 测量被测物体的表面上被测量的多个区域，并将照明单元照射的光反射到多个狭缝; 以及衍射单元（17），被配置为衍射和分散从被测量区域反射并穿过每个狭缝的反射光，所述衍射单元被设置为使得衍射图像扩展的方向以与 光接收面膨胀的方向。

    METHOD AND APPARATUS FOR A HIGH RESOLUTION DOWNHOLE SPECTROMETER
    20.
    发明授权
    METHOD AND APPARATUS FOR A HIGH RESOLUTION DOWNHOLE SPECTROMETER 有权
    设备和方法用于高分辨率光谱仪HOLE

    公开(公告)号：EP1511917B1

    公开(公告)日：2009-08-05

    申请号：EP03734390.2

    申请日：2003-06-04

    Applicant: BAKER HUGHES INCORPORATED

    Inventor： DIFOGGIO, Rocco ,  WALKOW, Arnold ,  BERGREN, Paul

    IPC: E21B49/00 ,  E21B47/10

    CPC classification number: G01J3/26 ,  E21B47/102 ,  E21B49/08 ,  G01J3/0202 ,  G01J3/0262 ,  G01J3/06 ,  G01J3/433 ,  G01N21/0317 ,  G01N21/3504 ,  G01N21/3577 ,  G01N21/359 ,  G01N2021/855

    Abstract: The present invention provides a method and apparatus incorporating a spinning, oscillating or stepping optical interference filter (109) to change the angle at which light (102) passes through the filters after passing through a sample (105) under analysis downhole. As each filter is tilted, the color or wavelength of light passed by the filter changes. Black plates are placed between the filters to isolate each filter's photodiode. The spectrometer of the present invention is suitable for use with a wire line formation tester to provide supplemental analysis and monitoring of sample clean up. The present invention is also suitable for deployment in a monitoring while drilling environment. The present invention provides a high resolution spectometer which enables quantification of a crude oil's percentage of aromatics, olefins, and saturates to estimate a sample's gas oil ratio (GOR). Gases such as CO2 are also detectable. The percentage of oil-based mud filtrate contamination in a crude oil sample can be estimated with the present invention by using a suitable training set and chemometrics, a neural network, or other type of correlation method.

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