Abstract:
An analysis apparatus includes a plasma generation unit and an optical analysis unit. The plasma generation unit generates initial plasma by momentarily energizing a target substance to be turned into a plasma state, and maintains the target substance in the plasma state by irradiating the initial plasma with an electromagnetic wave for a predetermined period of time. The optical analysis unit identifies the target substance based on information with respect to emission intensity during a period from when the emission intensity reaches a peak due to the initial plasma until when the emission intensity increases and reaches approximately a constant value due to electromagnetic wave plasma maintained by the electromagnetic wave, or information with respect to emission intensity after the electromagnetic wave irradiation is terminated.
Abstract:
The method and device are used to plasma-treat workpieces. The workpiece is inserted into a chamber of a treatment station that can be at least partially evacuated. The plasma chamber is bounded by a chamber bottom, a chamber cover, and a lateral chamber wall. The method process is optically monitored at least at times. In the optical monitoring, spectral lines of the radiation of the plasma above 500 nanometers are evaluated. Preferably, the evaluation is performed for frequencies above 700 nanometers.
Abstract:
Provided is a spectroscope that can be manufactured easily, can be reduced in size, and can provide high wavelength resolution of a specific spectral band. Specifically, provided is a spectroscope with a diffraction grating 331 that deflects and separates incident light in different directions depending on to an element of the incident light, at least one optical element 332a, diffusing a light that has passed through this diffraction grating 331 and has entered the optical element 332a, a line sensor 333, which receives the light that has passed through the optical element 332a, thereby only light that has a specific deflection angle within a specific range of wavelengths from among all the light that entered said optical element 332a is selectively expanded and received.
Abstract:
An apparatus (10) for analyzing lubricant oils and functional fluids includes an optical emission spectrometer (OES) (26) having a substantially continuously valued wavelength versus intensity output (140). The OES (26) analyzes light captured from a spark emission stand (58) through which the fluid sample is flowed. An expert system (160-172) operates according to a set of Rules, and generates diagnostic text (174) for an operator based on the information about the fluid sample provided by the OES (26) and other measurement devices. The apparatus (10) is reduced in size, weight and cost.
Abstract:
Provided is a standard spectroradiometer which accurately measures the spectral radiation characteristic of a solar simulator and has a function of diagnosing a light source lamp and a lighting circuit thereof. The standard spectroradiometer including first light detection means (91) to (95) for respectively detecting spectral lights obtained by dispersion, the spectral lights being made by splitting and conducting a flashlight emitted from a pulse-lighting type solar simulator (2) by a plurality of optical fibers (71) to (75) and dispersing the conducted flashlights by respective spectroscopes (81) to (85), includes: a second light detection means (10) for detecting the flashlight emitted from the solar simulator (2); a threshold determination circuit (13) comparing a detection voltage detected by the second light detection means (10) and a threshold reference voltage and outputting a determination signal when the detection voltage becomes equal to or higher than the threshold reference voltage; and a delay time generation circuit (14) receiving input of the determination signal and outputting a measurement start signal, wherein each of the first light detection means (91) to (95) starts detection upon receiving input of the measurement start signal.
Abstract:
The invention relates to a spectrometer for analysing the optical emission of a sample, comprising an excitation source, an inlet, a dispersive element which fans out the spectrum of the light generated in the excitation source in a plane, and solid body sensors comprising at least one line arranged in the region of the focal curve of the beam path in order to evaluate the spectral information. The sensors are arranged above or below the plane, and the spectral emission is deflected towards the sensors by mirrors and focussed, the reflecting surface of the mirror being aspherically formed in a direction of curvature.
Abstract:
Multiple energy sources, such as a laser and electrical field, are employed, in close coordination, spatially and temporally, to clean a sample, vaporize its material and excite vapor atoms for the purpose of atomic emission spectroscopy. These methods permit better monitoring and control of the individual processes in real time, lead to higher consistency and higher quality optical emission spectra, and enhance the measurements of non-conducting solids, liquids and gases. Additionally, a portable instrument is provided with both laser source and spectrometer optically coupled to a hand-holdable unit.
Abstract:
A hand-held, self-contained, battery-powered test instrument for analyzing composition of a sample includes an exciter for exciting at least a portion of the sample, a compact cross-dispersed spectrometer for receiving an optical signal from the excited portion of the sample and a processor for processing spectral data about the optical signal from the spectrometer. The exciter may include a spark generator and a counter electrode, a laser or other device for generating the optical signal from the sample portion. The spectrometer has a wavelength range broad enough to enable the test instrument to detect and determine relative quantities of carbon, phosphorous, sulfur, manganese, silicon, iron and other elements necessary to identify common alloys. The spectrometer includes a structural member made of a light-weight material having a small coefficient of thermal expansion (CTE). The spectrometer is dimensionally stable over a range of expected ambient temperatures, without controlling the temperature of the spectrometer.
Abstract:
In one embodiment, the disclosure relates to a method for interrogating a sample by: illuminating a first region of the sample with a first illumination pattern to obtain a plurality of first sample photons; illuminating a second region of the sample with a second illumination pattern to obtain a plurality of second sample photons; processing the plurality of first sample photons to obtain a characteristic atomic emission of the first region and processing the plurality of second sample photons to obtain a Raman spectrum; and identifying the sample through at least one of the characteristic atomic emission of the first region or the Raman spectrum of the second region of the sample.