Abstract:
Apparatus for controlling the temperature of a reaction mixture held within a reaction container, the apparatus including a radiation source for exposing the reaction container to radiation thereby heating the reaction mixture, a temperature sensor for sensing a temperature indicative of a reaction mixture temperature and a controller for controlling the radiation source in accordance with the reaction mixture temperature to thereby selectively heat the reaction mixture.
Abstract:
Systems and methods for measuring the level of a plurality of phases of a conductive or semi-conductive mixture in a vessel. The systems and method include a vessel configured to hold the mixture, a plurality of antennas configured to transmit electromagnetic and/or eddy current signals into the mixture to impinge upon the plurality of phases and to receive corresponding signals reflected from the plurality of phases, a transmitter module configured to generate electromagnetic and/or eddy current signals in communication with the plurality of antennas, a receiver module configured to receive electromagnetic and/or eddy current signals in communication with the plurality of antennas, a control module in communication with the transmitter module and the receiver module configured to control their operation, and a signal analysis module in communication with the receiver module configured to process the reflected signals to determine the levels of the plurality of phases within the vessel.
Abstract:
A method of operating a metrology instrument includes generating relative motion between a probe and a sample at a scan frequency using an actuator. The method also includes detecting motion of the actuator using a position sensor that exhibits noise in the detected motion, and controlling the position of the actuator using a feedback loop and a feed forward algorithm. In this embodiment, the controlling step attenuates noise in the actuator position compared to noise exhibited by the position sensor over the scan bandwidth. Scan frequencies up to a third of the first scanner resonance frequency or greater than 300 Hz are possible.
Abstract:
A diagnostic assay system including a test device and a scanning device are described. In one implementation, the scanning device includes a source of electromagnetic radiation, an optics assembly, a detector, and a microprocessor disposed within a chassis. The test device and scanning device may be configured to be movable relative to each other during operation of the scanning device.
Abstract:
A high speed and miniature detection system, especially for electromagnetic radiation in the GHz and THz range comprises a semiconductor structure having a 2D charge carrier layer or a quasi 2D charge carrier layer with incorporated single or multiple defects, at least first and second contacts to the charge carrier layer, and a device for measuring photovoltage between the first and second contacts. System operation in various embodiments relies on resonant excitation of plasma waves in the semiconductor structure.
Abstract:
A method and system for classifies an unknown sample that contains either a first radioactive isotope, a second radioactive isotope, or a mixture of the first and second radioactive isotopes. Input vectors representative of a training set of samples for a first isotope class and a second isotope class are received. A multivariate classification model is constructed based on the received input vectors. Data is received corresponding to the unknown sample. First and second probabilities that the unknown sample respectively belongs to the first isotope class and the second isotope class are calculated. Based on the first and second probabilities, the unknown sample is classified as either the first radioactive isotope, the second radioactive isotope, or a mixture of the first and second radioactive isotopes.