Abstract:
An apparatus for ionizing analyte molecules comprised in a flow of a first gas. The apparatus includes an inlet tube through which the first gas may be discharged into an ionization region. The apparatus also includes a nozzle electrode disposed around the inlet tube to define a substantially annular space between the exterior of the inlet tube and the interior of the nozzle electrode. The sheath tube includes an inlet for introducing a fluid into the substantially annular space and an outlet through which the fluid may be discharged into the ionization region. The apparatus is configured to ionize the analyte molecules optionally via electrospray or chemical ionization.
Abstract:
An apparatus for ionizing analyte molecules comprised in a flow of a first gas. The apparatus includes an inlet tube through which the first gas may be discharged into an ionization region. The apparatus also includes a nozzle electrode disposed around the inlet tube to define a substantially annular space between the exterior of the inlet tube and the interior of the nozzle electrode. The sheath tube includes an inlet for introducing a fluid into the substantially annular space and an outlet through which the fluid may be discharged into the ionization region. The apparatus is configured to ionize the analyte molecules optionally via electrospray or chemical ionization.
Abstract:
The present disclosure provides a method for manufacturing a particle source comprising: placing a metal wire in vacuum, introducing active gas, adjusting a temperature of the metal wire and applying a positive high voltage V to the metal wire to generate at a side of the head of the metal wire an etching zone in which field induced chemical etching (FICE) is performed; increasing by the FICE a surface electric field at the top of the metal wire head to be greater than a field evaporation electric field of material for the metal wire, so that metal atoms at the top of the metal wire are evaporated off; after the field evaporation is activated by the FICE, causing mutual adjustment between the FICE and the field evaporation, until the head of the metal wire has a shape of combination of a base and a tip on the base; and stopping the FICE and the field evaporation when the head of the metal wire takes a predetermine shape.
Abstract:
The present disclosure provides a method for manufacturing a particle source, comprising: placing a metal wire in vacuum, introducing active gas and catalyst gas, adjusting a temperature of the metal wire, and applying a positive high voltage V to the metal wire to dissociate the active gas at the surface of the metal wire, in order to generate at a peripheral surface of the head of the metal wire an etching zone in which field induced chemical etching (FICE) is performed; increasing by the FICE a surface electric field at the apex of the metal wire head to be greater than the evaporation field of the material for the metal wire, so that metal atoms at the wire apex are evaporated off; after the field evaporation is activated by the FICE, causing mutual adjustment between the FICE and the field evaporation, until the head of the metal wire has a shape of combination of a base and a tip on the base, wherein the FICE occurs at the lateral side of the metal wire head to form the base, and the field evaporation occurs at the apex of the metal wire head to form the tip; and stopping the FICE and the field evaporation when the head of the metal wire takes a predetermine shape.
Abstract:
This device (2) for generating an ion beam (4), which includes a liquid metal ion source (18), is characterized in that the ion source is surrounded by a cryogenic trap (28) maintained at a low temperature, this cryogenic trap being capable of trapping volatile chemical species (G) by condensing them before they can reach the ion source.