Abstract:
A production method for chips, in which as many method steps as possible are carried out in the wafer composite, that is, in parallel for a plurality of chips disposed on a wafer. This is a method for producing a plurality of chips whose functionality is implemented on the basis of the surface layer of a substrate. In this method, the surface layer is patterned and at least one cavity is produced below the surface layer, so that the individual chip regions are connected to each other and/or to the rest of the substrate by suspension webs only, and/or so that the individual chip regions are connected to the substrate layer below the cavity via supporting elements in the region of the cavity. The suspension webs and/or supporting elements are cut when the chips are separated. The patterned and undercut surface layer of the substrate is embedded in a plastic mass before the chips are separated.
Abstract:
A method for manufacturing chips (1, 2), in which at least one diaphragm (11, 12) is produced in the surface layer of a semiconductor substrate (10) spanning a cavity (13). The functionality of the chip (1, 2) is then integrated into the diaphragm (11, 12). In order to separate the chip (1, 2), the diaphragm (11, 12) is detached from the substrate composite. The method according to the present invention is characterized by metal plating of the back of the chip (1, 2) in an electroplating process before the chip is separated.
Abstract:
A method for producing a component having at least one diaphragm formed in the upper surface of the component, which diaphragm spans a cavity, and having at least one access opening to the cavity from the back side of the component, at least one first diaphragm layer and the cavity being produced in a monolithic semiconductor substrate from the upper surface of the component, and the access opening being produced in a temporally limited etching step from the back side of the substrate. The access opening is placed in a region in which the substrate material comes up to the first diaphragm layer. The etching process for producing the access opening includes at least one anisotropic etching step and at least one isotropic etching step, in the anisotropic etching step, an etching channel from the back side of the substrate being produced, which terminates beneath the first diaphragm layer in the vicinity of the cavity, and at least the end region of this etching channel being expanded in the isotropic etching step until the etching channel is connected to the cavity.
Abstract:
In a method for manufacturing a micromechanical chip, a sacrificial layer and an epitaxy layer are initially applied to a semiconductor substrate to produce a layer stack. An opening is subsequently introduced into the epitaxy layer from the front side of the layer stack. In order to electrically insulate the subsequent filling of the opening using a conductive contact layer from the material of the epitaxy layer, the walls of the opening are provided with an insulating layer. For removing the sacrificial layer and thus for producing the chip, separation trenches are subsequently etched through the epitaxy layer to the sacrificial layer also from the front side of the layer stack, which separation trenches also delimit the lateral extension of the chip.
Abstract:
A data carrier (4) for the contactless communication of communication information (KD) with a transmitting/receiving station (1) includes receiving circuit (7) for receiving an HF signal (HF) containing the communication information (KD) from the transmitting/receiving station (1), and processing circuit (10) for processing the received communication information (KD), and supply voltage generating circuit (13) for rectifying the received HF signal (HF) and for energizing the processing circuit (10) with a supply voltage (UV), and reset circuit (14) for resetting, when the supply voltage (UV) decreases below a reset voltage value (UR), the processing performed by the processing circuit (10), the reset circuit (14) now being adapted to interrupt the processing of the communication information (KD) by the processing circuit (10) at least partially when the supply voltage (UV) decreases below an interruption voltage value (UU), the interruption voltage value (UU) being greater than the reset voltage value (UR).
Abstract:
A method for producing a component having at least one diaphragm formed in the upper surface of the component, which diaphragm spans a cavity, and having at least one access opening to the cavity from the back side of the component, at least one first diaphragm layer and the cavity being produced in a monolithic semiconductor substrate from the upper surface of the component, and the access opening being produced in a temporally limited etching step from the back side of the substrate. The access opening is placed in a region in which the substrate material comes up to the first diaphragm layer. The etching process for producing the access opening includes at least one anisotropic etching step and at least one isotropic etching step, in the anisotropic etching step, an etching channel from the back side of the substrate being produced, which terminates beneath the first diaphragm layer in the vicinity of the cavity, and at least the end region of this etching channel being expanded in the isotropic etching step until the etching channel is connected to the cavity.
Abstract:
A method for manufacturing a micromechanical diaphragm structure having access from the rear of the substrate includes: n-doping at least one contiguous lattice-type area of a p-doped silicon substrate surface; porously etching a substrate area beneath the n-doped lattice structure; producing a cavity in this substrate area beneath the n-doped lattice structure; growing a first monocrystalline silicon epitaxial layer on the n-doped lattice structure; at least one opening in the n-doped lattice structure being dimensioned in such a way that it is not closed by the growing first epitaxial layer but instead forms an access opening to the cavity; an oxide layer being created on the cavity wall; a rear access to the cavity being created, the oxide layer on the cavity wall acting as an etch stop layer; and the oxide layer being removed in the area of the cavity.
Abstract:
In order to provide a microcontroller and an addressing method which are distinguished by a lower storage requirement and a higher execution speed than previously known when addressing N-bit address spaces, the address length N of the N-bit address word being greater than the address length of a standard set of instruction or of equivalents of other sets of instructions of the microcontroller, it is provided that the microcontroller (10) has at least one status bit (12) by means of which a writing and/or reading of N-bit address words by at least one standard instruction of the microcontroller (10) can be forced, and the at least one status bit (12) of a microcontroller (10) is set and as a a result a writing and/or reading of N-bit address words by means of at least one standard instruction of the microcontroller (10) is forced.
Abstract:
A data carrier is disclosed. The data carrier includes a data processing unit and at least one contactless interface via which the data processing unit can be coupled to a read/write apparatus in order to exchange data signals and to take up electrical energy for the operation of the data processing unit; the data processing unit is constructed at least mainly while using at least substantially asynchronously operating logic components (asynchronous logic). The data carrier according to the invention, such as a chip card, makes optimum use of the energy applied thereto and is at the same time protected against the tapping of the signal processing steps to be executed therein.
Abstract:
A method for manufacturing chips (1, 2), in which at least one diaphragm (11, 12) is produced in the surface layer of a semiconductor substrate (10) spanning a cavity (13). The functionality of the chip (1, 2) is then integrated into the diaphragm (11, 12). In order to separate the chip (1, 2), the diaphragm (11, 12) is detached from the substrate composite. The method according to the present invention is characterized by metal plating of the back of the chip (1, 2) in an electroplating process before the chip is separated.