利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

13 条记录 (耗时 0.027 秒)

    Method for manufacturing a micromechanical diaphragm structure having access from the rear of the substrate
    1.
    发明申请
    Method for manufacturing a micromechanical diaphragm structure having access from the rear of the substrate 有权
    用于制造从衬底的后部进入的微机械膜结构的方法

    公开(公告)号：US20110147864A1

    公开(公告)日：2011-06-23

    申请号：US12737037

    申请日：2009-04-21

    申请人： Torsten Kramer ,  Marcus Ahles ,  Armin Grundmann ,  Kathrin Knese ,  Hubert Benzel ,  Gregor Schuermann ,  Simon Armbruster

    发明人： Torsten Kramer ,  Marcus Ahles ,  Armin Grundmann ,  Kathrin Knese ,  Hubert Benzel ,  Gregor Schuermann ,  Simon Armbruster

    IPC分类号： H01L21/302 ,  H01L29/84

    CPC分类号： B81C1/00158 ,  B81B2201/0257 ,  B81B2201/0264 ,  B81C2201/0115 ,  B81C2201/0136 ,  G01L9/0042

    摘要： A method for manufacturing a micromechanical diaphragm structure having access from the rear of the substrate includes: n-doping at least one contiguous lattice-type area of a p-doped silicon substrate surface; porously etching a substrate area beneath the n-doped lattice structure; producing a cavity in this substrate area beneath the n-doped lattice structure; growing a first monocrystalline silicon epitaxial layer on the n-doped lattice structure; at least one opening in the n-doped lattice structure being dimensioned in such a way that it is not closed by the growing first epitaxial layer but instead forms an access opening to the cavity; an oxide layer being created on the cavity wall; a rear access to the cavity being created, the oxide layer on the cavity wall acting as an etch stop layer; and the oxide layer being removed in the area of the cavity.

    摘要翻译： 用于制造从衬底的后部进入的微机械膜结构的方法包括：n掺杂p掺杂硅衬底表面的至少一个连续的格子型区域; 在n掺杂的晶格结构下面蚀刻衬底区域; 在该n型掺杂晶格结构下面的该衬底区域中产生空腔; 在n掺杂晶格结构上生长第一单晶硅外延层; n掺杂晶格结构中的至少一个开口的尺寸设计成使得其不被生长的第一外延层闭合​​，而是形成到腔的通路口; 在空腔壁上形成氧化物层; 产生到空腔的后部通路，空腔壁上的氧化层用作蚀刻停止层; 并且在空腔的区域中去除氧化物层。

    Method for manufacturing a micromechanical diaphragm structure having access from the rear of the substrate
    2.
    发明授权
    Method for manufacturing a micromechanical diaphragm structure having access from the rear of the substrate 有权
    用于制造从衬底的后部进入的微机械膜结构的方法

    公开(公告)号：US08519494B2

    公开(公告)日：2013-08-27

    申请号：US12737037

    申请日：2009-04-21

    申请人： Torsten Kramer ,  Marcus Ahles ,  Armin Grundmann ,  Kathrin Knese ,  Hubert Benzel ,  Gregor Schuermann ,  Simon Armbruster

    发明人： Torsten Kramer ,  Marcus Ahles ,  Armin Grundmann ,  Kathrin Knese ,  Hubert Benzel ,  Gregor Schuermann ,  Simon Armbruster

    IPC分类号： G01P15/08

    CPC分类号： B81C1/00158 ,  B81B2201/0257 ,  B81B2201/0264 ,  B81C2201/0115 ,  B81C2201/0136 ,  G01L9/0042

    摘要： A method for manufacturing a micromechanical diaphragm structure having access from the rear of the substrate includes: n-doping at least one contiguous lattice-type area of a p-doped silicon substrate surface; porously etching a substrate area beneath the n-doped lattice structure; producing a cavity in this substrate area beneath the n-doped lattice structure; growing a first monocrystalline silicon epitaxial layer on the n-doped lattice structure; at least one opening in the n-doped lattice structure being dimensioned in such a way that it is not closed by the growing first epitaxial layer but instead forms an access opening to the cavity; an oxide layer being created on the cavity wall; a rear access to the cavity being created, the oxide layer on the cavity wall acting as an etch stop layer; and the oxide layer being removed in the area of the cavity.

    摘要翻译： 用于制造从衬底的后部进入的微机械膜结构的方法包括：n掺杂p掺杂硅衬底表面的至少一个连续的格子型区域; 在n掺杂的晶格结构下面蚀刻衬底区域; 在该n型掺杂晶格结构下面的该衬底区域中产生空腔; 在n掺杂晶格结构上生长第一单晶硅外延层; n掺杂晶格结构中的至少一个开口的尺寸设计成使得其不被生长的第一外延层闭合​​，而是形成到腔的通路口; 在空腔壁上形成氧化物层; 产生到空腔的后部通路，空腔壁上的氧化层用作蚀刻停止层; 并且在空腔的区域中去除氧化物层。

    METHOD FOR PRODUCING A COMPONENT, AND SENSOR ELEMENT
    3.
    发明申请
    METHOD FOR PRODUCING A COMPONENT, AND SENSOR ELEMENT 有权
    生产组件和传感器元件的方法

    公开(公告)号：US20100164027A1

    公开(公告)日：2010-07-01

    申请号：US12522693

    申请日：2007-11-28

    申请人： Torsten Kramer ,  Kathrin Knese ,  Hubert Benzel ,  Gregor Schuermann ,  Simon Armbruster ,  Christoph Schelling

    发明人： Torsten Kramer ,  Kathrin Knese ,  Hubert Benzel ,  Gregor Schuermann ,  Simon Armbruster ,  Christoph Schelling

    IPC分类号： H01L29/84 ,  H01L21/306

    CPC分类号： B81C1/00182 ,  B81B2201/0264 ,  B81B2207/015 ,  B81C2201/0115 ,  G01L19/0038

    摘要： A method for producing a component having at least one diaphragm formed in the upper surface of the component, which diaphragm spans a cavity, and having at least one access opening to the cavity from the back side of the component, at least one first diaphragm layer and the cavity being produced in a monolithic semiconductor substrate from the upper surface of the component, and the access opening being produced in a temporally limited etching step from the back side of the substrate. The access opening is placed in a region in which the substrate material comes up to the first diaphragm layer. The etching process for producing the access opening includes at least one anisotropic etching step and at least one isotropic etching step, in the anisotropic etching step, an etching channel from the back side of the substrate being produced, which terminates beneath the first diaphragm layer in the vicinity of the cavity, and at least the end region of this etching channel being expanded in the isotropic etching step until the etching channel is connected to the cavity.

    摘要翻译： 一种用于制造具有形成在所述部件的上表面中的至少一个光阑的部件的方法，所述至少一个光阑形成在所述部件的上表面中，所述光阑跨越空腔，并且具有至少一个从所述部件的后侧到所述腔的进入开口，至少一个第一隔膜层 并且所述空腔从所述部件的上表面在单片半导体衬底中产生，并且所述存取开口在时间上受限制的蚀刻步骤中从所述衬底的背面制造。 进入口放置在基板材料到达第一隔膜层的区域中。 用于制造进出口的蚀刻工艺包括至少一个各向异性蚀刻步骤和至少一个各向同性蚀刻步骤，在各向异性蚀刻步骤中，从所述基板的背面制造蚀刻通道，其终止于第一隔膜层下方 该腔的附近，并且至少该蚀刻通道的端部区域在各向同性蚀刻步骤中扩展，直到蚀刻通道连接到空腔。

    Method for producing a component, and sensor element
    4.
    发明授权
    Method for producing a component, and sensor element 有权
    用于制造组件和传感器元件的方法

    公开(公告)号：US08530261B2

    公开(公告)日：2013-09-10

    申请号：US12522693

    申请日：2007-11-28

    申请人： Torsten Kramer ,  Kathrin Knese ,  Hubert Benzel ,  Gregor Schuermann ,  Simon Armbruster ,  Christoph Schelling

    发明人： Torsten Kramer ,  Kathrin Knese ,  Hubert Benzel ,  Gregor Schuermann ,  Simon Armbruster ,  Christoph Schelling

    IPC分类号： H01L21/00

    CPC分类号： B81C1/00182 ,  B81B2201/0264 ,  B81B2207/015 ,  B81C2201/0115 ,  G01L19/0038

    摘要： A method for producing a component having at least one diaphragm formed in the upper surface of the component, which diaphragm spans a cavity, and having at least one access opening to the cavity from the back side of the component, at least one first diaphragm layer and the cavity being produced in a monolithic semiconductor substrate from the upper surface of the component, and the access opening being produced in a temporally limited etching step from the back side of the substrate. The access opening is placed in a region in which the substrate material comes up to the first diaphragm layer. The etching process for producing the access opening includes at least one anisotropic etching step and at least one isotropic etching step, in the anisotropic etching step, an etching channel from the back side of the substrate being produced, which terminates beneath the first diaphragm layer in the vicinity of the cavity, and at least the end region of this etching channel being expanded in the isotropic etching step until the etching channel is connected to the cavity.

    摘要翻译： 一种用于制造具有形成在所述部件的上表面中的至少一个光阑的部件的方法，所述至少一个光阑形成在所述部件的上表面中，所述光阑跨越空腔，并且具有至少一个从所述部件的后侧到所述腔的进入开口，至少一个第一隔膜层 并且所述空腔从所述部件的上表面在单片半导体衬底中产生，并且所述存取开口在时间上受限制的蚀刻步骤中从所述衬底的背面制造。 进入口放置在基板材料到达第一隔膜层的区域中。 用于制造进出口的蚀刻工艺包括至少一个各向异性蚀刻步骤和至少一个各向同性蚀刻步骤，在各向异性蚀刻步骤中，从所述基板的背面制造蚀刻通道，其终止在第一隔膜层下方 该腔的附近，并且至少该蚀刻通道的端部区域在各向同性蚀刻步骤中扩展，直到蚀刻通道连接到空腔。

    Production of plate-like, sheet-like or tape-like materials and of sensitized lithographic printing plates
    8.
    发明授权
    Production of plate-like, sheet-like or tape-like materials and of sensitized lithographic printing plates 失效
    板状，片状或类似材料的生产，以及敏感的平版印刷板

    公开(公告)号：US5073475A

    公开(公告)日：1991-12-17

    申请号：US571231

    申请日：1990-08-23

    申请人： Harald Lauke ,  Gregor Schuermann ,  Hartmut Sandig ,  Thomas Loerzer

    发明人： Harald Lauke ,  Gregor Schuermann ,  Hartmut Sandig ,  Thomas Loerzer

    IPC分类号： B41N3/00 ,  B41N3/03

    CPC分类号： B41N3/038

    摘要： A sensitized lithographic printing plate comprising an aluminum substrate which has been mechanically, chemically and/or electrochemically pretreated and anodically oxidized in a conventional manner and a photosensitive copying layer which is applied to this substrate is produced by a process in which the substrate is aftertreated with an aqueous solution of a mixture of a fluoride and a hydrolysis product or condensate of a silane before application of the photosensitive copying layer.There lithographic printing plates are particularly suitable for offset printing.

    摘要翻译： 一种致敏平版印刷版，其包括已经机械，化学和/或电化学预处理并以常规方式阳极氧化的铝基板，并且施加到该基板上的光敏复印层通过以下步骤制备：其中基板用 在施加感光复印层之前氟化物和水解产物或硅烷的缩合物的混合物的水溶液。 平版印刷版特别适用于胶版印刷。