公开(公告)号：US20200059228A1

公开(公告)日：2020-02-20

申请号：US16238338

申请日：2019-01-02

Applicant: Analog Devices Global Unlimited Company

Inventor： Srivatsan Parthasarathy ,  Sirui Luo ,  Thomas Paul Kearney ,  Yuanzhong Zhou ,  Donal Bourke ,  Jean-Jacques Hajjar

IPC: H03K17/081 ,  H03K17/0412

Abstract: Fault tolerant switches are provided herein. In certain embodiments, a fault tolerant switch includes a switch, a gate driver, and a clamp. The switch includes a switch p-type field effect transistor (PFET) and a switch n-type field effect transistor (NFET) electrically connected in series and controlled by the gate driver. Additionally, the clamp is electrically connected in parallel with the switch, and includes a forward protection circuit including a first diode and a first clamp FET in series, and a reverse protection circuit including a second diode and a second clamp FET in series. The clamp further includes a first gate bias circuit configured to bias a gate of the first clamp FET and a second gate bias circuit configured to bias a gate of the second clamp FET.

公开(公告)号：US20170023506A1

公开(公告)日：2017-01-26

申请号：US15187398

申请日：2016-06-20

Applicant: Analog Devices Global

Inventor： Colin G. Lyden ,  Donal Bourke ,  Dennis A. Dempsey ,  Dermot G. O'Keeffe ,  Patrick C. Kirby

IPC: G01N27/02 ,  G01N27/49 ,  G01N27/327 ,  H03F3/45 ,  H03F1/34

CPC classification number: G01N27/028 ,  G01N27/3273 ,  G01N27/49 ,  H03F1/34 ,  H03F3/45475 ,  H03F2200/261 ,  H03F2200/462 ,  H03L5/00

Abstract: A control circuit for use with a four terminal sensor, the sensor having first and second drive terminals and first and second measurement terminals, the control circuit arranged to drive at least one of the first and second drive terminals with an excitation signal, to sense a voltage difference between the first and second measurement terminals, and control the excitation signal such that the voltage difference between the first and second measurement terminals is within a target range of voltages, and wherein the control circuit includes N poles in its transfer characteristic and N−1 zeros in its transfer characteristic such that when a loop gain falls to unity the phase shift around a closed loop is not substantially 2π radians or a multiple thereof, where N is greater than 1.

Abstract translation: 一种与四端子传感器一起使用的控制电路，所述传感器具有第一和第二驱动端子以及第一和第二测量端子，所述控制电路被布置成用激励信号驱动第一和第二驱动端子中的至少一个，以感测 并且控制所述激励信号，使得所述第一测量端子与所述第二测量端子之间的电压差在目标电压范围内，并且其中所述控制电路在其传输特性中包括N极，并且所述N- 1的零传递特性使得当环路增益下降到1时，围绕闭环的相移基本上不是2π弧度或其倍数，其中N大于1。

公开(公告)号：US20170241939A1

公开(公告)日：2017-08-24

申请号：US15050141

申请日：2016-02-22

Applicant: Analog Devices Global

Inventor： Liam Riordan ,  Tudor M. Vinereanu ,  Paul V. Errico ,  Dermot O'Keeffe ,  Camille L. Huin ,  Donal Bourke

IPC: G01N27/327 ,  G06K9/52 ,  G06K9/62 ,  C12Q1/00

CPC classification number: G01N27/3274 ,  C12Q1/001 ,  G01N27/3272 ,  G01N27/3273 ,  G01N33/48771 ,  G06K9/522 ,  G06K9/6212

Abstract: Subject matter herein can include identifying a biochemical test strip assembly electrically, such as using the same test circuitry as can be used to perform an electrochemical measurement, without requiring use of optical techniques. The identification can include using information about a measured susceptance of an identification feature included as a portion of the test strip assembly. The identification can be used by test circuitry to select test parameters or calibration values, or to select an appropriate test protocol for the type of test strip coupled to the test circuitry. The identification can be used by the test circuitry to validate or reject a test strip assembly, such as to inhibit use of test strips that fail meet one or more specified criteria.

公开(公告)号：US09705465B2

公开(公告)日：2017-07-11

申请号：US14464611

申请日：2014-08-20

Applicant: ANALOG DEVICES GLOBAL

Inventor： Rares Andrei Bodnar ,  Patrick Joseph Pratt ,  Donal Bourke ,  Peter James Tonge

IPC: H03G3/30 ,  H03F3/21 ,  H03G3/00 ,  H03F3/193 ,  H03F1/30 ,  H03F1/32

CPC classification number: H03G3/3042 ,  H03F1/301 ,  H03F1/3205 ,  H03F3/193 ,  H03F3/21 ,  H03F2200/129 ,  H03F2200/144 ,  H03F2200/18 ,  H03F2200/451 ,  H03F2200/462 ,  H03F2200/481 ,  H03G3/001 ,  H03G3/3089

Abstract: A control apparatus is provided that can provide high dynamic resolution and is suitable for inclusion within an integrated circuit. The control apparatus receives a demand signal representing a desired value of a measurand, and a feedback signal representing a present value or a recently acquired value of the measurand. The processing circuit forms a further signal a further signal which is a function of the demand and feedback signals. The further signal is then subjected to at least an integrating function. The demand signal, feedback signal or the further signal is processed or acquired in a sampled manner. The use of such sampled, i.e. discontinuous, processing allows integration time constants to be synthesized which would otherwise require the use of unfeasibly large components within an integrated circuit, or the use of off-chop components. Both of these other options are expensive.

公开(公告)号：US10581423B1

公开(公告)日：2020-03-03

申请号：US16238338

申请日：2019-01-02

Applicant: Analog Devices Global Unlimited Company

Inventor： Srivatsan Parthasarathy ,  Sirui Luo ,  Thomas Paul Kearney ,  Yuanzhong Zhou ,  Donal Bourke ,  Jean-Jacques Hajjar

IPC: H01L27/02 ,  H02H9/00 ,  H03K17/081 ,  H03K17/0412

Abstract: Fault tolerant switches are provided herein. In certain embodiments, a fault tolerant switch includes a switch, a gate driver, and a clamp. The switch includes a switch p-type field effect transistor (PFET) and a switch n-type field effect transistor (NFET) electrically connected in series and controlled by the gate driver. Additionally, the clamp is electrically connected in parallel with the switch, and includes a forward protection circuit including a first diode and a first clamp FET in series, and a reverse protection circuit including a second diode and a second clamp FET in series. The clamp further includes a first gate bias circuit configured to bias a gate of the first clamp FET and a second gate bias circuit configured to bias a gate of the second clamp FET.

公开(公告)号：US10386324B2

公开(公告)日：2019-08-20

申请号：US15050141

申请日：2016-02-22

Applicant: Analog Devices Global

Inventor： Liam Riordan ,  Tudor M Vinereanu ,  Paul V. Errico ,  Dermot G. O'Keeffe ,  Camille L. Huin ,  Donal Bourke

IPC: G01N27/327 ,  G06K9/62 ,  C12Q1/00 ,  G06K9/52 ,  G01N33/487

Abstract: Subject matter herein can include identifying a biochemical test strip assembly electrically, such as using the same test circuitry as can be used to perform an electrochemical measurement, without requiring use of optical techniques. The identification can include using information about a measured susceptance of an identification feature included as a portion of the test strip assembly. The identification can be used by test circuitry to select test parameters or calibration values, or to select an appropriate test protocol for the type of test strip coupled to the test circuitry. The identification can be used by the test circuitry to validate or reject a test strip assembly, such as to inhibit use of test strips that fail meet one or more specified criteria.

公开(公告)号：US09859878B2

公开(公告)日：2018-01-02

申请号：US14517639

申请日：2014-10-17

Applicant: Analog Devices Global

Inventor： Colin G. Lyden ,  Donal Bourke

IPC: H03K5/003 ,  G01N27/02 ,  G01N27/327 ,  H03H11/24

CPC classification number: H03K5/003 ,  G01N27/028 ,  G01N27/3273 ,  H03H11/24

Abstract: A control circuit for use with a four terminal sensor, such as a glucose sensor. The Glucose sensor is a volume product and typically its manufacture will want to make it as inexpensively as possible. This may give rise to variable impedances surrounding the active cell of the sensor. Typically the sensor has first and second drive terminals and first and second measurement terminals, so as to help overcome the impedance problem. The control circuit is arranged to drive at least one of the first and second drive terminals with an excitation signal, and control the excitation signal such that a voltage difference between the first and second measurement terminals is within a target range of voltages. To allow the control circuit to work with a variety of measurement cell types the control circuit further comprises voltage level shifters for adjusting a voltage at one or both of the drive terminals, or for adjusting a voltage received from one or both of the measurement terminals.