公开(公告)号：US20240021713A1

公开(公告)日：2024-01-18

申请号：US18373598

申请日：2023-09-27

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Haiting Wang ,  Alexander Derrickson ,  Jagar Singh ,  Vibhor Jain ,  Andreas Knorr ,  Alexander Martin ,  Judson R. Holt ,  Zhenyu Hu

IPC: H01L29/735 ,  H01L29/66 ,  H01L29/737 ,  H01L29/08 ,  H01L29/417

CPC classification number: H01L29/735 ,  H01L29/6625 ,  H01L29/737 ,  H01L29/0808 ,  H01L29/41708 ,  H01L29/0821

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to a lateral bipolar transistor and methods of manufacture. A structure includes: an intrinsic base comprising semiconductor material in a channel region of a semiconductor substrate; an extrinsic base vertically above the intrinsic base; a raised collector region on the semiconductor substrate and laterally connected to the intrinsic base; and a raised emitter region on the semiconductor substate and laterally connected to the intrinsic base.

公开(公告)号：US20230061219A1

公开(公告)日：2023-03-02

申请号：US17509384

申请日：2021-10-25

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Haiting Wang ,  Alexander Derrickson ,  Jagar Singh ,  Vibhor Jain ,  Andreas Knorr ,  Alexander Martin ,  Judson R. Holt ,  Zhenyu Hu

IPC: H01L29/735 ,  H01L29/66 ,  H01L29/08 ,  H01L29/417 ,  H01L29/737

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to a lateral bipolar transistor and methods of manufacture. A structure includes: an intrinsic base comprising semiconductor material in a channel region of a semiconductor substrate; an extrinsic base vertically above the intrinsic base; a raised collector region on the semiconductor substrate and laterally connected to the intrinsic base; and a raised emitter region on the semiconductor substate and laterally connected to the intrinsic base.

公开(公告)号：US20210367060A1

公开(公告)日：2021-11-25

申请号：US17398479

申请日：2021-08-10

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Haiting Wang ,  Hong Yu ,  Zhenyu Hu

IPC: H01L29/66 ,  H01L29/78 ,  H01L29/06 ,  H01L21/762 ,  H01L29/45 ,  H01L21/285 ,  H01L29/417

Abstract: The present disclosure generally relates to semiconductor structures and, more particularly, to single fin structures and methods of manufacture. The structure includes: an active single fin structure; a plurality of dummy fin structures on opposing sides of the active single fin structure; source and drain regions formed on the active single fin structure and the dummy fin structures; recessed shallow trench isolation (STI) regions between the dummy fin structures and the active single fin structure and below a surface of the dummy fin structures; and contacts formed on the source and drain regions of the active single fin structure with a spacing of at least two dummy fin structures on opposing sides of the contacts.

公开(公告)号：US12205949B1

公开(公告)日：2025-01-21

申请号：US18758069

申请日：2024-06-28

Applicant: GlobalFoundries U.S. Inc.

Inventor： Zhenyu Hu ,  Hong Yu ,  Haiting Wang

IPC: H01L27/088 ,  H01L27/06 ,  H01L29/40 ,  H01L29/51 ,  H01L29/66 ,  H01L29/78

Abstract: Device structures for a high-voltage semiconductor device and methods of forming such device structures. The structure comprises a semiconductor substrate and a layer stack including a first dielectric layer and a second dielectric layer. The first dielectric layer is positioned between the second dielectric layer and the semiconductor substrate. The structure further comprises a field-effect transistor including a first source/drain region in the semiconductor substrate, a second source/drain region in the semiconductor substrate, and a metal gate on the layer stack laterally between the first source/drain region and the second source/drain region. The second dielectric layer is positioned between the metal gate and the first dielectric layer. A contact extends through the layer stack to the first source/drain region.

公开(公告)号：US11908898B2

公开(公告)日：2024-02-20

申请号：US17456943

申请日：2021-11-30

Applicant: GlobalFoundries U.S. Inc.

Inventor： Haiting Wang ,  Hong Yu ,  Zhenyu Hu ,  Alexander M. Derrickson

IPC: H01L29/10 ,  H01L29/735 ,  H01L29/66

CPC classification number: H01L29/1008 ,  H01L29/6625 ,  H01L29/735

Abstract: Embodiments of the disclosure provide a lateral bipolar transistor with a base layer of varying horizontal thickness, and related methods to form the same. A lateral bipolar transistor may include an emitter/collector (E/C) layer on a semiconductor layer. A first base layer is on the semiconductor layer and horizontally adjacent the E/C layer. The first base layer has a lower portion having a first horizontal width from the E/C layer. The first base layer also has an upper portion on the lower portion, with a second horizontal width from the E/C layer greater than the first horizontal width. A second base layer is on the first base layer and adjacent a spacer. The upper portion of the first base layer separates a lower surface of the second base layer from the E/C layer.

公开(公告)号：US11888031B2

公开(公告)日：2024-01-30

申请号：US17537564

申请日：2021-11-30

Applicant: GlobalFoundries U.S. Inc.

Inventor： Hong Yu ,  Judson R. Holt ,  Zhenyu Hu

IPC: H01L29/10 ,  H01L29/165 ,  H01L29/66 ,  H01L29/737 ,  H01L29/735

CPC classification number: H01L29/1008 ,  H01L29/165 ,  H01L29/66242 ,  H01L29/735 ,  H01L29/737

Abstract: In a disclosed semiconductor structure, a lateral bipolar junction transistor (BJT) has a base positioned laterally between a collector and an emitter. The base includes a semiconductor fin with a first portion that extends from a substrate through an isolation layer, a second portion on the first portion, and a third portion on the second portion. The collector and emitter are on the isolation layer and positioned laterally immediately adjacent to opposing sidewalls of the second portion of the semiconductor fin. In some embodiments, the BJT is a standard BJT where the semiconductor fin (i.e., the base), the collector, and the emitter are made of the same semiconductor material. In other embodiments, the BJT is a heterojunction bipolar transistor (HBT) where a section of the semiconductor fin (i.e., the base) is made of a different semiconductor material for improved performance. Also disclosed is a method of forming the structure.

公开(公告)号：US11705508B2

公开(公告)日：2023-07-18

申请号：US17398479

申请日：2021-08-10

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Haiting Wang ,  Hong Yu ,  Zhenyu Hu

IPC: H01L29/66 ,  H01L29/78 ,  H01L29/06 ,  H01L21/762 ,  H01L29/45 ,  H01L21/285 ,  H01L29/417

CPC classification number: H01L29/6681 ,  H01L21/28518 ,  H01L21/76224 ,  H01L29/0653 ,  H01L29/41791 ,  H01L29/45 ,  H01L29/7851

Abstract: The present disclosure generally relates to semiconductor structures and, more particularly, to single fin structures and methods of manufacture. The structure includes: an active single fin structure; a plurality of dummy fin structures on opposing sides of the active single fin structure; source and drain regions formed on the active single fin structure and the dummy fin structures; recessed shallow trench isolation (STI) regions between the dummy fin structures and the active single fin structure and below a surface of the dummy fin structures; and contacts formed on the source and drain regions of the active single fin structure with a spacing of at least two dummy fin structures on opposing sides of the contacts.

公开(公告)号：US20230071998A1

公开(公告)日：2023-03-09

申请号：US17551346

申请日：2021-12-15

Applicant: GlobalFoundries U.S. Inc.

Inventor： Haiting Wang ,  Hong Yu ,  Zhenyu Hu

IPC: H01L29/737 ,  H01L29/06 ,  H01L29/165 ,  H01L21/02 ,  H01L29/66

Abstract: Structures for a bipolar junction transistor and methods of fabricating a structure for a bipolar junction transistor. The structure includes a collector having a first semiconductor layer, an emitter having a second semiconductor layer, an intrinsic base including nanosheet channel layers positioned with a spaced arrangement in a layer stack, and a base contact laterally positioned between the first and second semiconductor layers. Each nanosheet channel layer extends laterally from the first semiconductor layer to the second semiconductor layer. Sections of the base contact are respectively positioned in spaces between the nanosheet channel layers. The structure further includes first spacers laterally positioned between the sections of the base contact and the first semiconductor layer, and second spacers laterally positioned between the sections of the base contact and the second semiconductor layer.

公开(公告)号：US11127842B2

公开(公告)日：2021-09-21

申请号：US16688267

申请日：2019-11-19

Applicant: GLOBALFOUNDRIES U.S. INC.

Inventor： Haiting Wang ,  Hong Yu ,  Zhenyu Hu

IPC: H01L29/66 ,  H01L29/78 ,  H01L29/06 ,  H01L21/762 ,  H01L29/45 ,  H01L21/285 ,  H01L29/417

Abstract: The present disclosure generally relates to semiconductor structures and, more particularly, to single fin structures and methods of manufacture. The structure includes: an active single fin structure; a plurality of dummy fin structures on opposing sides of the active single fin structure; source and drain regions formed on the active single fin structure and the dummy fin structures; recessed shallow trench isolation (STI) regions between the dummy fin structures and the active single fin structure and below a surface of the dummy fin structures; and contacts formed on the source and drain regions of the active single fin structure with a spacing of at least two dummy fin structures on opposing sides of the contacts.

公开(公告)号：US10957578B2

公开(公告)日：2021-03-23

申请号：US16146413

申请日：2018-09-28

Applicant: GLOBALFOUNDRIES U.S. INC.

Inventor： Wei Hong ,  Hui Zang ,  Hsien-Ching Lo ,  Zhenyu Hu ,  Liu Jiang

IPC: H01L21/762 ,  H01L27/12 ,  H01L29/78 ,  H01L21/02 ,  H01L21/311

Abstract: The present disclosure relates to semiconductor structures and, more particularly, to a single diffusion break device and methods of manufacture. The structure includes a single diffusion break structure with a fill material between sidewall spacers of the single diffusion break structure and a channel oxidation below the fill material.