公开(公告)号：US20120068344A1

公开(公告)日：2012-03-22

申请号：US12887010

申请日：2010-09-21

申请人： Griselda Bonilla ,  Lawrence A. Clevenger ,  Elbert E. Huang ,  Satyanarayana V. Nitta ,  Shom Ponoth

发明人： Griselda Bonilla ,  Lawrence A. Clevenger ,  Elbert E. Huang ,  Satyanarayana V. Nitta ,  Shom Ponoth

IPC分类号： H01L23/532 ,  H01L21/768

CPC分类号： H01L23/5329 ,  H01L21/28562 ,  H01L21/288 ,  H01L21/76825 ,  H01L21/76826 ,  H01L21/76834 ,  H01L21/76835 ,  H01L21/76849 ,  H01L21/76861 ,  H01L21/76862 ,  H01L23/53223 ,  H01L23/53238 ,  H01L23/53266 ,  H01L23/53295 ,  H01L2924/0002 ,  H01L2924/00

摘要： A selective conductive cap is deposited on exposed metal surfaces of a metal line by electroless plating selective to exposed underlying dielectric surfaces of a metal interconnect structure. A dielectric material layer is deposited on the selective conductive cap and the exposed underlying dielectric layer without a preclean. The dielectric material layer is planarized to form a horizontal planar surface that is coplanar with a topmost surface of the selective conductive cap. A preclean is performed and a dielectric cap layer is deposited on the selective conductive cap and the planarized surface of the dielectric material layer. Because the interface including a surface damaged by the preclean is vertically offset from the topmost surface of the metal line, electromigration of the metal in the metal line along the interface is reduced or eliminated.

摘要翻译： 选择性导电盖通过对金属互连结构的暴露的下面的电介质表面可选择的化学镀层沉积在金属线的暴露的金属表面上。 介电材料层沉积在选择性导电盖和暴露的下面的介质层上，而不需要预清洗。 介电材料层被平坦化以形成与选择性导电帽的最顶面共面的水平平面。 执行预清洁，并且在选择性导电盖和介电材料层的平坦化表面上沉积电介质盖层。 由于包括由预清洗层损坏的表面的界面垂直偏离金属线的最上表面，所以金属线中的金属沿着界面的电迁移减少或消除。

公开(公告)号：US08809183B2

公开(公告)日：2014-08-19

申请号：US12887010

申请日：2010-09-21

申请人： Griselda Bonilla ,  Lawrence A. Clevenger ,  Elbert E. Huang ,  Satyanarayana V. Nitta ,  Shom Ponoth

发明人： Griselda Bonilla ,  Lawrence A. Clevenger ,  Elbert E. Huang ,  Satyanarayana V. Nitta ,  Shom Ponoth

IPC分类号： H01L21/4763

CPC分类号： H01L23/5329 ,  H01L21/28562 ,  H01L21/288 ,  H01L21/76825 ,  H01L21/76826 ,  H01L21/76834 ,  H01L21/76835 ,  H01L21/76849 ,  H01L21/76861 ,  H01L21/76862 ,  H01L23/53223 ,  H01L23/53238 ,  H01L23/53266 ,  H01L23/53295 ,  H01L2924/0002 ,  H01L2924/00

摘要： A selective conductive cap is deposited on exposed metal surfaces of a metal line by electroless plating selective to exposed underlying dielectric surfaces of a metal interconnect structure. A dielectric material layer is deposited on the selective conductive cap and the exposed underlying dielectric layer without a preclean. The dielectric material layer is planarized to form a horizontal planar surface that is coplanar with a topmost surface of the selective conductive cap. A preclean is performed and a dielectric cap layer is deposited on the selective conductive cap and the planarized surface of the dielectric material layer. Because the interface including a surface damaged by the preclean is vertically offset from the topmost surface of the metal line, electromigration of the metal in the metal line along the interface is reduced or eliminated.

摘要翻译： 选择性导电盖通过对金属互连结构的暴露的下面的电介质表面可选择的化学镀层沉积在金属线的暴露的金属表面上。 介电材料层沉积在选择性导电盖和暴露的下面的介质层上，而不需要预清洗。 介电材料层被平坦化以形成与选择性导电帽的最顶面共面的水平平面。 执行预清洁，并且在选择性导电盖和介电材料层的平坦化表面上沉积电介质盖层。 由于包括由预清洗层损坏的表面的界面垂直偏离金属线的最上表面，所以金属线中的金属沿着界面的电迁移减少或消除。

公开(公告)号：US20110227232A1

公开(公告)日：2011-09-22

申请号：US12724903

申请日：2010-03-16

申请人： Griselda Bonilla ,  Elbert E. Huang ,  Satyanarayana V. Nitta ,  Shom Ponoth

发明人： Griselda Bonilla ,  Elbert E. Huang ,  Satyanarayana V. Nitta ,  Shom Ponoth

IPC分类号： H01L23/528 ,  H01L21/768

CPC分类号： H01L23/5283 ,  H01L21/31144 ,  H01L21/76804 ,  H01L21/76816 ,  H01L2924/0002 ,  H01L2924/3011 ,  H01L2924/00

摘要： A method for forming crenulated conductors and a device having crenulated conductors includes forming a hardmask layer on a dielectric layer, and patterning the hardmask layer. Trenches are etched in the dielectric layer using the hardmask layer such that the trenches have shallower portions and deeper portions alternating along a length of the trench. A conductor is deposited in the trenches such that crenulated conductive lines are formed having different depths periodically disposed along the length of the conductive line.

摘要翻译： 用于形成齿形导体的方法和具有齿形导体的器件包括在介电层上形成硬掩模层，并对硬掩模层进行构图。 使用硬掩模层在电介质层中蚀刻沟槽，使得沟槽具有沿着沟槽的长度交替的较浅部分和较深部分。 导体沉积在沟槽中，使得形成具有沿着导电线的长度周期性地设置的不同深度的锯齿形导电线。

公开(公告)号：US08421239B2

公开(公告)日：2013-04-16

申请号：US12724903

申请日：2010-03-16

申请人： Griselda Bonilla ,  Elbert E. Huang ,  Satyanarayana V. Nitta ,  Shom Ponoth

发明人： Griselda Bonilla ,  Elbert E. Huang ,  Satyanarayana V. Nitta ,  Shom Ponoth

IPC分类号： H01L29/40

CPC分类号： H01L23/5283 ,  H01L21/31144 ,  H01L21/76804 ,  H01L21/76816 ,  H01L2924/0002 ,  H01L2924/3011 ,  H01L2924/00

摘要： A method for forming crenulated conductors and a device having crenulated conductors includes forming a hardmask layer on a dielectric layer, and patterning the hardmask layer. Trenches are etched in the dielectric layer using the hardmask layer such that the trenches have shallower portions and deeper portions alternating along a length of the trench. A conductor is deposited in the trenches such that crenulated conductive lines are formed having different depths periodically disposed along the length of the conductive line.

摘要翻译： 用于形成齿形导体的方法和具有齿形导体的器件包括在介电层上形成硬掩模层，并对硬掩模层进行构图。 使用硬掩模层在电介质层中蚀刻沟槽，使得沟槽具有沿着沟槽的长度交替的较浅部分和较深部分。 导体沉积在沟槽中，使得形成具有沿着导电线的长度周期性地设置的不同深度的锯齿形导电线。

公开(公告)号：US20070249156A1

公开(公告)日：2007-10-25

申请号：US11672608

申请日：2007-02-08

申请人： Griselda Bonilla ,  Stephen M. Gates ,  Shom Ponoth ,  Satyanarayana V. Nitta ,  Sampath Purushothaman

发明人： Griselda Bonilla ,  Stephen M. Gates ,  Shom Ponoth ,  Satyanarayana V. Nitta ,  Sampath Purushothaman

IPC分类号： H01L21/4763

CPC分类号： H01L21/76826 ,  H01L21/02074 ,  H01L21/3105 ,  H01L21/31058 ,  H01L21/76883

摘要： A method is described for the repair of process induced damage sustained by low-k organosilicate dielectrics as a result of reactive ion etch, resist strip, wet clean and CMP operations in a hard mask free integration of these dielectrics into microelectronic interconnect structures incorporating a dielectric cap which is an etch stop and barrier layer. In situ reaction of the damaged regions with a suitable silylation agent just prior to a passivation barrier cap deposition is proposed as the most efficacious means to repair all the damage sustained by the dielectric. Variations of this method which include ex situ rather than in situ silylation are also described for use with hard mask free integration with selective barrier caps.

摘要翻译： 描述了一种用于修复由低k有机硅酸盐电介质持续的过程诱导的损伤作为反应离子蚀刻，抗蚀剂条，湿清洁和CMP操作在将这些电介质纳入包含电介质的微电子互连结构的硬掩模中的CMP操作的方法 盖是蚀刻停止层和阻挡层。 在钝化阻挡层沉积之前，损伤区域与合适的甲硅烷基化剂的原位反应被提出作为修复由电介质所承受的所有损伤的最有效手段。 还描述了包括异位原位甲硅烷基化的这种方法的变化，用于与选择性屏障帽的硬掩模自由积分。

公开(公告)号：US20090311859A1

公开(公告)日：2009-12-17

申请号：US12544088

申请日：2009-08-19

申请人： Griselda Bonilla ,  Stephen M. Gates ,  Shom Ponoth ,  Satyanarayana V. Nitta ,  Sampath Purushothaman

发明人： Griselda Bonilla ,  Stephen M. Gates ,  Shom Ponoth ,  Satyanarayana V. Nitta ,  Sampath Purushothaman

IPC分类号： H01L21/3205 ,  H01L21/31

CPC分类号： H01L21/76826 ,  H01L21/02074 ,  H01L21/3105 ,  H01L21/31058 ,  H01L21/76883

摘要： A method of fabricating an interconnect structure on a substrate includes steps of: providing a dielectric with at least one etched opening; filling the at least one etched opening with at least one conductive material; planarizing the conductive material to provide a planarized structure; subjecting the planarized structure to a plasma preclean process; and exposing the planarized structure to a silylating repair agent which is a silane derivative; and forming a dielectric cap layer on the planarized structure.

摘要翻译： 在衬底上制造互连结构的方法包括以下步骤：为电介质提供至少一个蚀刻开口; 用至少一种导电材料填充所述至少一个蚀刻开口; 平面化导电材料以提供平坦化结构; 对平坦化结构进行等离子体预清洗处理; 并将平坦化结构暴露于作为硅烷衍生物的甲硅烷基化修复剂; 以及在所述平坦化结构上形成电介质盖层。

公开(公告)号：US20090140428A1

公开(公告)日：2009-06-04

申请号：US11949189

申请日：2007-12-03

申请人： Griselda Bonilla ,  Daniel C. Edelstein ,  Satyanarayana V. Nitta ,  Takeshi Nogami ,  Shom Ponoth ,  David L. Rath ,  Chih-Chao Yang

发明人： Griselda Bonilla ,  Daniel C. Edelstein ,  Satyanarayana V. Nitta ,  Takeshi Nogami ,  Shom Ponoth ,  David L. Rath ,  Chih-Chao Yang

IPC分类号： H01L23/52 ,  H01L21/4763

CPC分类号： H01L23/5222 ,  H01L21/31144 ,  H01L21/7682 ,  H01L21/76849 ,  H01L21/76852 ,  H01L23/53238 ,  H01L23/53295 ,  H01L2924/0002 ,  H01L2924/00

摘要： A hard mask is formed on an interconnect structure comprising a low-k material layer and a metal feature embedded therein. A block polymer is applied to the hard mask layer, self-assembled, and patterned to form a polymeric matrix of a polymeric block component and containing cylindrical holes. The hard mask and the low-k material layer therebelow are etched to form cavities. A conductive material is plated on exposed metallic surfaces including portions of top surfaces of the metal feature to form metal pads. Metal silicide pads are formed by exposure of the metal pads to a silicon containing gas. An etch is performed to enlarge and merge the cavities in the low-k material layer. The metal feature is protected from the etch by the metal silicide pads. An interconnect structure having an air gap and free of defects to surfaces of the metal feature is formed.

摘要翻译： 在包括低k材料层和嵌入其中的金属特征的互连结构上形成硬掩模。 将嵌段聚合物施加到硬掩模层上，自组装和图案化以形成聚合物嵌段组分的聚合物基质并且包含圆柱形孔。 蚀刻硬掩模和低k材料层以形成空腔。 导电材料镀在暴露的金属表面上，包括金属特征的顶表面的部分以形成金属垫。 金属硅化物焊盘通过将金属焊盘暴露于含硅气体而形成。 进行蚀刻以放大和合并低k材料层中的空腔。 通过金属硅化物焊盘防止金属特征被蚀刻。 形成具有空隙并且没有金属特征表面的缺陷的互连结构。

公开(公告)号：US20110092067A1

公开(公告)日：2011-04-21

申请号：US12972808

申请日：2010-12-20

申请人： Griselda Bonilla ,  Daniel C. Edelstein ,  Satyanarayana V. Nitta ,  Takeshi Nogami ,  Shom Ponoth ,  David L. Rath ,  Chih-Chao Yang

发明人： Griselda Bonilla ,  Daniel C. Edelstein ,  Satyanarayana V. Nitta ,  Takeshi Nogami ,  Shom Ponoth ,  David L. Rath ,  Chih-Chao Yang

IPC分类号： H01L21/4763

CPC分类号： H01L23/5222 ,  H01L21/31144 ,  H01L21/7682 ,  H01L21/76849 ,  H01L21/76852 ,  H01L23/53238 ,  H01L23/53295 ,  H01L2924/0002 ,  H01L2924/00

摘要： A hard mask is formed on an interconnect structure comprising a low-k material layer and a metal feature embedded therein. A block polymer is applied to the hard mask layer, self-assembled, and patterned to form a polymeric matrix of a polymeric block component and containing cylindrical holes. The hard mask and the low-k material layer therebelow are etched to form cavities. A conductive material is plated on exposed metallic surfaces including portions of top surfaces of the metal feature to form metal pads. Metal silicide pads are formed by exposure of the metal pads to a silicon containing gas. An etch is performed to enlarge and merge the cavities in the low-k material layer. The metal feature is protected from the etch by the metal silicide pads. An interconnect structure having an air gap and free of defects to surfaces of the metal feature is formed.

摘要翻译： 在包括低k材料层和嵌入其中的金属特征的互连结构上形成硬掩模。 将嵌段聚合物施加到硬掩模层上，自组装和图案化以形成聚合物嵌段组分的聚合物基质并且包含圆柱形孔。 蚀刻硬掩模和低k材料层以形成空腔。 导电材料镀在暴露的金属表面上，包括金属特征的顶表面的部分以形成金属垫。 金属硅化物焊盘通过将金属焊盘暴露于含硅气体而形成。 进行蚀刻以放大和合并低k材料层中的空腔。 通过金属硅化物焊盘防止金属特征被蚀刻。 形成具有空隙并且没有金属特征表面的缺陷的互连结构。

公开(公告)号：US07884477B2

公开(公告)日：2011-02-08

申请号：US11949189

申请日：2007-12-03

申请人： Griselda Bonilla ,  Daniel C. Edelstein ,  Satyanarayana V. Nitta ,  Takeshi Nogami ,  Shom Ponoth ,  David L. Rath ,  Chih-Chao Yang

发明人： Griselda Bonilla ,  Daniel C. Edelstein ,  Satyanarayana V. Nitta ,  Takeshi Nogami ,  Shom Ponoth ,  David L. Rath ,  Chih-Chao Yang

IPC分类号： H01L23/48 ,  H01L23/52 ,  H01L29/40

CPC分类号： H01L23/5222 ,  H01L21/31144 ,  H01L21/7682 ,  H01L21/76849 ,  H01L21/76852 ,  H01L23/53238 ,  H01L23/53295 ,  H01L2924/0002 ,  H01L2924/00

摘要： A hard mask is formed on an interconnect structure comprising a low-k material layer and a metal feature embedded therein. A block polymer is applied to the hard mask layer, self-assembled, and patterned to form a polymeric matrix of a polymeric block component and containing cylindrical holes. The hard mask and the low-k material layer therebelow are etched to form cavities. A conductive material is plated on exposed metallic surfaces including portions of top surfaces of the metal feature to form metal pads. Metal silicide pads are formed by exposure of the metal pads to a silicon containing gas. An etch is performed to enlarge and merge the cavities in the low-k material layer. The metal feature is protected from the etch by the metal silicide pads. An interconnect structure having an air gap and free of defects to surfaces of the metal feature is formed.

摘要翻译： 在包括低k材料层和嵌入其中的金属特征的互连结构上形成硬掩模。 将嵌段聚合物施加到硬掩模层上，自组装和图案化以形成聚合物嵌段组分的聚合物基质并且包含圆柱形孔。 蚀刻硬掩模和低k材料层以形成空腔。 导电材料镀在暴露的金属表面上，包括金属特征的顶表面的部分以形成金属垫。 金属硅化物焊盘通过将金属焊盘暴露于含硅气体而形成。 进行蚀刻以放大和合并低k材料层中的空腔。 通过金属硅化物焊盘防止金属特征被蚀刻。 形成具有空隙并且没有金属特征表面的缺陷的互连结构。

公开(公告)号：US08003520B2

公开(公告)日：2011-08-23

申请号：US12972808

申请日：2010-12-20

申请人： Griselda Bonilla ,  Daniel C. Edelstein ,  Satyanarayana V. Nitta ,  Takeshi Nogami ,  Shom Ponoth ,  David L. Rath ,  Chih-Chao Yang

发明人： Griselda Bonilla ,  Daniel C. Edelstein ,  Satyanarayana V. Nitta ,  Takeshi Nogami ,  Shom Ponoth ,  David L. Rath ,  Chih-Chao Yang

IPC分类号： H01L21/4763

CPC分类号： H01L23/5222 ,  H01L21/31144 ,  H01L21/7682 ,  H01L21/76849 ,  H01L21/76852 ,  H01L23/53238 ,  H01L23/53295 ,  H01L2924/0002 ,  H01L2924/00

摘要： A hard mask is formed on an interconnect structure comprising a low-k material layer and a metal feature embedded therein. A block polymer is applied to the hard mask layer, self-assembled, and patterned to form a polymeric matrix of a polymeric block component and containing cylindrical holes. The hard mask and the low-k material layer therebelow are etched to form cavities. A conductive material is plated on exposed metallic surfaces including portions of top surfaces of the metal feature to form metal pads. Metal silicide pads are formed by exposure of the metal pads to a silicon containing gas. An etch is performed to enlarge and merge the cavities in the low-k material layer. The metal feature is protected from the etch by the metal silicide pads. An interconnect structure having an air gap and free of defects to surfaces of the metal feature is formed.