-
公开(公告)号:US10962558B2
公开(公告)日:2021-03-30
申请号:US15860832
申请日:2018-01-03
Applicant: Hitachi High-Technologies Corporation
Inventor: Akihiro Yasui , Hitoshi Tokieda , Toshihide Orihashi , Yoshiaki Saito , Naoto Suzuki
Abstract: An automatic analyzer is capable of ensuring sufficient nozzle cleaning and suppressing of deterioration in the accuracy of analysis. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not, and if less, a cleaning pattern is selected by making a judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value. If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more, another cleaning pattern selected by making the judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value.
-
2.
公开(公告)号:US10539584B2
公开(公告)日:2020-01-21
申请号:US15534628
申请日:2015-12-07
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor: Yosuke Horie , Tomohiro Inoue , Hitoshi Tokieda , Takamichi Mori
Abstract: A CTS nozzle achieves the object of reducing rubber chips produced when the CTS nozzle is inserted into and extracted from a rubber plug of a sample container during dispensing of a sample, thereby inhibiting the wear of the tip of the CTS nozzle. The CTS nozzle has two cut surfaces at its tip, and the pressure applied from the rubber when the nozzle is inserted into the rubber plug is dispersed onto the two cut surfaces without being deflected onto one of the cut surfaces. The pressure applied to the nozzle due to the resilience of the rubber being pushed away by the nozzle is thus dispersed and the rubber chips produced by the friction between the cut surfaces of the nozzle and the rubber are reduced. As a result of the reduced friction, the wear of the tip of the nozzle is minimized.
-
公开(公告)号:US11009515B2
公开(公告)日:2021-05-18
申请号:US16331583
申请日:2017-08-04
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor: Takuya Takahashi , Hitoshi Tokieda , Eiichiro Takada , Masashi Fukaya
Abstract: An automatic analyzer capable of controlling an interval between the tip of a sample nozzle and the bottom of a reaction container regardless of individual differences between reaction containers and sample nozzles and suppressing adhesion of a sample to the sample nozzle is disclosed. Sample nozzles 13a and 14a are moved toward the bottom surface of a reaction container 2, the movement of the sample nozzles is stopped at a point in time when a stop position detector 46 detects a stop position detection plate 45, the sample nozzles are ascended from the stop position to a position where the stop position detection plate 45 separates from a detection range of the stop position detector 46, and an arm 44 is moved upward by a moving distance stored in a memory.
-
公开(公告)号:US20180128847A1
公开(公告)日:2018-05-10
申请号:US15860832
申请日:2018-01-03
Applicant: Hitachi High-Technologies Corporation
Inventor: Akihiro Yasui , Hitoshi Tokieda , Toshihide Orihashi , Yoshiaki Saito , Naoto Suzuki
CPC classification number: G01N35/025 , G01N35/00584 , G01N35/1004
Abstract: An automatic analyzer is capable of ensuring sufficient nozzle cleaning and suppressing of deterioration in the accuracy of analysis. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not, and if less, a cleaning pattern is selected by making a judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value. If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more, another cleaning pattern selected by making the judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value.
-
公开(公告)号:US10184948B2
公开(公告)日:2019-01-22
申请号:US15245237
申请日:2016-08-24
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor: Akihiro Yasui , Yoshihiro Suzuki , Hitoshi Tokieda
Abstract: An automated analyzer maintains high processing capacity and dispensation accuracy even when items requiring dilution/pretreatment and general reaction measurement are mixed. A plurality of sample dispensing mechanisms are independently driven and each include a sample collection position, a sample nozzle for collecting the sample, and a washing tank for washing the sample nozzle. The sample dispensing mechanisms are configured to collect the sample from a plurality of sample collection positions and are operated independently to perform sample dispensation into reaction containers on a reaction disc. At least one of the sample dispensing mechanisms is provided for each of a sample requiring dilution/pretreatment and a sample that does not require dilution/pretreatment. The automated analyzer is provided with a control means for causing the respective mechanisms to be operated in a dedicated manner. The sample is dispensed such that no vacancy is created in the reaction containers.
-
公开(公告)号:US10094846B2
公开(公告)日:2018-10-09
申请号:US14956663
申请日:2015-12-02
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor: Hitoshi Tokieda , Yoshimitsu Takagi , Takeshi Shibuya , Masashi Akutsu
Abstract: A sample-processing system that improves total system processing efficiency, and reduces a sample-processing time, by establishing a functionally independent relationship between a rack conveyance block with rack supply, conveyance, and recovery functions, and a processing block with sample preprocessing, analysis, and other functions. A buffer unit with random accessibility to multiple racks standing by for processing is combined with each of multiple processing units to form a pair, and the system is constructed to load and unload racks into and from the buffer unit through the rack conveyance block so that one unprocessed rack is loaded into the buffer unit and then upon completion of process steps up to automatic retesting, unloaded from the buffer unit. Functional dependence between any processing unit and a conveyance unit is thus eliminated.
-
公开(公告)号:US09442128B2
公开(公告)日:2016-09-13
申请号:US14352192
申请日:2012-10-12
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor: Akihiro Yasui , Yoshihiro Suzuki , Hitoshi Tokieda
CPC classification number: G01N35/0092 , G01N35/025 , G01N35/04 , G01N35/1002 , G01N35/1009 , G01N2035/0094 , G01N2035/0413 , G01N2035/0444 , G01N2035/1032
Abstract: An automated analyzer maintains high processing capacity and dispensation accuracy even when items requiring dilution/pretreatment and general reaction measurement are mixed. A plurality of sample dispensing mechanisms are independently driven and each include a sample collection position, a sample nozzle for collecting the sample, and a washing tank for washing the sample nozzle. The sample dispensing mechanisms are configured to collect the sample from a plurality of sample collection positions and are operated independently to perform sample dispensation into reaction containers on a reaction disc. At least one of the sample dispensing mechanisms is provided for each of a sample requiring dilution/pretreatment and a sample that does not require dilution/pretreatment. The automated analyzer is provided with a control means for causing the respective mechanisms to be operated in a dedicated manner. The sample is dispensed such that no vacancy is created in the reaction containers.
Abstract translation: 即使在需要稀释/预处理和一般反应测量的物品混合的情况下,自动分析仪也能保持高处理能力和分配精度。 多个样品分送机构被独立地驱动,并且各自包括样品收集位置,用于收集样品的样品喷嘴和用于清洗样品喷嘴的洗涤槽。 样品分配机构被配置为从多个样品收集位置收集样品,并且独立地操作以将样品分配进行到反应盘上的反应容器中。 为需要稀释/预处理的样品和不需要稀释/预处理的样品中的每一个提供至少一个样品分配机构。 自动分析装置设置有用于使各机构以专用方式操作的控制装置。 分配样品使得在反应容器中不产生空位。
-
公开(公告)号:US11175301B2
公开(公告)日:2021-11-16
申请号:US15752616
申请日:2016-08-23
Inventor: Takamichi Mori , Kouhei Nonaka , Masaki Hara , Masato Ishizawa , Hitoshi Tokieda , Stephan Sattler
Abstract: An automatic analyzer includes: a reagent mounting unit 103 in which a plurality of reagent bottles 10 are installed when a reagent bottle 10 is loaded into the automatic analyzer; a reagent conveying mechanism 101 including a gripper mechanism 106; and a reagent mounting mechanism 102 for moving the reagent mounting unit 103 between an installation position at which an operator installs the reagent bottle 10 in the reagent mounting unit 103 and a position at which the gripper mechanism 106 grips the reagent bottle 10. It is thereby possible to achieve saving of a mechanism installation space and reduction of the number of constituent components, automatically carry out an operation from opening of the reagent bottle to loading of the reagent bottle into the reagent disk, and alleviate an operator's burden.
-
公开(公告)号:US09891240B2
公开(公告)日:2018-02-13
申请号:US14418614
申请日:2013-07-25
Applicant: Hitachi High-Technologies Corporation
Inventor: Akihiro Yasui , Hitoshi Tokieda , Toshihide Orihashi , Yoshiaki Saito , Naoto Suzuki
CPC classification number: G01N35/025 , G01N35/00584 , G01N35/1004
Abstract: An automatic analyzer is capable of ensuring sufficient nozzle cleaning and suppressing of deterioration in the accuracy of analysis. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not, and if less, a cleaning pattern is selected by making a judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value. If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more, another cleaning pattern selected by making the judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value.
-
公开(公告)号:US20140286824A1
公开(公告)日:2014-09-25
申请号:US14352192
申请日:2012-10-12
Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
Inventor: Akihiro Yasui , Yoshihiro Suzuki , Hitoshi Tokieda
IPC: G01N35/10
CPC classification number: G01N35/0092 , G01N35/025 , G01N35/04 , G01N35/1002 , G01N35/1009 , G01N2035/0094 , G01N2035/0413 , G01N2035/0444 , G01N2035/1032
Abstract: An automated analyzer maintains high processing capacity and dispensation accuracy even when items requiring dilution/pretreatment and general reaction measurement are mixed. A plurality of sample dispensing mechanisms are independently driven and each include a sample collection position, a sample nozzle for collecting the sample, and a washing tank for washing the sample nozzle. The sample dispensing mechanisms are configured to collect the sample from a plurality of sample collection positions and are operated independently to perform sample dispensation into reaction containers on a reaction disc. At least one of the sample dispensing mechanisms is provided for each of a sample requiring dilution/pretreatment and a sample that does not require dilution/pretreatment. The automated analyzer is provided with a control means for causing the respective mechanisms to be operated in a dedicated manner. The sample is dispensed such that no vacancy is created in the reaction containers.
Abstract translation: 即使在需要稀释/预处理和一般反应测量的物品混合的情况下,自动分析仪也能保持高处理能力和分配精度。 多个样品分送机构被独立地驱动,并且各自包括样品收集位置,用于收集样品的样品喷嘴和用于清洗样品喷嘴的洗涤槽。 样品分配机构被配置为从多个样品收集位置收集样品,并且独立地操作以将样品分配进行到反应盘上的反应容器中。 为需要稀释/预处理的样品和不需要稀释/预处理的样品中的每一个提供至少一个样品分配机构。 自动分析装置设置有用于使各机构以专用方式操作的控制装置。 分配样品使得在反应容器中不产生空位。
-
-
-
-
-
-
-
-
-