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公开(公告)号:US20210225745A1
公开(公告)日:2021-07-22
申请号:US16744967
申请日:2020-01-16
Applicant: Infineon Technologies AG
Inventor: Robert Fehler , Eung San Cho , Danny Clavette , Petteri Palm
IPC: H01L23/495 , H01L25/07 , H01L23/00
Abstract: A packaged half-bridge circuit includes a carrier having a dielectric core and a first layer of metallization formed on an upper surface of the carrier, first and second semiconductor chips, each including a first terminal, a second terminal, and a control terminal, and a conductive connector mounted on the upper surface of the carrier and electrically connected to the first layer of metallization. The first semiconductor chip is configured as a high-side switch of the half-bridge circuit. The second semiconductor chip is configured as a low-side switch of the half-bridge circuit. At least one of the first and second semiconductor chips is embedded within the dielectric core of the carrier. The conductive connector is electrically connected to one of the first and second terminals from one or both of the first and second semiconductor chips.
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公开(公告)号:US11848262B2
公开(公告)日:2023-12-19
申请号:US17176678
申请日:2021-02-16
Applicant: Infineon Technologies AG
Inventor: Angela Kessler , Robert Carroll , Robert Fehler
IPC: H01L23/498 , H01L25/07 , H01L21/48 , H01L23/00
CPC classification number: H01L23/49844 , H01L21/4853 , H01L24/16 , H01L25/072 , H01L2224/16227 , H01L2924/19104
Abstract: A semiconductor assembly includes an interposer that includes an insulating substrate, a plurality of upper contact pads on an upper surface of the substrate, and a plurality of lower contact pads on a lower surface of the substrate, a semiconductor package that includes a semiconductor die embedded within a package body and a plurality of package terminals exposed from the package body, a first passive electrical element that includes first and second terminals, a first electrical connection between the first terminal of the first passive electrical element and a first one of the lower contact pads via the interposer, a second electrical connection between the second terminal of the first passive electrical element and a first one of the package terminals, and a third electrical connection between a second one of the package terminals and a second one of the lower contact pads via the interposer.
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公开(公告)号:US20220262716A1
公开(公告)日:2022-08-18
申请号:US17176678
申请日:2021-02-16
Applicant: Infineon Technologies AG
Inventor: Angela Kessler , Robert Carroll , Robert Fehler
IPC: H01L23/498 , H01L25/07 , H01L23/00 , H01L21/48
Abstract: A semiconductor assembly includes an interposer that includes an insulating substrate, a plurality of upper contact pads on an upper surface of the substrate, and a plurality of lower contact pads on a lower surface of the substrate, a semiconductor package that includes a semiconductor die embedded within a package body and a plurality of package terminals exposed from the package body, a first passive electrical element that includes first and second terminals, a first electrical connection between the first terminal of the first passive electrical element and a first one of the lower contact pads via the interposer, a second electrical connection between the second terminal of the first passive electrical element and a first one of the package terminals, and a third electrical connection between a second one of the package terminals and a second one of the lower contact pads via the interposer.
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公开(公告)号:US20240079310A1
公开(公告)日:2024-03-07
申请号:US18389506
申请日:2023-11-14
Applicant: Infineon Technologies AG
Inventor: Angela Kessler , Robert Carroll , Robert Fehler
IPC: H01L23/498 , H01L21/48 , H01L23/00 , H01L25/07
CPC classification number: H01L23/49844 , H01L21/4853 , H01L24/16 , H01L25/072 , H01L2224/16227 , H01L2924/19104
Abstract: A method includes providing an interposer that includes an electrically insulating substrate, upper contact pads disposed on an upper surface, and lower contact pads disposed on a lower surface, providing a semiconductor package that includes a semiconductor die embedded within a package body and a plurality of package terminals exposed from the package body, providing a first passive electrical element that comprises first and second terminals, forming a first electrical connection between the first terminal of the first passive electrical element and a first one of the lower contact pads via the interposer, forming a second electrical connection between the second terminal of the first passive electrical element and a first one of the package terminals, and forming a third electrical connection between a second one of the package terminals and a second one of the lower contact pads via the interposer.
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公开(公告)号:US20220028840A1
公开(公告)日:2022-01-27
申请号:US17384217
申请日:2021-07-23
Applicant: Infineon Technologies AG
Inventor: Robert Fehler , Sergey Yuferev
Abstract: A circuitry is provided. The circuitry may include a power stage including a first transistor and a second transistor, an encapsulation including encapsulation material encapsulating the power stage, wherein the first transistor and the second transistor are arranged in an L-shape with respect to each other along their long axes, and a passive electronic component arranged on or embedded within the encapsulation at least partially, in top view, within a rectangular area defined by the L-shape configuration and further next to the first transistor and next to the second transistor.
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公开(公告)号:US12131988B2
公开(公告)日:2024-10-29
申请号:US18389506
申请日:2023-11-14
Applicant: Infineon Technologies AG
Inventor: Angela Kessler , Robert Carroll , Robert Fehler
IPC: H01L23/00 , H01L21/48 , H01L23/498 , H01L25/07
CPC classification number: H01L23/49844 , H01L21/4853 , H01L24/16 , H01L25/072 , H01L2224/16227 , H01L2924/19104
Abstract: A method includes providing an interposer that includes an electrically insulating substrate, upper contact pads disposed on an upper surface, and lower contact pads disposed on a lower surface, providing a semiconductor package that includes a semiconductor die embedded within a package body and a plurality of package terminals exposed from the package body, providing a first passive electrical element that comprises first and second terminals, forming a first electrical connection between the first terminal of the first passive electrical element and a first one of the lower contact pads via the interposer, forming a second electrical connection between the second terminal of the first passive electrical element and a first one of the package terminals, and forming a third electrical connection between a second one of the package terminals and a second one of the lower contact pads via the interposer.
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公开(公告)号:US20240312799A1
公开(公告)日:2024-09-19
申请号:US18122895
申请日:2023-03-17
Applicant: Infineon Technologies AG
Inventor: Robert Fehler , Angela Kessler , Kushal Kshirsagar , Emanuele Bodano , Martin Benisek
IPC: H01L21/56 , H01L23/00 , H01L23/31 , H01L23/373 , H01L23/538
CPC classification number: H01L21/565 , H01L23/3121 , H01L23/3735 , H01L23/5383 , H01L23/5385 , H01L24/32 , H01L2224/32245 , H01L2924/13055 , H01L2924/13091 , H01L2924/1815
Abstract: A semiconductor package includes a laminate package substrate, first and second power transistor dies embedded within the laminate package substrate, a driver die embedded within the laminate package substrate, a plurality of I/O routings electrically connected with I/O terminals of the driver die, a switching signal pad electrically connected with a second load terminal of the first power transistor die and a first load terminal of the second power transistor die, and a shielding pad that is configured to electrically shield at least one of the I/O routings from the switching signal pad during operation of the first and second power transistor dies.
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公开(公告)号:US11469164B2
公开(公告)日:2022-10-11
申请号:US16744967
申请日:2020-01-16
Applicant: Infineon Technologies AG
Inventor: Robert Fehler , Eung San Cho , Danny Clavette , Petteri Palm
IPC: H01L23/48 , H01L23/12 , H01L23/34 , H01L21/00 , H05K7/00 , H05K1/18 , H05K7/10 , H05K7/18 , H01L23/495 , H01L25/07 , H01L23/00
Abstract: A packaged half-bridge circuit includes a carrier having a dielectric core and a first layer of metallization formed on an upper surface of the carrier, first and second semiconductor chips, each including a first terminal, a second terminal, and a control terminal, and a conductive connector mounted on the upper surface of the carrier and electrically connected to the first layer of metallization. The first semiconductor chip is configured as a high-side switch of the half-bridge circuit. The second semiconductor chip is configured as a low-side switch of the half-bridge circuit. At least one of the first and second semiconductor chips is embedded within the dielectric core of the carrier. The conductive connector is electrically connected to one of the first and second terminals from one or both of the first and second semiconductor chips.
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公开(公告)号:US10916484B2
公开(公告)日:2021-02-09
申请号:US16014745
申请日:2018-06-21
Applicant: Infineon Technologies AG
Inventor: Robert Fehler , Francesca Arcioni , Christian Geissler , Walter Hartner , Gerhard Haubner , Thorsten Meyer , Martin Richard Niessner , Maciej Wojnowski
IPC: H01L23/498 , H01L23/31 , H01L23/00 , H01L21/683 , H01L23/538 , H01L21/56
Abstract: An electronic device is disclosed. In one example, the electronic device includes a solder ball, a dielectric layer comprising an opening, and a redistribution layer (RDL) comprising an RDL pad connected with the solder ball. The RDL pad including at least one void, the void being disposed at least in partial in an area of the RDL pad laterally outside of the opening of the dielectric layer.
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公开(公告)号:US20180374769A1
公开(公告)日:2018-12-27
申请号:US16014745
申请日:2018-06-21
Applicant: Infineon Technologies AG
Inventor: Robert Fehler , Francesca Arcioni , Christian Geissler , Walter Hartner , Gerhard Haubner , Thorsten Meyer , Martin Richard Niessner , Maciej Wojnowski
IPC: H01L23/31 , H01L23/00 , H01L21/683 , H01L21/56 , H01L23/498 , H01L23/538
Abstract: An electronic device is disclosed. In one example, the electronic device includes a solder ball, a dielectric layer comprising an opening, and a redistribution layer (RDL) comprising an RDL pad connected with the solder ball. The RDL pad including at least one void, the void being disposed at least in partial in an area of the RDL pad laterally outside of the opening of the dielectric layer.
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