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Patent Agency Ranking
公开(公告)号：US10388506B2
公开(公告)日：2019-08-20
申请号：US15321563
申请日：2015-12-04
Applicant: Korea Basic Science Institute
Inventor： Mo Yang , Seung Yong Kim , Hyun Sik Kim , Wan Seop Jeong
Abstract: Provided is a time-of-flight mass spectrometer including: an ionization part receiving electron beams to thereby emit ions; a cold electron supply part injecting the electron beams to the ionization part; an ion detection part detecting the ions emitted from the ionization part; and an ion separation part connecting the ionization part and the ion detection part, wherein the cold electron supply part includes a microchannel plate receiving ultraviolet rays to thereby emit the electron beams, the ions emitted from the ionization part pass through the ion separation part to thereby reach the ion detection part, and the ion separation part has a straight tube shape.
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公开(公告)号：US20140158880A1
公开(公告)日：2014-06-12
申请号：US14097848
申请日：2013-12-05
Applicant: Korea Basic Science Institute
Inventor： Mo Yang , Seung Yong Kim , Hyun Sik Kim
IPC: H01J49/06
CPC classification number: H01J49/065 , H01J49/421 , H01J49/424 , Y10T29/49826
Abstract: An ion trap mass spectrometer is provided, including: an electron emitter; an ion trap storing ions generated by ionization resulting from an impact with electrons emitted from the electron emitter; a secondary ion filter for blocking out secondary ions generated due to ions selectively released by the ion trap; and a detector detecting ions selectively released from the ion trap, wherein the electron emitter, the ion trap, the secondary ion filter, and the ion detector are arranged on the same axis, so that a pure mass spectrum can be measured by excluding the secondary ions which are causes of background noise signals in the procedure of detection of the ions by the ion trap mass spectrometer.
Abstract translation: 提供了一种离子阱质谱仪，包括：电子发射体; 离子阱，其存储由从电子发射体发射的电子的撞击而产生的离子产生的离子; 用于阻断由离子阱选择性释放的离子产生的二次离子的二次离子过滤器; 以及检测器，其检测离子阱选择性释放的离子，其中电子发射体，离子阱，二次离子过滤器和离子检测器被布置在相同的轴上，使得可以通过排除次级 离子是离子阱质谱仪检测离子的过程中背景噪声信号的原因。
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3.发明授权公开(公告)号：US09443705B2
公开(公告)日：2016-09-13
申请号：US14851401
申请日：2015-09-11
Applicant: Korea Basic Science Institute
Inventor： Seung Yong Kim , Mo Yang , Hyun Sik Kim
CPC classification number: H01J49/0022 , H01J49/022 , H01J49/427 , H03F3/19 , H03F2200/451
Abstract: Provided is a multiple frequency Radio Frequency (RF) amplifier. The multiple frequency RF amplifier includes a waveform generation circuit configured to generate an RF signal by amplitude and frequency-modulating a reference waveform signal, a drive amplifier circuit configured to drive-amplify the RF signal, and a power amplifier circuit configured to generate a multiple frequency RF voltage signal through a power amplification of the drive-amplified RF signal and output the multiple frequency RF voltage signal to an ion trap for a mass spectrometry.
Abstract translation: 提供了一种多频射频（RF）放大器。 多频RF放大器包括：波形发生电路，被配置为通过幅度产生RF信号并对参考波形信号进行频率调制;驱动放大器电路，被配置为驱动放大RF信号;以及功率放大器电路，被配置为产生多个 通过驱动放大的RF信号的功率放大来输出频率RF电压信号，并将多频RF电压信号输出到用于质谱的离子阱。
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公开(公告)号：US10037876B2
公开(公告)日：2018-07-31
申请号：US15320953
申请日：2015-12-09
Applicant: Korea Basic Science Institute
Inventor： Seung Yong Kim , Mo Yang , Hyun Sik Kim
CPC classification number: H01J49/08 , H01J49/147 , H01J49/422 , H01J49/424
Abstract: The present invention relates to an electron bean injection control of a mass spectrometer. A mass spectrometer of the present invention includes: a reference waveform generator configured to generate a reference waveform signal having one type of a square wave and a sine wave, a waveform generator configured to generate a sync signal synchronized with the reference waveform signal; an RF module configured to generate an RF voltage signal from the reference waveform signal and apply the RF voltage signal to an RF electrode in the ion trap, an electron beam generator configured to control an operation of an ultraviolet (UV) diode for generating an electron beam injected into the ion trap according to an input control signal, and a control circuit configured to generate the control signal by using the square wave signal.
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公开(公告)号：US09058965B2
公开(公告)日：2015-06-16
申请号：US14097848
申请日：2013-12-05
Applicant: Korea Basic Science Institute
Inventor： Mo Yang , Seung Yong Kim , Hyun Sik Kim
CPC classification number: H01J49/065 , H01J49/421 , H01J49/424 , Y10T29/49826
Abstract: An ion trap mass spectrometer is provided, including: an electron emitter; an ion trap storing ions generated by ionization resulting from an impact with electrons emitted from the electron emitter; a secondary ion filter for blocking out secondary ions generated due to ions selectively released by the ion trap; and a detector detecting ions selectively released from the ion trap, wherein the electron emitter, the ion trap, the secondary ion filter, and the ion detector are arranged on the same axis, so that a pure mass spectrum can be measured by excluding the secondary ions which are causes of background noise signals in the procedure of detection of the ions by the ion trap mass spectrometer.
Abstract translation: 提供了一种离子阱质谱仪，包括：电子发射体; 离子阱，其存储由从电子发射体发射的电子的撞击而产生的离子产生的离子; 用于阻断由离子阱选择性释放的离子产生的二次离子的二次离子过滤器; 以及检测器，其检测离子阱选择性释放的离子，其中电子发射体，离子阱，二次离子过滤器和离子检测器被布置在相同的轴上，使得可以通过排除次级 离子是离子阱质谱仪检测离子的过程中背景噪声信号的原因。
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