Optical filter suitable for dealing with a radiation of variable incidence and detector including said filter
    2.
    发明授权
    Optical filter suitable for dealing with a radiation of variable incidence and detector including said filter 有权
    适用于处理可变入射辐射的光学滤波器和包括所述滤波器的检测器

    公开(公告)号:US08933389B2

    公开(公告)日:2015-01-13

    申请号:US13093084

    申请日:2011-04-25

    CPC classification number: G02B5/288 G02B5/201 G02B5/289

    Abstract: An optical filter for filtering an electromagnetic radiation of variable angle of incidence, includes a stack of at least one dielectric or semi-conductor layer arranged between two partially reflective layers, said stack defining a set of Fabry-Pérot cavities set to a predetermined wavelength. The average refractive index of the dielectric or semi-conductor layer is variable in a plane orthogonal to the direction of the stack so as to compensate the effects of the variation in the angle of incidence of the electromagnetic radiation on the transmission spectrum of the cavities.

    Abstract translation: 用于对可变入射角的电磁辐射进行滤波的滤光器包括布置在两个部分反射层之间的至少一个介电层或半导体层的叠层,所述叠层限定设置为预定波长的一组法布里 - 珀罗腔。 电介质或半导体层的平均折射率在与堆叠方向正交的平面中是可变的,以补偿电磁辐射入射角对空腔透射光谱的变化的影响。

    PHOTODETECTOR AND CORRESPONDING DETECTION MATRIX
    3.
    发明申请
    PHOTODETECTOR AND CORRESPONDING DETECTION MATRIX 审中-公开
    光电检测器和相应检测矩阵

    公开(公告)号:US20130161775A1

    公开(公告)日:2013-06-27

    申请号:US13820187

    申请日:2011-09-09

    Abstract: The invention relates to a photodetector intended for the detection of incident light radiation in the visible and close infrared region, said photodetector comprising: a light-radiation-absorption structure (10) comprising a semiconductor material of index n1 and including a surface (13) exposed to the incident light radiation, and electrical connection means in contact with the aforementioned structure in order to convey a detection signal produced by the structure in response to the light radiation. The invention is characterised in that light-radiation-focusing means (12) are provided on the exposed surface (13), said means being formed by a single nanostructure having dimensions smaller than the wavelength of the light radiation in all directions of space.

    Abstract translation: 本发明涉及一种用于检测可见光和近红外区域中的入射光辐射的光电检测器,所述光电检测器包括:包含折射率n1并包括表面(13)的半导体材料的光辐射吸收结构(10) 暴露于入射光辐射,以及与上述结构接触的电连接装置,以便响应于光辐射传送由结构产生的检测信号。 本发明的特征在于,在曝光表面(13)上设置光辐射聚焦装置(12),所述装置由尺寸小于所有空间方向的光辐射波长的单一纳米结构形成。

    FILTERING MATRIX STRUCTURE, ASSOCIATED IMAGE SENSOR AND 3D MAPPING DEVICE
    4.
    发明申请
    FILTERING MATRIX STRUCTURE, ASSOCIATED IMAGE SENSOR AND 3D MAPPING DEVICE 失效
    滤波矩阵结构,相关图像传感器和3D映射器件

    公开(公告)号:US20120085944A1

    公开(公告)日:2012-04-12

    申请号:US13231272

    申请日:2011-09-13

    Abstract: Filtering matrix structure comprising at least three color filters and a plurality of near Infrared filters, each one of the color filters and the near Infrared filters having an optimum transmission frequency, wherein the filtering matrix structure is made of n metal layers (m1, m2, m3) and n substantially transparent layers (d1, d2, d3) which alternate between a first metal layer (m1) and an nth substantially transparent layer (d3), each of the n metal layers (m1, m2, m3) having a constant thickness and at least one substantially transparent layer having a variable thickness which sets the optimum transmission frequency of each color filter and each near Infrared filter, n being an integer larger than or equal to 2.Application to 3D mapping and imaging.

    Abstract translation: 滤波矩阵结构包括至少三个滤色器和多个近红外滤光器,每个滤色器和近红外滤光器具有最佳透射频率,其中滤光矩阵结构由n个金属层(m1,m2, m3)和在第一金属层(m1)和第n基本透明层(d3)之间交替的n个基本上透明的层(d1,d2,d3),n个金属层(m1,m2,m3)中的每一个具有常数 厚度和至少一个具有可变厚度的基本上透明的层,其设置每个滤色器和每个近红外滤光器的最佳透射频率,n是大于或等于2的整数。应用于3D映射和成像。

    Ultra-sensitive optical detector with high time resolution
    5.
    发明授权
    Ultra-sensitive optical detector with high time resolution 有权
    超灵敏光学检测器,具有高分辨率

    公开(公告)号:US07928386B2

    公开(公告)日:2011-04-19

    申请号:US11911667

    申请日:2006-04-21

    Abstract: An ultra-sensitive optical detector with large time resolution, using a surface plasmon. The optical detector is configured to detect at least one photon, and including a dielectric substrate, and on the substrate, at least one bolometric detection component, that generates an electrical signal from the energy of received photon(s). Additionally, at least one coupling component is formed on the substrate, distinct from the detection component and including a metal component, and generates a surface plasmon by interaction with the photon(s) and guiding the plasmon right up to the detection component, which then absorbs the energy of the surface plasmon.

    Abstract translation: 使用表面等离子体激光器,具有较大时间分辨率的超灵敏光学检测器。 光学检测器被配置为检测至少一个光子,并且包括电介质基板,并且在基板上,至少一个测温检测部件,其从所接收的光子的能量产生电信号。 此外,至少一个耦合部件形成在衬底上,不同于检测部件并且包括金属部件,并且通过与光子的相互作用并且将等离子体激元引导到检测部件来产生表面等离子体激元, 吸收表面等离子体的能量。

    High time-resolution ultrasensitive optical detector, using grating coupling
    6.
    发明授权
    High time-resolution ultrasensitive optical detector, using grating coupling 失效
    高分辨率超灵敏光学检测器,采用光栅耦合

    公开(公告)号:US07763854B2

    公开(公告)日:2010-07-27

    申请号:US11861876

    申请日:2007-09-26

    Applicant: Laurent Frey

    Inventor: Laurent Frey

    CPC classification number: G01J1/42 G01J1/02 G01J1/0209 G01J1/04 G01J1/0407

    Abstract: This detector is intended to detect at least one photon and comprises a dielectric substrate (30), of index nO; a detecting element (32) forming a serpentine, placed on the substrate and generating a signal using the energy of the photon(s); a dielectric grating, formed of lines of index nH, alternating with lines of index nB, avec nH>nO and nH>nB, the grating being placed above the detecting element, the set grating-element presenting a resonant absorption in a given incidence and for a given polarisation; and a superstratum (40) having a refractive index ni, this superstratum being placed above the one-dimensional dielectric grating, nH being furthermore greater than ni.

    Abstract translation: 该检测器旨在检测至少一个光子并且包括指数为n0的电介质基板(30); 形成蛇形的检测元件(32),放置在基板上并使用光子的能量产生信号; 由折射率nH的线形成的介质光栅,与索引nB,avec nH> nO和nH> nB的线交替,光栅放置在检测元件的上方,所设置的光栅元件在给定的入射下呈现谐振吸收, 对于给定的极化; 和具有折射率为ni的上层(40),该超层位于一维介质光栅上方,nH还大于ni。

    Filtering matrix structure, associated image sensor and 3D mapping device
    7.
    发明授权
    Filtering matrix structure, associated image sensor and 3D mapping device 失效
    过滤矩阵结构,相关图像传感器和3D映射设备

    公开(公告)号:US08766385B2

    公开(公告)日:2014-07-01

    申请号:US13231272

    申请日:2011-09-13

    Abstract: Filtering matrix structure comprising at least three color filters and a plurality of near Infrared filters, each one of the color filters and the near Infrared filters having an optimum transmission frequency, wherein the filtering matrix structure is made of n metal layers (m1, m2, m3) and n substantially transparent layers (d1, d2, d3) which alternate between a first metal layer (m1) and an nth substantially transparent layer (d3), each of the n metal layers (m1, m2, m3) having a constant thickness and at least one substantially transparent layer having a variable thickness which sets the optimum transmission frequency of each color filter and each near Infrared filter, n being an integer larger than or equal to 2.Application to 3D mapping and imaging.

    Abstract translation: 滤波矩阵结构包括至少三个滤色器和多个近红外滤光器,每个滤色器和近红外滤光器具有最佳透射频率,其中滤光矩阵结构由n个金属层(m1,m2, m3)和在第一金属层(m1)和第n基本透明层(d3)之间交替的n个基本上透明的层(d1,d2,d3),n个金属层(m1,m2,m3)中的每一个具有常数 厚度和至少一个具有可变厚度的基本上透明的层,其设置每个滤色器和每个近红外滤光器的最佳透射频率,n是大于或等于2的整数。应用于3D映射和成像。

    OPTICAL FILTER SUITABLE FOR DEALING WITH A RADIATION OF VARIABLE INCIDENCE AND DETECTOR INCLUDING SAID FILTER
    9.
    发明申请
    OPTICAL FILTER SUITABLE FOR DEALING WITH A RADIATION OF VARIABLE INCIDENCE AND DETECTOR INCLUDING SAID FILTER 有权
    光学滤波器适用于可变发射和检测器的辐射处理,包括滤波器

    公开(公告)号:US20110290982A1

    公开(公告)日:2011-12-01

    申请号:US13093084

    申请日:2011-04-25

    CPC classification number: G02B5/288 G02B5/201 G02B5/289

    Abstract: An optical filter for filtering an electromagnetic radiation of variable angle of incidence, includes a stack of at least one dielectric or semi-conductor layer arranged between two partially reflective layers, said stack defining a set of Fabry-Pérot cavities set to a predetermined wavelength. The average refractive index of the dielectric or semi-conductor layer is variable in a plane orthogonal to the direction of the stack so as to compensate the effects of the variation in the angle of incidence of the electromagnetic radiation on the transmission spectrum of the cavities.

    Abstract translation: 用于对可变入射角的电磁辐射进行滤波的滤光器包括布置在两个部分反射层之间的至少一个介电层或半导体层的叠层,所述叠层限定设置为预定波长的一组法布里 - 珀罗腔。 电介质或半导体层的平均折射率在与堆叠方向正交的平面中是可变的,以补偿电磁辐射入射角对空腔透射光谱的变化的影响。

    Ultrasensitive optical detector having a large temporal resolution and using a waveguide, and methods for producing said detector
    10.
    发明授权
    Ultrasensitive optical detector having a large temporal resolution and using a waveguide, and methods for producing said detector 有权
    具有大的时间分辨率和使用波导的超灵敏光学检测器以及用于产生所述检测器的方法

    公开(公告)号:US07791065B2

    公开(公告)日:2010-09-07

    申请号:US11915946

    申请日:2006-06-06

    Abstract: An ultrasensitive optical detector with high resolution in time, using a waveguide, and a processes for manufacturing this detector. The detector is configured to detect at least one photon and includes a dielectric substrate and at least one detection element on the substrate, configured to generate an electrical signal starting from energy of the photon received, and a guide element to guide the photon, the energy of which is then absorbed by the detection element at an absorption zone which is less than 100 nm thick. The detection element is substantially straight on the substrate and is short, and the guide element includes a single mode light waveguide with strong confinement, placed on the detection element. The detector is particularly applicable to detection and localization of operating defects in a semiconducting circuit.

    Abstract translation: 具有高分辨率的超灵敏光学检测器,使用波导,以及用于制造该检测器的工艺。 检测器被配置为检测至少一个光子并且包括电介质基板和衬底上的至少一个检测元件,其被配置为从所接收的光子的能量开始产生电信号,以及引导元件以引导光子,能量 然后在小于100nm厚的吸收区被检测元件吸收。 检测元件在基板上基本上是直的,并且是短的,并且引导元件包括放置在检测元件上的强约束的单模光波导。 检测器特别适用于半导体电路中的工作缺陷的检测和定位。

Patent Agency Ranking