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公开(公告)号:US20210066078A1
公开(公告)日:2021-03-04
申请号:US16962203
申请日:2019-01-11
Inventor: Shinya OHMAGARI , Hideaki YAMADA , Hitoshi UMEZAWA , Nobuteru TSUBOUCHI , Akiyoshi CHAYAHARA , Yoshiaki MOKUNO , Akinori SEKI , Fumiaki KAWAI , Hiroaki SAITOH
Abstract: There is provided a novel stack that includes a single-crystal diamond substrate having a coalescence boundary, yet effectively uses the coalescence boundary. A stack comprising at least a semiconductor drift layer stacked on a single-crystal diamond substrate having a coalescence boundary, wherein the coalescence boundary of the single-crystal diamond substrate is a region that exhibits, in a Raman spectrum at a laser excitation wavelength of 785 nm, a full width at half maximum of a peak near 1332 cm−1 due to diamond that is observed to be broader than a full width at half maximum of the peak exhibited by a region different from the coalescence boundary, the coalescence boundary has a width of 200 μm or more, and the semiconductor drift layer is stacked on at least the coalescence boundary.
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公开(公告)号:US20240258195A1
公开(公告)日:2024-08-01
申请号:US18565295
申请日:2022-05-31
Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY , MITSUBISHI ELECTRIC CORPORATION
Inventor: Hideaki YAMADA , Akiyoshi CHAYAHARA , Yoshiaki MOKUNO , Takashi MATSUMAE , Yuuichi KURASHIMA , Eiji HIGURASHI , Hideki TAKAGI , Shuichi HIZA , Ken IMAMURA , Yusuke SHIRAYANAGI , Koji YOSHITSUGU , Kunihiko NISHIMURA
IPC: H01L23/373 , B32B9/00 , B32B9/04 , B32B37/18 , B32B38/00 , C30B29/04 , C30B29/40 , C30B33/00 , H01L23/00
CPC classification number: H01L23/3732 , B32B9/007 , B32B9/04 , B32B37/18 , C30B29/04 , C30B29/406 , C30B33/00 , H01L24/32 , H01L24/83 , B32B2038/0064 , B32B2457/14 , H01L2224/32225 , H01L2224/83005
Abstract: This bonded body (10) comprising a mosaic diamond wafer and a semiconductor of a different type is a bonded body in which a mosaic diamond wafer (1) having a coalescence boundary (B1) between a plurality of single-crystal diamond substrates (1A and 1B) and a semiconductor of a different type (2) are bonded together, in which a maximum level difference on a bonding surface (1aa) of the mosaic diamond wafer (1) with the semiconductor of a different type (2) is 10 nm or less.
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公开(公告)号:US20240098866A1
公开(公告)日:2024-03-21
申请号:US18274422
申请日:2022-01-25
Inventor: Hideaki YAMADA , Akiyoshi CHAYAHARA , Yoshiaki MOKUNO
IPC: H05H1/00 , C23C16/511 , H05H1/46
CPC classification number: H05H1/01 , C23C16/511 , H05H1/4622
Abstract: A microwave plasma treatment device includes a resonator including a container; a single microwave oscillation source that outputs a reference microwave; a waveguide that connects the microwave oscillation source and the resonator to each other; and a phase control mechanism that generates a modified microwave having a phase different from a phase of the reference microwave by controlling the phase of the reference microwave. The resonator includes one or more first-type introducing portions for introducing the reference microwave into the resonator and one or more second-type introducing portions for introducing the modified microwave into the resonator, and the microwave plasma treatment device is configured such that at least one of a position, a size, and a shape of a plasma ball generated in the container is changed by superimposing the modified microwave on the reference microwave in the resonator.
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