EUV light source components and methods for producing, using and refurbishing same
    1.
    发明申请
    EUV light source components and methods for producing, using and refurbishing same 有权
    EUV光源组件及其制造,使用和翻新方法

    公开(公告)号:US20090159808A1

    公开(公告)日:2009-06-25

    申请号:US12004871

    申请日:2007-12-20

    Abstract: A method is disclosed for in-situ monitoring of an EUV mirror to determine a degree of optical degradation. The method may comprise the steps/acts of irradiating at least a portion of the mirror with light having a wavelength outside the EUV spectrum, measuring at least a portion of the light after the light has reflected from the mirror, and using the measurement and a pre-determined relationship between mirror degradation and light reflectivity to estimate a degree of multi-layer mirror degradation. Also disclosed is a method for preparing a near-normal incidence, EUV mirror which may comprise the steps/acts of providing a metallic substrate, diamond turning a surface of the substrate, depositing at least one intermediate material overlying the surface using a physical vapor deposition technique, and depositing a multi-layer mirror coating overlying the intermediate material.

    Abstract translation: 公开了一种用于EUV反射镜的原位监测以确定光学降解程度的方法。 该方法可以包括用具有波长在EUV谱以外的波长的光照射反射镜的至少一部分的步骤/动作,在光已经从反射镜反射之后测量光的至少一部分,并且使用该测量和 镜面退化和光反射率之间的预定关系,以估计多层镜面退化的程度。 还公开了一种用于制备近似法线入射的EUV反射镜的方法,该反射镜可以包括提供金属基底的步骤/动作,转动基底的表面的金刚石,使用物理气相沉积沉积覆盖表面的至少一种中间材料 技术,并沉积覆盖中间材料的多层镜面涂层。

    EUV Optics
    3.
    发明申请
    EUV Optics 有权
    EUV光学

    公开(公告)号:US20110075253A1

    公开(公告)日:2011-03-31

    申请号:US12927063

    申请日:2010-11-05

    Abstract: In a first aspect, a method of fabricating an EUV light source mirror is disclosed which may comprise the acts/steps of providing a plurality of discrete substrates; coating each substrate with a respective multilayer coating; securing the coated substrates in an arrangement wherein each coated substrate is oriented to a common focal point; and thereafter polishing at least one of the multilayer coatings. In another aspect, an optic for use with EUV light is disclosed which may comprise a substrate; a smoothing layer selected from the group of materials consisting of Si, C, Si3N4, B4C, SiC and Cr, the smoothing layer material being deposited using highly energetic deposition conditions and a multilayer dielectric coating. In another aspect, a corrosion resistant, multilayer coating for an EUV mirror may comprise alternating layers of Si and a compound material having nitrogen and a 5th period transition metal.

    Abstract translation: 在第一方面,公开了一种制造EUV光源反射镜的方法,其可以包括提供多个离散基板的动作/步骤; 用相应的多层涂层涂覆每个基材; 将涂覆的基底固定在其中每个涂覆的基底被定向到公共焦点的布置中; 然后抛光至少一个多层涂层。 在另一方面,公开了一种用于EUV光的光学元件,其可以包括基底; 选自由Si,C,Si 3 N 4,B 4 C,SiC和Cr组成的材料组中的平滑层,使用高能沉积条件沉积的平滑层材料和多层介电涂层。 另一方面,用于EUV反射镜的耐腐蚀多层涂层可以包括交替的Si层和具有氮和第五段过渡金属的复合材料。

    EUV optics
    7.
    发明申请
    EUV optics 有权
    EUV光学

    公开(公告)号:US20080043321A1

    公开(公告)日:2008-02-21

    申请号:US11505177

    申请日:2006-08-16

    Abstract: In a first aspect, a method of fabricating an EUV light source mirror is disclosed which may comprise the acts/steps of providing a plurality of discrete substrates; coating each substrate with a respective multilayer coating; securing the coated substrates in an arrangement wherein each coated substrate is oriented to a common focal point; and thereafter polishing at least one of the multilayer coatings. In another aspect, an optic for use with EUV light is disclosed which may comprise a substrate; a smoothing layer selected from the group of materials consisting of Si, C, Si3N4, B4C, SiC and Cr, the smoothing layer material being deposited using highly energetic deposition conditions and a multilayer dielectric coating. In another aspect, a corrosion resistant, multilayer coating for an EUV mirror may comprise alternating layers of Si and a compound material having nitrogen and a 5th period transition metal.

    Abstract translation: 在第一方面,公开了一种制造EUV光源反射镜的方法,其可以包括提供多个离散基板的动作/步骤; 用相应的多层涂层涂覆每个基材; 将涂覆的基底固定在其中每个涂覆的基底被定向到公共焦点的布置中; 然后抛光至少一个多层涂层。 在另一方面,公开了一种用于EUV光的光学元件,其可以包括基底; 选自由Si,C,Si 3 N 4,B 4 C,SiC和Cr组成的材料组中的平滑层, 使用高能沉积条件沉积的平滑层材料和多层介电涂层。 另一方面,用于EUV反射镜的耐腐蚀多层涂层可以包括交替的Si层和具有氮和第五阶段过渡金属的复合材料。

    EUV optics
    8.
    发明授权
    EUV optics 有权
    EUV光学

    公开(公告)号:US08598549B2

    公开(公告)日:2013-12-03

    申请号:US12927063

    申请日:2010-11-05

    Abstract: In a first aspect, a method of fabricating an EUV light source mirror is disclosed which may comprise the acts/steps of providing a plurality of discrete substrates; coating each substrate with a respective multilayer coating; securing the coated substrates in an arrangement wherein each coated substrate is oriented to a common focal point; and thereafter polishing at least one of the multilayer coatings. In another aspect, an optic for use with EUV light is disclosed which may comprise a substrate; a smoothing layer selected from the group of materials consisting of Si, C, Si3N4, B4C, SiC and Cr, the smoothing layer material being deposited using highly energetic deposition conditions and a multilayer dielectric coating. In another aspect, a corrosion resistant, multilayer coating for an EUV mirror may comprise alternating layers of Si and a compound material having nitrogen and a 5th period transition metal.

    Abstract translation: 在第一方面,公开了一种制造EUV光源反射镜的方法,其可以包括提供多个离散基板的动作/步骤; 用相应的多层涂层涂覆每个基材; 将涂覆的基底固定在其中每个涂覆的基底被定向到公共焦点的布置中; 然后抛光至少一个多层涂层。 在另一方面,公开了一种用于EUV光的光学元件,其可以包括基底; 选自由Si,C,Si 3 N 4,B 4 C,SiC和Cr组成的材料组中的平滑层,使用高能沉积条件沉积的平滑层材料和多层介电涂层。 另一方面,用于EUV反射镜的耐腐蚀多层涂层可以包括交替的Si层和具有氮和第五段过渡金属的复合材料。

    EUV light source components and methods for producing, using and refurbishing same
    9.
    发明授权
    EUV light source components and methods for producing, using and refurbishing same 有权
    EUV光源组件及其制造,使用和翻新方法

    公开(公告)号:US08314398B2

    公开(公告)日:2012-11-20

    申请号:US13091923

    申请日:2011-04-21

    Abstract: A method is disclosed for in-situ monitoring of an EUV mirror to determine a degree of optical degradation. The method may comprise the steps/acts of irradiating at least a portion of the mirror with light having a wavelength outside the EUV spectrum, measuring at least a portion of the light after the light has reflected from the mirror, and using the measurement and a pre-determined relationship between mirror degradation and light reflectivity to estimate a degree of multi-layer mirror degradation. Also disclosed is a method for preparing a near-normal incidence, EUV mirror which may comprise the steps/acts of providing a metallic substrate, diamond turning a surface of the substrate, depositing at least one intermediate material overlying the surface using a physical vapor deposition technique, and depositing a multi-layer mirror coating overlying the intermediate material.

    Abstract translation: 公开了一种用于EUV反射镜的原位监测以确定光学降解程度的方法。 该方法可以包括用具有波长在EUV谱以外的波长的光照射反射镜的至少一部分的步骤/动作,在光已经从反射镜反射之后测量光的至少一部分,并且使用该测量和 镜面退化和光反射率之间的预定关系,以估计多层镜面退化的程度。 还公开了一种用于制备近似法线入射的EUV反射镜的方法,该反射镜可以包括提供金属基底的步骤/动作,转动基底的表面的金刚石,使用物理气相沉积沉积覆盖表面的至少一种中间材料 技术,并沉积覆盖中间材料的多层镜面涂层。

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