公开(公告)号：US20170307468A1

公开(公告)日：2017-10-26

申请号：US15133614

申请日：2016-04-20

Applicant: STMICROELECTRONICS SA ,  STMICROELECTRONICS (CROLLES 2) SAS

Inventor： Jean-Francois CARPENTIER ,  Patrick LEMAITRE ,  Jean-Robert MANOUVRIER ,  Charles BAUDOT ,  Bertrand BOROT

IPC: G01M11/02 ,  G02B6/12 ,  G02B6/28 ,  G02B6/34

CPC classification number: G01M11/02 ,  G01R31/2656 ,  G01R31/27 ,  G01R31/2884 ,  G01R31/303 ,  G01R31/311 ,  G01R31/31728 ,  G01R35/00 ,  G02B6/00 ,  G02B6/12004 ,  G02B6/2808 ,  G02B6/34

Abstract: A semiconductor device may include a semiconductor wafer, and a reference circuit carried by the semiconductor wafer. The reference circuit may include optical DUTs, a first set of photodetectors coupled to outputs of the optical DUTs, an optical splitter coupled to inputs of the optical DUTs, and a second set of photodetectors coupled to the optical splitter. The optical splitter is to be coupled to an optical source and configured to transmit a reference optical signal to the first set of photodetectors via the optical DUTs and the second set of photodetectors.

公开(公告)号：US20200256759A1

公开(公告)日：2020-08-13

申请号：US16863303

申请日：2020-04-30

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Philippe GROSSE ,  Patrick LE MAITRE ,  Jean-Francois CARPENTIER

IPC: G01M11/02 ,  G02B6/28 ,  G02B6/34 ,  G02B6/12 ,  G02B6/00 ,  G01M11/00 ,  G01R31/265 ,  G01R31/27 ,  G01R31/28 ,  G01R31/303 ,  G01R31/311 ,  G01R31/317 ,  G01R35/00

Abstract: An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

公开(公告)号：US20200233164A1

公开(公告)日：2020-07-23

申请号：US16748696

申请日：2020-01-21

Applicant: STMICROELECTRONICS (CROLLES 2) SAS

Inventor： Jean-Francois CARPENTIER ,  Charles BAUDOT

IPC: G02B6/43 ,  G02B6/12 ,  G02B6/13

Abstract: A photonic system includes a first photonic circuit having a first face and a second photonic circuit having a second face. The first photonic circuit comprises first wave guides, and, for each first wave guide, a second wave guide covering the first wave guide, the second wave guides being in contact with the first face and placed between the first face and the second face, the first wave guides being located on the side of the first face opposite the second wave guides. The second photonic circuit comprises, for each second wave guide, a third wave guide covering the second wave guide. The first photonic circuit comprises first positioning devices projecting from the first face and the second photonic circuit comprises second positioning devices projecting from the second face, at least one of the first positioning devices abutting one of the second positioning devices in a first direction.

公开(公告)号：US20170003449A1

公开(公告)日：2017-01-05

申请号：US14754994

申请日：2015-06-30

Applicant: STMICROELECTRONICS SA ,  STMICROELECTRONICS (CROLLES 2) SAS

Inventor： Jean-Robert MANOUVRIER ,  Jean-Francois CARPENTIER ,  Patrick LEMAITRE

IPC: G02B6/124 ,  G02B6/30 ,  G02B5/18

CPC classification number: G02B6/124 ,  G02B6/29395 ,  G02B6/30 ,  G02F1/025 ,  G02F2201/302

Abstract: An electro-optic device may include a photonic chip having an optical grating coupler at a surface. The optical grating coupler may include a first semiconductor layer having a first base and first fingers extending outwardly from the first base. The optical grating coupler may include a second semiconductor layer having a second base and second fingers extending outwardly from the second base and being interdigitated with the first fingers to define semiconductor junction areas, with the first and second fingers having a non-uniform width. The electro-optic device may include a circuit coupled to the optical grating coupler and configured to bias the semiconductor junction areas and change one or more optical characteristics of the optical grating coupler.

Abstract translation: 电光器件可以包括在表面具有光栅耦合器的光子芯片。 光栅耦合器可以包括第一半导体层，其具有从第一基底向外延伸的第一基底和第一指状物。 光栅耦合器可以包括第二半导体层，第二半导体层具有从第二基底向外延伸的第二基极和第二指状物，并且与第一指状物交叉以限定半导体结区域，第一和第二指状物具有不均匀的宽度。 电光器件可以包括耦合到光栅耦合器并被配置为偏置半导体结区域并改变光栅耦合器的一个或多个光学特性的电路。

公开(公告)号：US20170059893A1

公开(公告)日：2017-03-02

申请号：US14836011

申请日：2015-08-26

Applicant: STMICROELECTRONICS (CROLLES 2) SAS ,  STMICROELECTRONICS SA

Inventor： Patrick LEMAITRE ,  Jean-Francois CARPENTIER ,  Charles BAUDOT ,  Jean-Robert MANOUVRIER

IPC: G02F1/025 ,  G02B6/293

CPC classification number: G02F1/225 ,  G02F1/025 ,  G02F1/2257 ,  G02F2001/212 ,  G02F2203/15

Abstract: An electro-optic (E/O) device includes an asymmetric optical coupler having an input and first and second outputs, a first optical waveguide arm coupled to the first output of the first asymmetric optical coupler, and a second optical waveguide arm coupled to the second output of the first asymmetric optical coupler. At least one E/O amplitude modulator is coupled to at least one of the first and second optical waveguide arms. An optical combiner is coupled to the first and second optical waveguide arms downstream from the at least one E/O amplitude modulator.

Abstract translation: 电光（E / O）装置包括具有输入和第一和第二输出的不对称光耦合器，耦合到第一非对称光耦合器的第一输出的第一光波导臂和耦合到第一和第二输出的第二光波导臂 第二非对称光耦合器的第二输出。 至少一个E / O振幅调制器耦合到第一和第二光波导臂中的至少一个。 光合成器耦合到至少一个E / O振幅调制器下游的第一和第二光波导臂。

公开(公告)号：US20230015854A1

公开(公告)日：2023-01-19

申请号：US17932623

申请日：2022-09-15

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Jean-Francois CARPENTIER ,  Charles BAUDOT

IPC: G02B6/43 ,  G02B6/12 ,  G02B6/13 ,  G02B6/42

Abstract: A photonic system includes a first photonic circuit having a first face and a second photonic circuit having a second face. The first photonic circuit comprises first wave guides, and, for each first wave guide, a second wave guide covering the first wave guide, the second wave guides being in contact with the first face and placed between the first face and the second face, the first wave guides being located on the side of the first face opposite the second wave guides. The second photonic circuit comprises, for each second wave guide, a third wave guide covering the second wave guide. The first photonic circuit comprises first positioning devices projecting from the first face and the second photonic circuit comprises second positioning devices projecting from the second face, at least one of the first positioning devices abutting one of the second positioning devices in a first direction.

公开(公告)号：US20190113415A1

公开(公告)日：2019-04-18

申请号：US16211511

申请日：2018-12-06

Applicant: STMicroelectronics (Crolles 2) SAS

Inventor： Philippe GROSSE ,  Patrick LE MAITRE ,  Jean-Francois CARPENTIER

IPC: G01M11/02 ,  G01R31/311 ,  G02B6/28 ,  G02B6/12 ,  G02B6/00 ,  G01R35/00 ,  G01R31/265 ,  G02B6/34 ,  G01R31/303 ,  G01R31/28 ,  G01R31/27 ,  G01R31/317

Abstract: An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

公开(公告)号：US20170199329A1

公开(公告)日：2017-07-13

申请号：US15217100

申请日：2016-07-22

Applicant: STMICROELECTRONICS (CROLLES 2) SAS

Inventor： Jean-Francois CARPENTIER ,  Patrick LEMAITRE ,  Mickael FOUREL

IPC: G02B6/12 ,  G02B6/30 ,  G02B6/42

CPC classification number: G02B6/12002 ,  G02B6/12004 ,  G02B6/30 ,  G02B6/4232 ,  G02B6/4257 ,  G02B6/4269 ,  G02B6/428 ,  G02B6/4292 ,  H01L23/13 ,  H01L23/49827 ,  H01L2224/16225

Abstract: An integrated electronic device includes a substrate having an opening extending therethrough. The substrate includes an interconnection network, and connections coupled to the interconnection network. The connections are to be fixed on a printed circuit board. An integrated photonic module is electrically connected to the substrate, with a portion of the integrated photonic module in front of or overlapping the opening of the substrate. An integrated electronic module is electrically connected to the photonic module, and extends at least partly into the opening of the substrate. The electronic module and the substrate may be electrically connected onto the same face of the photonic module.

公开(公告)号：US20170003462A1

公开(公告)日：2017-01-05

申请号：US14755437

申请日：2015-06-30

Applicant: STMICROELECTRONICS (CROLLES 2) SAS

Inventor： Patrick LEMAITRE ,  Jean-Francois CARPENTIER

IPC: G02B6/42 ,  G02B6/34

CPC classification number: G02B6/4225 ,  G02B6/124 ,  G02B6/34 ,  G02B6/4222 ,  G02B6/4227 ,  G02B6/4249 ,  G02B6/425

Abstract: A method is for aligning an electro-optic device. The method may include initially positioning an optical fiber array adjacent to optical grating couplers, and actively aligning the optical fiber array relative to the optical grating couplers in a yaw direction and a roll direction to determine a yaw and roll alignment at a first operating wavelength. The method may include actively aligning the optical fiber array relative to optical grating couplers in an x direction and a y direction to determine a first x and y alignment at the first operating wavelength, determining a second operating wavelength, and actively aligning the optical fiber array again relative to the optical grating couplers in the x direction and y direction to determine a second x and y alignment at the second operating wavelength.

公开(公告)号：US20150277038A1

公开(公告)日：2015-10-01

申请号：US14656981

申请日：2015-03-13

Applicant: STMICROELECTRONICS SA ,  STMICROELECTRONICS (CROLLES 2) SAS

Inventor： Jean-Robert MANOUVRIER ,  Patrick LEMAITRE ,  Jean-Francois CARPENTIER

IPC: G02B6/12 ,  G02B6/13

CPC classification number: G02B6/12 ,  G02B6/122 ,  G02B6/13 ,  G02B6/132 ,  H01L29/74

Abstract: An optical waveguide in a semiconductor material, may include, between two adjacent portions of the waveguide, a plurality of parallel strips of alternating conductivity types forming a plurality of opposing bipolar junctions between the two adjacent portions.

Abstract translation: 在半导体材料中的光波导可以包括在波导的两个相邻部分之间的多个交替导电类型的平行条带，在两个相邻部分之间形成多个相对的双极结。