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公开(公告)号:US10665702B2
公开(公告)日:2020-05-26
申请号:US16151511
申请日:2018-10-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Myung Gil Kang , Ill Seo Kang , Yong Hee Park , Sang Hoon Baek , Keon Yong Cheon
IPC: H01L29/66 , H01L29/732 , H01L27/082 , H01L29/06 , H01L29/08 , H01L21/28 , H01L29/49 , H01L29/51 , H01L21/308 , H01L29/10 , H01L27/06 , H01L21/8249 , H01L21/8238
Abstract: A vertical bipolar transistor including a substrate including a first well of a first conductivity type and a second well of a second conductivity type different from the first conductivity type, the first well adjoining the second well, a first fin extending, from the first well, a second fin extending from the first well, a third fin extending from the second well, a first conductive region on the first fin, having the second conductivity type and configured to serve as an emitter of the vertical bipolar transistor, a second conductive region on the second fin, having the first conductivity type, and configured to serve as a base of the vertical bipolar transistor, and a third conductive region on the third fin, having the second conductivity type, and configured to serve as a collector of the vertical bipolar transistor may be provided.
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公开(公告)号:US09905645B2
公开(公告)日:2018-02-27
申请号:US15256136
申请日:2016-09-02
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Myung Gil Kang , Seung Han Park , Yong Hee Park , Sang Hoon Baek , Sang Woo Lee , Keon Yong Cheon , Sung Man Whang
IPC: H01L21/336 , H01L29/778 , H01L29/78 , H01L29/08 , H01L29/423 , H01L29/417
CPC classification number: H01L29/0847 , H01L29/41741 , H01L29/41758 , H01L29/42376 , H01L29/7827 , H01L29/7851
Abstract: A vertical field effect transistor is provided as follows. A substrate has a lower drain and a lower source arranged along a first direction in parallel to an upper surface of the substrate. A fin structure is disposed on the substrate and extended vertically from the upper surface of the substrate. The fin structure includes a first end portion and a second end portion arranged along the first direction. A bottom surface of a first end portion of the fin structure and a bottom surface of a second end portion of the fin structure overlap the lower drain and the lower source, respectively. The fin structure includes a sidewall having a lower sidewall region, a center sidewall region and an upper sidewall region. A gate electrode surrounds the center side sidewall region of the fin structure.
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