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    INSTRUMENT AND MEASUREMENT TRANSLATOR USING MACHINE LEARNING
    1.
    发明申请
    INSTRUMENT AND MEASUREMENT TRANSLATOR USING MACHINE LEARNING 有权

    公开(公告)号：US20250004015A1

    公开(公告)日：2025-01-02

    申请号：US18746902

    申请日：2024-06-18

    Applicant: Tektronix, Inc.

    Inventor： Sam J. Strickling ,  John J. Pickerd ,  Kan Tan ,  Justin E. Patterson

    IPC: G01R13/02

    Abstract: A test and measurement system includes a first test and measurement instrument having an input to allow the test and measurement instrument to receive signals from one or more devices under test (DUT), and one or more digitizers to convert the signals from the one or more DUTs to digital waveforms, a machine learning network, and one or more processors to: perform one or more measurements of the digital waveforms, send the one or more measurements of the digital waveforms to the machine learning network as an input, use the machine learning network to translate the one or more measurements to measurements made by a reference instrument to produce one or more translated measurements, the reference instrument being more accurate than the first test and measurement instrument, and determine whether the DUT meets a performance requirement based upon the one or more translated measurements.

    MACHINE LEARNING MODEL DISTRIBUTION ARCHITECTURE
    2.
    发明公开
    MACHINE LEARNING MODEL DISTRIBUTION ARCHITECTURE 审中-公开

    公开(公告)号：US20240184637A1

    公开(公告)日：2024-06-06

    申请号：US18523556

    申请日：2023-11-29

    Applicant: Tektronix, Inc.

    Inventor： John J. Pickerd ,  Sam J. Strickling ,  Mark Anderson Smith ,  Sunil Mahawar

    IPC: G06F9/50 ,  G06F11/36

    CPC classification number: G06F9/5077 ,  G06F11/362

    Abstract: A machine learning management system includes a repository having one or more partitions, the one or more partitions being separate from others of the partitions, a communications interface, and one or more processors configured to execute code to: receive a selected model and associated training data for the selected model through the communications interface from a customer; store the selected model and the associated training data in a partition dedicated to the customer; and manage the one or more partitions to ensure that the customer can only access the customer's partition. A method includes receiving a selected model and associated training data for the selected model from a customer, storing the selected model and the associated training data in a partition dedicated to the customer in a repository, and managing the one or more partitions to ensure that the customer can only access the partition dedicated to the customer.

    TEST AND MEASUREMENT SYSTEM FOR ANALYZING DEVICES UNDER TEST
    5.
    发明公开
    TEST AND MEASUREMENT SYSTEM FOR ANALYZING DEVICES UNDER TEST 审中-公开

    公开(公告)号：US20240004768A1

    公开(公告)日：2024-01-04

    申请号：US18467597

    申请日：2023-09-14

    Applicant: Tektronix, Inc.

    Inventor： Sam J. Strickling ,  Daniel S. Froelich ,  Michelle L. Baldwin ,  Jonathan San ,  Lin-Yung Chen

    IPC: G06F11/26 ,  G06F11/24

    CPC classification number: G06F11/26 ,  G06F11/24

    Abstract: A test and measurement system has a test and measurement instrument having an adaptor with an interface configured to communicate through one or more communications links with a new device under test to receive new test results, a memory configured to store a database of test results and a database of analyzed test results related to tests performed with one or more prior devices under test, a data analyzer connected to the test and measurement instrument through the one or more communications link, the data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.

    INTEROPERABILITY PREDICTOR USING MACHINE LEARNING AND REPOSITORY OF TX, CHANNEL, AND RX MODELS FROM MULTIPLE VENDORS
    6.
    发明公开
    INTEROPERABILITY PREDICTOR USING MACHINE LEARNING AND REPOSITORY OF TX, CHANNEL, AND RX MODELS FROM MULTIPLE VENDORS 审中-公开

    公开(公告)号：US20240168471A1

    公开(公告)日：2024-05-23

    申请号：US18514800

    申请日：2023-11-20

    Applicant: Tektronix, Inc.

    Inventor： Kan Tan ,  John J. Pickerd ,  Sam J. Strickling

    IPC: G05B23/02

    CPC classification number: G05B23/0254 ,  G05B23/0216

    Abstract: A test system includes a repository of component models containing characteristic parameters for each component model, one or more processors to receive a list of selected component models through a user interface to be tested as a combination, access the characteristic parameters for each selected component model, build a tensor image using the characteristic parameters, send the tensor image to one or more trained neural networks to predict interoperability of the combination, and receive a prediction about the combination. A method includes receiving a list of selected component models through a user interface to be tested as a combination, accessing characteristic parameters for the selected component models, building a tensor image for each combination of the selected component models, sending the tensor image to one or more trained neural networks to predict interoperability of the combination, and receiving a prediction about the combination.

    Thermal management system for a test-and-measurement probe
    9.
    发明授权
    Thermal management system for a test-and-measurement probe 有权

    公开(公告)号：US11578925B2

    公开(公告)日：2023-02-14

    申请号：US17096622

    申请日：2020-11-12

    Applicant: Tektronix, Inc.

    Inventor： Julie A. Campbell ,  David Thomas Engquist ,  Sam J. Strickling

    IPC: G01R31/28 ,  F28D7/10

    Abstract: A thermal management system for a test-and-measurement probe that includes a thermally insulated shroud and a fluid inlet conduit. The shroud is configured to enclose a first portion of a probe head of the probe within an interior cavity of the shroud, while permitting a second portion of the probe head to extend out of the shroud. The shroud further includes a fluid outlet passageway configured to permit a heat-transfer fluid to pass from a probe-head end of the interior cavity, through the interior cavity of the shroud, and out of the shroud through an access portion of the shroud. The fluid inlet conduit enters the shroud through the access portion of the shroud, extends through the interior cavity of the shroud, and is configured to introduce the heat-transfer fluid to the probe-head end of the interior cavity.

    MARGIN TESTER MEASUREMENT USING MACHINE LEARNING
    10.
    发明申请
    MARGIN TESTER MEASUREMENT USING MACHINE LEARNING 有权

    公开(公告)号：US20250020713A1

    公开(公告)日：2025-01-16

    申请号：US18769683

    申请日：2024-07-11

    Applicant: Tektronix, Inc.

    Inventor： John J. Pickerd ,  Sam J. Strickling ,  Kan Tan

    IPC: G01R31/28

    Abstract: A margin tester includes one or more ports to allow the margin tester to connect to a device under test (DUT), a memory, the memory containing a margin tester signature, a transmitter, a receiver to receive signals from the DUT, one or more processors configured to execute code that causes the one or more processors to: receive multiple signals from the receiver through the one or more ports, generate a performance indicator from the multiple signals, send the performance indicator and the margin tester signature to one or more machine learning networks, and receiving a result from the one or more machine learning networks containing a performance measurement prediction for the DUT.

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