摘要:
A device and method for removal of ambient noise signal from a photoplethysmographic measurement is provided. The method comprises obtaining a first signal waveform based on detecting light based on a first light illumination; obtaining a second signal waveform based on detecting light based on a second light illumination; tuning the first light and second light illumination such that the maximum amplitudes of the first and second signal waveforms are maximized and within a predetermined saturation range, such that ambient light interference for the first and second signal waveforms is reduced; obtaining a third signal waveform based on detecting ambient light; obtaining respective maximum and minimum values of the first and the second signal waveforms; and deriving signal values of the first and second signal waveforms with the removal of ambient noise by subtracting AC and DC average values of the third signal waveform from the first and second signals.
摘要:
A method of measuring an artifact removed photoplethysmographic (PPG) signal and a measurement system for measuring an artifact removed photoplethysmographic (PPG) signal are provided. The method comprises obtaining a first set of PPG signals from a plurality of detectors at respective measurement sites using a first illumination; obtaining a second set of PPG signals from the plurality of detectors using a second illumination; obtaining at least two pairs of PPG signals, each pair comprising one PPG signal from the first set and one PPG signal from the second set, and for each pair, computing an artifact reference signal to obtain a candidate PPG signal; and choosing one of the candidate PPG signals as the artifact removed PPG signal.
摘要:
A reflectance-based optical measurement device and a method for a reflectance-based optical measurement are provided. The device comprises an illumination and detection assembly configured to output light to a surface portion of a user for measurement and to detect the output light reflected from said surface portion of the user as a signal; a coupling member configured for coupling in a cableless configuration to a personal mobile processing device; a measurement surface configured to allow access to said measurement surface by the surface portion of the user; wherein said access is provided by the optical device being holderless such that the surface portion of the user is allowed access to said measurement surface from all directions in a single plane; and further wherein said coupling member is arranged to transmit the detected signal to the personal mobile processing device.
摘要:
A reflectance-based optical measurement device and a method for a reflectance-based optical measurement are provided. The device comprises an illumination and detection assembly configured to output light to a surface portion of a user for measurement and to detect the output light reflected from said surface portion of the user as a signal; a coupling member configured for coupling in a cableless configuration to a personal mobile processing device; a measurement surface configured to allow access to said measurement surface by the surface portion of the user; wherein said access is provided by the optical device being holderless such that the surface portion of the user is allowed access to said measurement surface from all directions in a single plane; and further wherein said coupling member is arranged to transmit the detected signal to the personal mobile processing device.
摘要:
An optical measurement device and method of use provides non-invasive physiological measurements from a predetermined location on a body part of a user. The optical measurement device provides an illumination and detection assembly configured to generate and detect light of a predetermined wavelength range in the form of a photoplethysmography (PPG) signal, as well as a pressure detection assembly configured to detect an amount of pressure applied to the measurement device by the user being measured. A feedback unit, such as a portable display device, provides the user real-time feedback of the detected PPG signal and level of applied pressure so that the user may adjust the amount of applied pressure to improve the quality of the detected PPG signal.
摘要:
A method of measuring an artefact removed photoplethysmographic (PPG) signal and a measurement system for measuring an artefact removed photoplethysmographic (PPG) signal are provided. The method comprises obtaining a first set of PPG signals from a plurality of detectors at respective measurement sites using a first illumination; obtaining a second set of PPG signals from the plurality of detectors using a second illumination; obtaining at least two pairs of PPG signals, each pair comprising one PPG signal from the first set and one PPG signal from the second set, and for each pair, computing an artefact reference signal to obtain a candidate PPG signal; and choosing one of the candidate PPG signals as the artefact removed PPG signal.
摘要:
A device and method for removal of ambient noise signal from a photoplethysmographic measurement is provided. The method comprises obtaining a first signal waveform based on detecting light based on a first light illumination; obtaining a second signal waveform based on detecting light based on a second light illumination; tuning the first light and second light illumination such that the maximum amplitudes of the first and second signal waveforms are maximised and within a predetermined saturation range, such that ambient light interference for the first and second signal waveforms is reduced; obtaining a third signal waveform based on detecting ambient light; obtaining respective maximum and minimum values of the first and the second signal waveforms; and deriving signal values of the first and second signal waveforms with the removal of ambient noise by subtracting AC and DC average values of the third signal waveform from the first and second signals.
摘要:
A waveguide sensor according to an embodiment of the present invention includes: a substrate; a first underclad arranged on one side of the substrate; a first sensing core arranged on outer side of the first underclad and having a stripe pattern which extends in one direction; a first overclad arranged on outer side of the first sensing core; a second underclad arranged on another side of the substrate; a second sensing core arranged on outer side of the second underclad and having a stripe pattern which extends in a direction not parallel to the direction in which the first sensing core extends; and a second overclad arranged on outer side of the second sensing core. A first grooved part which extends in a direction not parallel to the direction in which the first sensing core extends is formed on the first overclad, so that the first grooved part and the first sensing core together form a first grating in a plane view. Furthermore, a second grooved part which extends in a direction not parallel to the direction in which the second sensing core extends is formed on the second overclad, so that the second grooved part and the second sensing core together form a second grating in a plane view.
摘要:
A wired circuit board includes an insulating base layer, a conductive pattern formed on the insulating base layer and including a wire and a terminal portion, an insulating cover layer formed on the insulating base layer and having an opening portion to expose the terminal portion, and a metal thin film including a protecting portion interposed between the wire and the insulating cover layer, and an exposed portion formed continuously from the protecting portion on a peripheral end portion of the terminal portion exposed from the opening portion.
摘要:
A wired circuit board has a metal supporting board, an insulating layer formed on the metal supporting board, a conductive pattern formed on the insulating layer and having a pair of wires arranged in spaced-apart relation, and a semiconductive layer formed on the insulating layer and electrically connected to the metal supporting board and the conductive pattern. The conductive pattern has a first region in which a distance between the pair of wires is small and a second region in which the distance between the pair of wires is larger than that in the first region. The semiconductive layer is provided in the second region.