Probe contact system having planarity adjustment mechanism
    2.
    发明授权
    Probe contact system having planarity adjustment mechanism 失效
    具有平面度调节机构的探头接触系统

    公开(公告)号:US06677771B2

    公开(公告)日:2004-01-13

    申请号:US10233963

    申请日:2002-09-03

    IPC分类号: G01R2700

    摘要: A probe contact system is capable of adjusting distances between tips of the contactors and contact targets with simple and low cost mechanism. The probe contact system includes a contact substrate having a large number of contactors, a probe card for fixedly mounting the contact substrate for establishing electrical communication between the contactors and a test system, a probe card ring attached to a frame of the probe contact system for mechanically coupling the probe card to the frame, and a plurality of adjustment members for up/down moving the probe card relative to the probe card ring at three or more locations on the probe card. Each of the adjustment members is housed within a through hole formed on the probe card.

    摘要翻译: 探头接触系统能够以简单且低成本的机制调节接触器的尖端和接触目标之间的距离。 探针接触系统包括具有大量接触器的接触基板,用于固定地安装用于建立接触器和测试系统之间的电气连通的接触基板的探针卡,附接到探针接触系统的框架的探针卡环, 将探针卡机械耦合到框架,以及多个调节构件,用于在探针卡上的三个或更多个位置处相对于探针卡环上下移动探针卡。 每个调节构件容纳在形成在探针卡上的通孔内。

    PROBE CONTACT SYSTEM USING FLEXIBLE PRINTED CIRCUIT BOARD
    4.
    发明申请
    PROBE CONTACT SYSTEM USING FLEXIBLE PRINTED CIRCUIT BOARD 失效
    使用柔性印刷电路板进行探头接触系统

    公开(公告)号:US20050035775A1

    公开(公告)日:2005-02-17

    申请号:US10640452

    申请日:2003-08-13

    申请人: Yu Zhou David Yu

    发明人: Yu Zhou David Yu

    摘要: A probe contact system for establishing electrical connection with contact targets. The probe contact system is formed of a main frame, a flexible printed circuit board (PCB), a contactor carrier and a plurality of contactors. The flexible PCB has contact pads at a center area thereof and signal lines connected to the contact pads and extended to an end of the flexible PCB. The end of the flexible PCB with the signal lines is connected to a test head of a semiconductor test system. In one aspect, the contactor has a top spring to resiliently contact with the contact pads on the flexible PCB. In another aspect, the probe contact system includes a conductive elastomer sheet between the contactor and the flexible PCB thereby obviating the top spring of the contactor.

    摘要翻译: 用于与接触目标建立电气连接的探针接触系统。 探针接触系统由主框架,柔性印刷电路板(PCB),接触器载体和多个接触器形成。 柔性PCB在其中心区域具有接触焊盘,并且连接到接触焊盘并延伸到柔性PCB的端部的信号线。 具有信号线的柔性PCB的端部连接到半导体测试系统的测试头。 在一个方面,接触器具有顶部弹簧以与柔性PCB上的接触垫弹性接触。 在另一方面,探针接触系统包括在接触器和柔性PCB之间的导电弹性体片,从而消除接触器的顶部弹簧。

    Probe contact system using flexible printed circuit board
    8.
    发明授权
    Probe contact system using flexible printed circuit board 失效
    探头接触系统采用柔性印刷电路板

    公开(公告)号:US06859054B1

    公开(公告)日:2005-02-22

    申请号:US10640452

    申请日:2003-08-13

    申请人: Yu Zhou David Yu

    发明人: Yu Zhou David Yu

    摘要: A probe contact system for establishing electrical connection with contact targets. The probe contact system is formed of a main frame, a flexible printed circuit board (PCB), a contactor carrier and a plurality of contactors. The flexible PCB has contact pads at a center area thereof and signal lines connected to the contact pads and extended to an end of the flexible PCB. The end of the flexible PCB with the signal lines is connected to a test head of a semiconductor test system. In one aspect, the contactor has a top spring to resiliently contact with the contact pads on the flexible PCB. In another aspect, the probe contact system includes a conductive elastomer sheet between the contactor and the flexible PCB thereby obviating the top spring of the contactor.

    摘要翻译: 用于与接触目标建立电气连接的探针接触系统。 探针接触系统由主框架,柔性印刷电路板(PCB),接触器载体和多个接触器形成。 柔性PCB在其中心区域具有接触焊盘,并且连接到接触焊盘并延伸到柔性PCB的端部的信号线。 具有信号线的柔性PCB的端部连接到半导体测试系统的测试头。 在一个方面,接触器具有顶部弹簧以与柔性PCB上的接触垫弹性接触。 在另一方面,探针接触系统包括在接触器和柔性PCB之间的导电弹性体片,从而消除接触器的顶部弹簧。