摘要:
A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contactor carrier and a plurality of contactors attached to a contactor adapter. The contactor adapter is inserted in a slot of the contactor carrier, thereby locking the contactors on the contactor carrier. The contactor has an upper end having a cut-out to engage fit in contactor adapter, a lower end oriented in a direction opposite to the upper end and functions as a contact point for electrical connection with a contact target, and a diagonal portion provided between the upper end and the lower end to function as a spring.
摘要:
A probe contact system is capable of adjusting distances between tips of the contactors and contact targets with simple and low cost mechanism. The probe contact system includes a contact substrate having a large number of contactors, a probe card for fixedly mounting the contact substrate for establishing electrical communication between the contactors and a test system, a probe card ring attached to a frame of the probe contact system for mechanically coupling the probe card to the frame, and a plurality of adjustment members for up/down moving the probe card relative to the probe card ring at three or more locations on the probe card. Each of the adjustment members is housed within a through hole formed on the probe card.
摘要:
A method of producing a contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contact substrate and a plurality of contactors. The contactor has a contact portion which is oriented in a vertical direction to form a contact point, an intermediate portion which is inserted in a through hole provided on the contact substrate, and a base portion having a base end which functions as a contact pad and a spring portion provided between the base end and the intermediate portion for producing a resilient contact force when the contactor is pressed against the contact target.
摘要:
A probe contact system for establishing electrical connection with contact targets. The probe contact system is formed of a main frame, a flexible printed circuit board (PCB), a contactor carrier and a plurality of contactors. The flexible PCB has contact pads at a center area thereof and signal lines connected to the contact pads and extended to an end of the flexible PCB. The end of the flexible PCB with the signal lines is connected to a test head of a semiconductor test system. In one aspect, the contactor has a top spring to resiliently contact with the contact pads on the flexible PCB. In another aspect, the probe contact system includes a conductive elastomer sheet between the contactor and the flexible PCB thereby obviating the top spring of the contactor.
摘要:
A contact structure for establishing electrical connection with contact targets has a unique mounting mechanism for easy assembly. The contact structure is formed of a contactor carrier and a plurality of contactors. The contactor carrier includes a sliding layer for locking the contactors on the contactor carrier. The contactor has an upper end having a cut-out to engage with the sliding layer, a lower end oriented in a direction opposite to the upper end and functions as a contact point for electrical connection with a contact target, and a diagonal beam portion provided between the upper end and the lower end to function as a spring.
摘要:
A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contactor carrier and a plurality of contactors. The contactor has an upper end oriented in a vertical direction, a straight beam portion oriented in a direction opposite to the upper end and having a lower end which functions as a contact point for electrical connection with a contact target, a return portion returned from the lower end and running in parallel with the straight beam portion to create a predetermined gap therebetween, a diagonal beam portion provided between the upper end and the straight beam portion to function as a spring.
摘要:
A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contact substrate and a plurality of contactors. The contactor has a tip portion at one end of the contactor to contact with the contact target, a base portion at another end of the contactor which is inserted in a through hole provided on the contact substrate in such a way that an end of the contactor functions as a contact pad for electrical connection at a surface of the contact substrate, and a spring portion provided between the tip portion and the base portion which produces a contact force when the contactor is pressed against the contact target.
摘要:
A probe contact system for establishing electrical connection with contact targets. The probe contact system is formed of a main frame, a flexible printed circuit board (PCB), a contactor carrier and a plurality of contactors. The flexible PCB has contact pads at a center area thereof and signal lines connected to the contact pads and extended to an end of the flexible PCB. The end of the flexible PCB with the signal lines is connected to a test head of a semiconductor test system. In one aspect, the contactor has a top spring to resiliently contact with the contact pads on the flexible PCB. In another aspect, the probe contact system includes a conductive elastomer sheet between the contactor and the flexible PCB thereby obviating the top spring of the contactor.
摘要:
A method of producing a contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contactor carrier and a plurality of contactors. The contactor has an upper end oriented in a vertical direction, a straight beam portion oriented in a direction opposite to the upper end and having a lower end which functions as a contact point for electrical connection with a contact target, a return portion returned from the lower end and running in parallel with the straight beam portion to create a predetermined gap therebetween, a diagonal beam portion provided between the upper end and the straight beam portion to function as a spring.
摘要:
A method of producing a contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contact substrate and a plurality of contactors. The contactor is uniformly formed of conductive material and has an intermediate portion which is inserted in the through hole provided on the contact substrate in a vertical direction, a contact portion which is connected to the intermediate portion and positioned at one end of the contactor to function as a contact point for electrical connection with a contact target, and a base portion which is provided at other end of the contactor, and a spring portion which is substantially straight and upwardly inclined relative to the surface of the contact substrate and provided between the base portion and the intermediate portion.