摘要:
A device, a system, and a method for displaying error information within an expandable Home Theater (XHT) network, and more particularly, to a device, a system, and a method for providing error information within the XHT network by displaying error information of slave devices in the XHT network to a user through a master device having a display function are provided. The system providing error information within an XHT network upon a user's request for device error information of a slave device connected to a master device through a communication control line within the XHT network, the system including a master device requesting error information from the slave device connected through the XHT network, and a slave device transmitting the error information to the master device.
摘要:
There is provided a method of fabricating a local SONOS type gate structure and a method of fabricating a nonvolatile memory cell having the same. The method includes forming a gate dielectric layer on a semiconductor substrate. A gate pattern, including a gate electrode and a hard mask layer pattern which are sequentially stacked, is formed on the gate dielectric layer. Then, a recess is formed on the boundary of the gate pattern and the gate dielectric layer. The recess is formed on one side wall of the gate pattern, and is prevented from forming on the other side wall of the gate pattern. A tunnel layer and a trapping dielectric layer are sequentially formed on substantially the entire surface of the semiconductor substrate having the recess formed thereon to fill the recess. At least a portion of the trapping dielectric layer is formed inside the recess.
摘要:
An electrolyte includes a lithium salt, a non-aqueous organic solvent, gamma-butyrolactone and halogenated toluene represented by the following formula 1: wherein X represents at least one element selected from the group consisting of F, Cl, Br and I, and n represents an integer of 1 to 5. The lithium ion secondary battery including the electrolyte provides improved safety under overcharge and high-temperature storage conditions.
摘要:
in methods of fabricating a non-volatile memory device having a local silicon-oxide-nitride-oxide-silicon (SONOS) gate structure, a semiconductor substrate having a cell transistor area, a high voltage transistor area, and a low voltage transistor area, is prepared. At least one memory storage pattern defining a cell gate insulating area on the semiconductor substrate within the cell transistor area is formed. An oxidation barrier layer is formed on the semiconductor substrate within the cell gate insulating area. A lower gate insulating layer is formed on the semiconductor substrate within the high voltage transistor area. A conformal upper insulating layer is formed on the memory storage pattern, the oxidation barrier layer, and the lower gate insulating layer. A low voltage gate insulating layer having a thickness which is less than a combined thickness of the upper insulating layer and the lower gate insulating layer is formed on the semiconductor substrate within the low voltage transistor area.
摘要:
A non-volatile memory device having improved electrical characteristics and a method of fabricating the non-volatile memory device are provided. The non-volatile memory device includes a gate electrode, which is formed on a semiconductor substrate on which source and drain regions are formed, a trapping structure, which is interposed between the semiconductor substrate and the gate electrode and comprises an electron tunneling layer and a charge trapping layer, and an electron back-tunneling prevention layer, which is interposed between the gate electrode and the charge trapping layer, prevents electrons in the gate electrode from back-tunneling through the charge trapping layer, and is formed of a metal having a higher work function than the gate electrode.
摘要:
A method of manufacturing a non-volatile semiconductor memory device begins by forming a dielectric layer pattern having an ONO composition on a substrate. A polysilicon layer is formed on the substrate including over the dielectric layer pattern. The polysilicon layer is patterned to form a split polysilicon layer pattern that exposes part of the dielectric layer pattern. The exposed dielectric layer is etched, and then impurities are implanted into portions of the substrate using the split polysilicon layer pattern as a mask to thereby form a source region having a vertical profile in the substrate.
摘要:
A nonvolatile memory cell array having common drain lines and method of operating the same are disclosed. A positive voltage is applied to a gate of a selected cell and gates of memory cells that share a word line with the selected cell. A first voltage is applied to a drain of the selected cell and drains of the memory cells that share at least a drain line with the selected cell. A second voltage is applied to a source of the selected cell and sources of memory cells that share a bit line with the selected cell, the second voltage being less than the first voltage, such that electrons are injected into the charge storage region of the selected cell to program. A third voltage, which is higher than the second voltage, is applied to bit lines that are not connected to the selected cell.
摘要:
A method of coding a compressed moving image including segmenting a local motion block from the compressed moving image, processing outer blocks of the local motion block, deciding a final contour of the local motion block from the processed outer blocks, and restoring colors inside the final contour.
摘要:
The present invention discloses a semiconductor device having a floating trap type nonvolatile memory cell and a method for manufacturing the same. The method includes providing a semiconductor substrate having a nonvolatile memory region, a first region, and a second region. A triple layer composed of a tunnel oxide layer, a charge storing layer and a first deposited oxide layer on the semiconductor substrate is formed sequentially. The triple layer on the semiconductor substrate except the nonvolatile memory region is then removed. A second deposited oxide layer is formed on an entire surface of the semiconductor substrate including the first and second regions from which the triple layer is removed. The second deposited oxide layer on the second region is removed, and a first thermal oxide layer is formed on the entire surface of the semiconductor substrate including the second region from which the second deposited oxide layer is removed. The semiconductor device can be manufactured according to the present invention to have a reduced processing time and a reduced change of impurity doping profile. The thickness of a blocking oxide layer and a high voltage gate oxide layer can be controlled.
摘要:
A multicast transmission method in GEM mode in Gigabit-capable passive optical network and a method of processing frames. The multicast transmission method includes the steps of: (a) setting a multicast connection; and (b) transmitting multicast messages in a GEM mode, wherein said step (a) includes a first sub step (i), in which predetermined ONTs are registered to a multicast group by means of IGMP frames in the first step, and a second sub step (11), in which an OLT assigns a multicast port ID to the multicast group and the ONTs registered to the multicast group. In addition, step (b) includes a first substep (i), in which the OLT assigns a multicast port ID to a message transmitted from a router to the multicast group, and transmits the message, and a second sub-step (ii), in which an ONT, which belongs to the OLT, filters the message, to which the multicast port ID is assigned, by means of a port ID assigned to the ONT.