Semiconductor device
    91.
    发明授权
    Semiconductor device 有权
    半导体器件

    公开(公告)号:US06740928B2

    公开(公告)日:2004-05-25

    申请号:US10350140

    申请日:2003-01-24

    IPC分类号: H01L29788

    摘要: The semiconductor device of the present invention includes: particles or interface states for passing charge formed on a p-type silicon substrate via a barrier layer; and particles for holding charge formed above the charge-passing particles via another barrier layer. The charge-holding particles are different from the charge-passing particles in parameters such as the particle diameter, the capacitance, the electron affinity, and the sum of electron affinity and forbidden bandwidth, to attain swift charge injection and release as well as stable charge holding in the charge-holding particles.

    摘要翻译: 本发明的半导体器件包括:通过阻挡层使用于在p型硅衬底上形成的电荷的粒子或界面状态; 以及通过另一个阻挡层形成在电荷通过颗粒上方形成的电荷的颗粒。 电荷保持粒子与粒径,电容,电子亲和力,电子亲和力和禁带宽度之和等参数不同于充电粒子,以获得快速的电荷注入和释放以及稳定的电荷 保持在电荷保持颗粒中。

    Silver halide photographic emulsion comprising methine compound and silver halide photographic material
    93.
    发明授权
    Silver halide photographic emulsion comprising methine compound and silver halide photographic material 失效
    包含次甲基化合物和卤化银照相材料的卤化银照相乳剂

    公开(公告)号:US06582895B2

    公开(公告)日:2003-06-24

    申请号:US09773689

    申请日:2001-02-02

    IPC分类号: G03C1005

    摘要: A silver halide photographic emulsion which comprises at least one methine compound represented by the following formula (I): wherein X1 and X2 each represents an oxygen atom, a sulfur atom, a selenium atom, or N—R3, wherein R3 represents a hydrogen atom, a substituted or unsubstituted alkyl group, a substituted or unsubstituted aryl group, or a heterocyclic group; V1 and V2 each represents a monovalent substituent; n1 and n2 each represents 0, 1, 2, 3 or 4; L1, L2 and L3 each represents a methine group; l represents an integer of 0 to 3; M represents a counter ion for balancing electric charge; m represents a necessary number for balancing electric charge; and R1 and R2 each represents a substituted or unsubstituted alkyl group, a substituted or unsubstituted aryl group or a substituted or unsubstituted heterocyclic group, but at least either R1 or R2 represents the alkyl group represented by any of the following formulae: Ra=(Qa)rCO{overscore (N)}SO2Raa Rb=(Qb)sSO2{overscore (N)}CORbb Rc=(Qc)tCO{overscore (N)}CORcc Rd=(Qd)uSO2{overscore (N)}SO2Rdd Re=(Qe)vX wherein Raa, Rbb, Rcc and Rdd each represents an alkyl group, an aryl group, a heterocyclic group, an alkoxyl group, an aryloxy group, a heterocyclyloxy group, or an amino group; Qa, Qb, Qc, Qd and Qe each represents a divalent linking group; X represents SO3−, CO2−, or PO32−; and r, s, t, u and v each represents an integer of 1 or more, but when X represents SO3−, v represents 1 or 2.

    摘要翻译: 一种卤化银照相乳剂,其包含由下式(I)表示的至少一种次甲基化合物:其中X 1和X 2各自表示氧原子,硫原子,硒原子或N-R 3,其中R 3表示氢原子 取代或未取代的烷基,取代或未取代的芳基或杂环基; V1和V2各自表示一价取代基; n1和n2各自表示0,1,2,3或4; L1,L2和L3各自表示次甲基; l表示0〜3的整数, M表示用于平衡电荷的抗衡离子; m表示用于平衡电荷的必要数量; 并且R 1和R 2各自表示取代或未取代的烷基,取代或未取代的芳基或取代或未取代的杂环基,但R 1或R 2中的至少一个表示由下式表示的烷基:其中Raa,Rbb Rcc和Rdd各自表示烷基,芳基,杂环基,烷氧基,芳氧基,杂环氧基或氨基; Qa,Qb,Qc,Qd和Qe各自表示二价连接基团; X代表SO3-,CO2-或PO32-; 并且r,s,t,u和v各自表示1以上的整数,但当X表示SO 3 - 时,v表示1或2。

    Semiconductor device including barrier layer having dispersed particles
    94.
    发明授权
    Semiconductor device including barrier layer having dispersed particles 有权
    包括具有分散粒子的阻挡层的半导体装置

    公开(公告)号:US06548825B1

    公开(公告)日:2003-04-15

    申请号:US09587268

    申请日:2000-06-05

    IPC分类号: H01L310328

    摘要: The semiconductor device of the present invention includes: particles or interface states for passing charge formed on a p-type silicon substrate via a barrier layer; and particles for holding charge formed above the charge-passing particles via another barrier layer. The charge-holding particles are different from the charge-passing particles in parameters such as the particle diameter, the capacitance, the electron affinity, and the sum of electron affinity and forbidden bandwidth, to attain swift charge injection and release as well as stable charge holding in the charge-holding particles.

    摘要翻译: 本发明的半导体器件包括:通过阻挡层使用于在p型硅衬底上形成的电荷的粒子或界面状态; 以及通过另一个阻挡层形成在电荷通过颗粒上方形成的电荷的颗粒。 电荷保持粒子与粒径,电容,电子亲和力,电子亲和力和禁带宽度之和等参数不同于充电粒子,以获得快速的电荷注入和释放以及稳定的电荷 保持在电荷保持颗粒中。

    MIS SOI semiconductor device with RTD and/or HET
    95.
    发明授权
    MIS SOI semiconductor device with RTD and/or HET 失效
    具有RTD和/或HET的MIS SOI半导体器件

    公开(公告)号:US6091077A

    公开(公告)日:2000-07-18

    申请号:US955267

    申请日:1997-10-21

    摘要: The invention provides a semiconductor device, having a variety of functions such as a bistable memory and a logic circuit, in which a MOS semiconductor element, a resonance tunnel diode, a hot electron transistor and the like are formed on a common substrate. An n-type Si layer and a p-type Si layer surrounded with an isolation oxide film are formed on an SOI substrate. A mask oxide film and a gate oxide film are formed, and the n-type Si layer is subjected to crystal anisotropic etching by using the mask oxide film as a mask, so as to change the n-type Si layer into the shape of a thin Si plate. After first and second tunnel oxide films are formed on side faces of this n-type Si layer, first and second polysilicon electrodes of a resonance tunnel diode and a polysilicon electrode working as a gate electrode of a MOS semiconductor element are formed out of a common polysilicon film. Thus, a Si/SiO.sub.2 type quantum device can be manufactured with ease at a low cost.

    摘要翻译: 本发明提供一种半导体器件,其具有各种功能,例如双稳态存储器和逻辑电路,其中在公共衬底上形成有MOS半导体元件,谐振隧道二极管,热电子晶体管等。 在SOI衬底上形成由隔离氧化膜包围的n型Si层和p型Si层。 形成掩模氧化膜和栅极氧化膜,并且通过使用掩模氧化膜作为掩模对n型Si层进行结晶各向异性蚀刻,以将n型Si层改变为 薄Si板。 在该n型Si层的侧面上形成第一和第二隧道氧化物膜之后,共用隧道二极管的第一和第二多晶硅电极和用作MOS半导体元件的栅电极的多晶硅电极由共同的 多晶硅膜。 因此,可以容易地以低成本制造Si / SiO 2型量子器件。

    Pulsating vibration air generation means
    96.
    发明授权
    Pulsating vibration air generation means 失效
    脉动振动空气产生装置

    公开(公告)号:US06062826A

    公开(公告)日:2000-05-16

    申请号:US713128

    申请日:1996-09-16

    CPC分类号: F16K31/52408 Y10T74/18296

    摘要: A pulsating vibration air generator in which wave height, frequency and wave shape of the pulsating vibration air can be optionally modified and such pulsating vibration air can be periodically and continuously emitted. The pulsating vibration air generator has a valve chamber with an inlet port and an outlet port where a valve plug and a valve seat with a control opening are provided and a cam mechanism which moves the valve plug to open or close the opening of the valve seat, whereby positive or negative pulsating vibration air is emitted from the outlet port while pressurized air is supplied into the inlet port or air is sucked from the inlet port.

    摘要翻译: 脉动振动空气发生器可以可选地改变脉动振动空气的波浪高度,频率和波形,并且可以周期性地连续地发射这种脉动的振动空气。 脉动振动空气发生器具有带有入口和出口的阀室,其中设置有阀塞和具有控制开口的阀座,以及凸轮机构,其使阀塞移动以打开或关闭阀座的开口 从而当加压空气被供给到入口或从入口吸入空气时,从出口端口发出正或负脉动的振动空气。

    Method for forming semiconductor microstructure, semiconductor device
fabricated using this method, method for fabricating resonance
tunneling device, and resonance tunnel device fabricated by this method
    99.
    发明授权
    Method for forming semiconductor microstructure, semiconductor device fabricated using this method, method for fabricating resonance tunneling device, and resonance tunnel device fabricated by this method 失效
    用于形成半导体微结构的方法,使用该方法制造的半导体器件,用于制造谐振隧穿器件的方法,以及通过该方法制造的谐振隧道器件

    公开(公告)号:US5888852A

    公开(公告)日:1999-03-30

    申请号:US808580

    申请日:1997-02-28

    摘要: The method for forming a semiconductor microstructure of this invention includes the steps of: forming a mask pattern having a first opening and a second opening on a substrate having a semiconductor layer as an upper portion thereof; and selectively etching the semiconductor layer using the mask pattern to form a semiconductor microstructure extending in a first direction parallel to a surface of the substrate, wherein, in the step of selectively etching the semiconductor layer, an etching rate in a second direction vertical to the first direction and parallel to the surface of the substrate is substantially zero with respect to an etching rate in the first direction, and a width of the semiconductor microstructure is substantially equal to a shortest distance between the first opening and the second opening in the second direction.

    摘要翻译: 形成本发明的半导体微结构的方法包括以下步骤:在具有半导体层作为其上部的衬底上形成具有第一开口和第二开口的掩模图案; 以及使用所述掩模图案选择性地蚀刻所述半导体层,以形成在平行于所述基板的表面的第一方向上延伸的半导体微结构,其中,在选择性地蚀刻所述半导体层的步骤中,沿垂直于所述基板的第二方向的蚀刻速率 第一方向并平行于衬底的表面相对于第一方向上的蚀刻速率基本上为零,并且半导体微结构的宽度基本上等于第一开口和第二开口在第二方向上的最短距离 。